Matsuyama; Yukio

Patent Applications and Registrations

Patent applications and USPTO patent grants for Matsuyama; Yukio.The latest application filed is for "electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same".

Company Profile

0.13.4

Matsuyama; Yukio - Yokohama JP
Matsuyama, Yukio - Yokohama-shi JP
Matsuyama; Yukio - Nasu-machi JP
Matsuyama; Yukio - Tochigi-ken JP
Matsuyama; Yukio - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Grant 7,122,796 - Hiroi , et al. October 17, 2	2006-10-17
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same App 20050082476 - Hiroi, Takashi ; et al.	2005-04-21
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Grant 6,828,554 - Hiroi , et al. December 7, 2	2004-12-07
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same App 20040164244 - Hiroi, Takashi ; et al.	2004-08-26
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Grant 6,717,142 - Hiroi , et al. April 6, 2	2004-04-06
Visual inspection method and apparatus therefor Grant 6,587,581 - Matsuyama , et al. July 1, 2	2003-07-01
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same App 20020100872 - Hiroi, Takashi ; et al.	2002-08-01
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Grant 6,373,054 - Hiroi , et al. April 16, 2	2002-04-16
Defect judgement processing method and apparatus Grant 6,333,992 - Yamamura , et al. December 25, 2	2001-12-25
Solder testing apparatus Grant 6,249,598 - Honda , et al. June 19, 2	2001-06-19
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same App 20010002697 - Hiroi, Takashi ; et al.	2001-06-07
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Grant 6,172,365 - Hiroi , et al. January 9, 2	2001-01-09
Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Grant 5,986,263 - Hiroi , et al. November 16, 1	1999-11-16
Method and apparatus for the inspection of defects Grant 5,293,538 - Iwata , et al. March 8, 1	1994-03-08
Serial printer having a carrier cable connected to a movable print head Grant 5,054,944 - Matsuyama October 8, 1	1991-10-08
Method and apparatus for detecting pattern defects Grant 4,860,371 - Matsuyama , et al. August 22, 1	1989-08-22
Pattern checking apparatus Grant 4,628,531 - Okamoto , et al. December 9, 1	1986-12-09

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