Mattes; Heinz

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mattes; Heinz.The latest application filed is for "apparatus and method for the characterization of analog-to-digital converters".

Company Profile

0.18.17

Mattes; Heinz - Munich DE
MATTES; Heinz - Muenchen DE
Mattes; Heinz - Munchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus and method for the characterization of analog-to-digital converters Grant RE47,805 - Mattes J	2020-01-07
Apparatus and method for the characterization of analog-to-digital converters Grant 9,088,294 - Mattes July 21, 2	2015-07-21
Apparatus And Method For The Characterization Of Analog-to-digital Converters App 20140333464 - MATTES; Heinz	2014-11-13
Signal generating circuit Grant 8,860,592 - Mattes , et al. October 14, 2	2014-10-14
Signal Generating Circuit App 20140097976 - MATTES; Heinz ; et al.	2014-04-10
Test Circuit App 20140098847 - MATTES; Heinz ; et al.	2014-04-10
Evaluation circuit and method for detecting and/or locating faulty data words in a data stream T.sub.n Grant 8,060,800 - Goessel , et al. November 15, 2	2011-11-15
Measuring device and method for measuring relative phase shifts of digital signals Grant 7,945,406 - Kirmser , et al. May 17, 2	2011-05-17
Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device Grant 7,720,645 - Kirmser , et al. May 18, 2	2010-05-18
Apparatus And Method For The Analysis Of A Periodic Signal App 20100079170 - Mattes; Heinz ; et al.	2010-04-01
Electrical circuit for measuring times and method for measuring times Grant 7,653,170 - Mattes , et al. January 26, 2	2010-01-26
Method and device for estimating channel properties of a transmission channel Grant 7,561,639 - Gregorius , et al. July 14, 2	2009-07-14
Device and method for measuring jitter Grant 7,558,991 - Mattes , et al. July 7, 2	2009-07-07
Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit Grant 7,471,220 - Mattes , et al. December 30, 2	2008-12-30
Device and method for testing integrated circuits Grant 7,400,995 - Mattes , et al. July 15, 2	2008-07-15
Test apparatus and method for testing analog/digital converters Grant 7,391,349 - Dworski , et al. June 24, 2	2008-06-24
Test apparatus with low-reflection signal distribution Grant 7,355,414 - Arnold , et al. April 8, 2	2008-04-08
Evaluation Circuit and Method for Detecting and/or Locating Faulty Data Words in a Data Stream Tn App 20080040638 - Goessel; Michael ; et al.	2008-02-14
Method and filter arrangement for digital recursive filtering in the time domain Grant 7,290,022 - Mattes , et al. October 30, 2	2007-10-30
Measuring device and method for measuring relative phase shifts of digital signals App 20070226602 - Kirmser; Stephane ; et al.	2007-09-27
Test Apparatus And Method For Testing Analog/Digital Converters App 20070216555 - Dworski; Claus ; et al.	2007-09-20
Electrical circuit and method for testing integrated circuits Grant 7,256,602 - Mattes , et al. August 14, 2	2007-08-14
Electronic Test Circuit For An Integrated Circuit And Methods For Testing The Driver Strength And For Testing The Input Sensitivity Of A Receiver Of The Integrated Circuit App 20070176807 - Mattes; Heinz ; et al.	2007-08-02
Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device App 20070089010 - Kirmser; Stephane ; et al.	2007-04-19
Test apparatus and test method for mixed-signal semiconductor components Grant 7,206,712 - Sattler , et al. April 17, 2	2007-04-17
Device and method for testing integrated circuits App 20070067129 - Mattes; Heinz ; et al.	2007-03-22
Device and method for measuring jitter App 20060291548 - Mattes; Heinz ; et al.	2006-12-28
Electrical circuit for measuring times and method for measuring times App 20060274607 - Mattes; Heinz ; et al.	2006-12-07
Test apparatus and test method for mixed-signal semiconductor components App 20060238392 - Sattler; Sebastian ; et al.	2006-10-26
Test apparatus with low-reflection signal distribution App 20060186896 - Arnold; Ralf ; et al.	2006-08-24
Electrical circuit and method for testing integrated circuits App 20050231228 - Mattes, Heinz ; et al.	2005-10-20
Method and device for estimating channel properties of a transmission channel App 20050111591 - Gregorius, Peter ; et al.	2005-05-26
Method and filter arrangement for digital recursive filtering in the time domain App 20050108311 - Mattes, Heinz ; et al.	2005-05-19
Apparatus and method for recording, communicating and administering digital images Grant 6,038,295 - Mattes March 14, 2	2000-03-14
Method in a parallel test apparatus for semiconductor memories Grant 5,224,107 - Mattes June 29, 1	1993-06-29

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