| Patent | Date |
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Wearable device and time correction method
Grant 11,150,611 - Aoki , et al. October 19, 2 | 2021-10-19 |
Ion implanter
Grant 11,062,880 - Matsushita , et al. July 13, 2 | 2021-07-13 |
Ion Implanter
App 20200303163 - Matsushita; Hiroshi ; et al. | 2020-09-24 |
Ion Implanter And Ion Implantation Method
App 20200303161 - Matsushita; Hiroshi | 2020-09-24 |
Ion Implanter And Measuring Device
App 20200211816 - Matsushita; Hiroshi | 2020-07-02 |
Information processing device, information processing system, control method of an information processing device, and parameter setting method
Grant 10,701,344 - Nakajima , et al. | 2020-06-30 |
Wearable Device And Time Correction Method
App 20190377303 - AOKI; Mikio ; et al. | 2019-12-12 |
Ion implanter and ion implantation method
Grant 10,490,389 - Matsushita , et al. Nov | 2019-11-26 |
Ion implanter, ion beam irradiated target, and ion implantation method
Grant 10,354,835 - Matsushita July 16, 2 | 2019-07-16 |
Information Processing Device, Information Processing System, Control Method Of An Information Processing Device, And Parameter Setting Method
App 20180367787 - NAKAJIMA; Yasumasa ; et al. | 2018-12-20 |
Ion Implanter And Ion Implantation Method
App 20180350559 - Matsushita; Hiroshi ; et al. | 2018-12-06 |
Ion Implanter, Ion Beam Irradiated Target, And Ion Implantation Method
App 20180350557 - Matsushita; Hiroshi | 2018-12-06 |
Three-dimensional image processing system, three-dimensional image processing apparatus, and three-dimensional image processing method
Grant 9,967,550 - Matsushita May 8, 2 | 2018-05-08 |
Abnormality portent detection system and method of manufacturing semiconductor device
Grant 9,929,062 - Matsushita March 27, 2 | 2018-03-27 |
Casting mold
Grant 9,533,349 - Yokoyama , et al. January 3, 2 | 2017-01-03 |
Abnormality Portent Detection System And Method Of Manufacturing Semiconductor Device
App 20160293462 - MATSUSHITA; Hiroshi | 2016-10-06 |
Three-dimensional Image Processing System, Three-dimensional Image Processing Apparatus, And Three-dimensional Image Processing Method
App 20160254027 - MATSUSHITA; Hiroshi | 2016-09-01 |
Ion implantation apparatus
Grant 9,431,214 - Matsushita , et al. August 30, 2 | 2016-08-30 |
Video camera case
Grant D753,391 - Yasuda , et al. April 12, 2 | 2016-04-12 |
Casting Mold
App 20160067772 - Yokoyama; Kunihiro ; et al. | 2016-03-10 |
Ion implantation apparatus
Grant 9,208,991 - Matsushita , et al. December 8, 2 | 2015-12-08 |
Ion Implantation Apparatus
App 20150340202 - Matsushita; Hiroshi ; et al. | 2015-11-26 |
Ion Implantation Apparatus
App 20150340197 - Matsushita; Hiroshi ; et al. | 2015-11-26 |
Insulation structure of high voltage electrodes for ion implantation apparatus
Grant 9,117,630 - Sato , et al. August 25, 2 | 2015-08-25 |
Luminaire and lamp apparatus housing
Grant 8,894,254 - Matsuda , et al. November 25, 2 | 2014-11-25 |
Insulation Structure Of High Voltage Electrodes For Ion Implantation Apparatus
App 20140291543 - Sato; Masateru ; et al. | 2014-10-02 |
Management method and system for exposure apparatus having alarm based on inclination amount and deviation from aligned position
Grant 8,836,919 - Tsujisawa , et al. September 16, 2 | 2014-09-16 |
Lamp device and luminaire
Grant 8,764,249 - Toda , et al. July 1, 2 | 2014-07-01 |
Lamp Device and Luminaire
App 20140169004 - Nakajima; Hiromichi ; et al. | 2014-06-19 |
Lamp and Luminaire
App 20140153250 - Matsushita; Hiroshi ; et al. | 2014-06-05 |
Luminaire
App 20130308294 - Nezu; Kenji ; et al. | 2013-11-21 |
Bulb-shaped Lamp And Lighting Device
App 20130201696 - Hisayasu; Takeshi ; et al. | 2013-08-08 |
Led Lighting Device And Led Luminaire
App 20130083549 - Takahara; Yuichiro ; et al. | 2013-04-04 |
Lamp Device
App 20120313551 - NAKAJIMA; Hiromichi ; et al. | 2012-12-13 |
Lamp Apparatus And Luminaire
App 20120262928 - Matsuda; Ryotaro ; et al. | 2012-10-18 |
Lamp Device And Luminaire
App 20120243237 - TODA; Masahiro ; et al. | 2012-09-27 |
Failure detecting method, failure detecting apparatus, and semiconductor device manufacturing method
Grant 8,170,707 - Matsushita , et al. May 1, 2 | 2012-05-01 |
Defect Analysis Method Of Semiconductor Device
App 20120029679 - Matsushita; Hiroshi | 2012-02-02 |
Control Method And Control System For Exposure Apparatus
App 20120028192 - TSUJISAWA; Kenichi ; et al. | 2012-02-02 |
Linear pattern detection method and apparatus
Grant 8,081,814 - Matsushita , et al. December 20, 2 | 2011-12-20 |
Method and system for managing semiconductor manufacturing device
App 20110245956 - Matsushita; Hiroshi ; et al. | 2011-10-06 |
Beam processing apparatus
Grant 7,982,192 - Tsukihara , et al. July 19, 2 | 2011-07-19 |
Method and system for managing semiconductor manufacturing device
Grant 7,979,154 - Matsushita , et al. July 12, 2 | 2011-07-12 |
Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatus
Grant 7,970,486 - Matsushita , et al. June 28, 2 | 2011-06-28 |
Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same
Grant 7,742,834 - Matsushita , et al. June 22, 2 | 2010-06-22 |
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
Grant 7,700,381 - Arikado , et al. April 20, 2 | 2010-04-20 |
Electrostatic beam deflection scanner and beam deflection scanning method
Grant 7,687,782 - Tsukihara , et al. March 30, 2 | 2010-03-30 |
Failure Cause Identifying Device And Method For Identifying Failure Cause
App 20100060470 - MATSUSHITA; Hiroshi | 2010-03-11 |
Abnormality cause specifying method, abnormality cause specifying system, and semiconductor device fabrication method
Grant 7,599,817 - Matsushita October 6, 2 | 2009-10-06 |
Linear Pattern Detection Method And Apparatus
App 20090220142 - MATSUSHITA; Hiroshi ; et al. | 2009-09-03 |
Failure Detecting Method, Failure Detecting Apparatus, And Semiconductor Device Manufacturing Method
App 20090117673 - MATSUSHITA; Hiroshi ; et al. | 2009-05-07 |
Defect detection system, defect detection method, and defect detection program
Grant 7,529,631 - Matsushita , et al. May 5, 2 | 2009-05-05 |
Beam Processing Apparatus
App 20080258074 - TSUKIHARA; Mitsukuni ; et al. | 2008-10-23 |
Method for analyzing fail bit maps of waters and apparatus therefor
Grant 7,405,088 - Matsushita , et al. July 29, 2 | 2008-07-29 |
Method And System For Managing Semiconductor Manufacturing Device
App 20080147226 - MATSUSHITA; Hiroshi ; et al. | 2008-06-19 |
Electrostatic beam deflection scanner and beam deflection scanning method
App 20080067404 - Tsukihara; Mitsukuni ; et al. | 2008-03-20 |
Defect detection system, defect detection method, and defect detection program
App 20080004823 - Matsushita; Hiroshi ; et al. | 2008-01-03 |
Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same
App 20070276528 - Matsushita; Hiroshi ; et al. | 2007-11-29 |
Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatus
App 20070225853 - Matsushita; Hiroshi ; et al. | 2007-09-27 |
Equipment for and method of detecting faults in semiconductor integrated circuits
Grant 7,222,026 - Matsushita , et al. May 22, 2 | 2007-05-22 |
System and method for monitoring manufacturing apparatuses
Grant 7,221,991 - Matsushita , et al. May 22, 2 | 2007-05-22 |
System and method for identifying a manufacturing tool causing a fault
Grant 7,197,414 - Matsushita , et al. March 27, 2 | 2007-03-27 |
Semiconductor processing device, semiconductor processing system and semiconductor processing management method
Grant 7,162,072 - Matsushita January 9, 2 | 2007-01-09 |
Abnormality cause specifying method, abnormality cause specifying system, and semiconductor device fabrication method
App 20060281199 - Matsushita; Hiroshi | 2006-12-14 |
Method for analyzing fail bit maps of wafers
Grant 7,138,283 - Matsushita , et al. November 21, 2 | 2006-11-21 |
Beam deflecting method, beam deflector for scanning, ion implantation method, and ion implantation system
Grant 7,138,641 - Matsushita , et al. November 21, 2 | 2006-11-21 |
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
App 20060131696 - Arikado; Tsunetoshi ; et al. | 2006-06-22 |
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
Grant 7,057,259 - Arikado , et al. June 6, 2 | 2006-06-06 |
Beam deflecting method, beam deflector for scanning, ion implantation method, and ion implantation system
App 20060113490 - Matsushita; Hiroshi ; et al. | 2006-06-01 |
Failure detection system, failure detection method, and computer program product
Grant 7,043,384 - Matsushita , et al. May 9, 2 | 2006-05-09 |
System and method for identifying a manufacturing tool causing a fault
App 20050251365 - Matsushita, Hiroshi ; et al. | 2005-11-10 |
Packet transmitting/receiving method and apparatus for computer system
Grant 6,957,273 - Haneda , et al. October 18, 2 | 2005-10-18 |
System and method for controlling manufacturing apparatuses
App 20050194590 - Matsushita, Hiroshi ; et al. | 2005-09-08 |
Computing network path delays so accurate absolute time can be forwarded from a server to a client
Grant 6,941,109 - Matsushita , et al. September 6, 2 | 2005-09-06 |
Failure detection system, failure detection method, and computer program product
App 20050102591 - Matsushita, Hiroshi ; et al. | 2005-05-12 |
Printer with auxiliary member for forming print gap, ribbon guide, ribbon cartridge, ribbon cassette, and printing method
App 20050100377 - Honda, Yoshito ; et al. | 2005-05-12 |
Method for analyzing fail bit maps of wafers
App 20050021303 - Matsushita, Hiroshi ; et al. | 2005-01-27 |
Method for analyzing fail bit maps of wafers and apparatus therefor
App 20040255198 - Matsushita, Hiroshi ; et al. | 2004-12-16 |
Ion beam processing method and apparatus therefor
Grant 6,797,968 - Tsukihara , et al. September 28, 2 | 2004-09-28 |
Ion implantation apparatus capable of increasing beam current
Grant 6,794,661 - Tsukihara , et al. September 21, 2 | 2004-09-21 |
Failure analysis system, failure analysis method, a computer program product and a manufacturing method for a semiconductor device
App 20040049722 - Matsushita, Hiroshi | 2004-03-11 |
Semiconductor processing device, semiconductor processing system and semiconductor processing management method
App 20030157736 - Matsushita, Hiroshi | 2003-08-21 |
Computing network path delays so accurate absolute time can be forwarded from a server to a client
App 20030157886 - Matsushita, Hiroshi ; et al. | 2003-08-21 |
Ion beam processing method and apparatus therefor
App 20030122090 - Tsukihara, Mitsukuni ; et al. | 2003-07-03 |
Software-compensated crystal oscillator
Grant 6,509,870 - Matsushita , et al. January 21, 2 | 2003-01-21 |
Equipment for and method of detecting faults in semiconductor integrated circuits
App 20030011376 - Matsushita, Hiroshi ; et al. | 2003-01-16 |
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
App 20030003608 - Arikado, Tsunetoshi ; et al. | 2003-01-02 |
Ion implantation apparatus capable of increasing beam current
App 20020179854 - Tsukihara, Mitsukuni ; et al. | 2002-12-05 |
Circuit using internal pull-up/pull-down resistor during reset
Grant 6,335,648 - Matsushita January 1, 2 | 2002-01-01 |
Defect-position identifying method for semiconductor substrate
Grant 6,320,655 - Matsushita , et al. November 20, 2 | 2001-11-20 |
Packet transmitting/ receiving method and apparatus for computer system
App 20010023465 - Haneda, Terumasa ; et al. | 2001-09-20 |
Semiconductor wafer and method of manufacturing the same
Grant 6,146,911 - Tsuchiya , et al. November 14, 2 | 2000-11-14 |
Microemulsion preparation containing a slightly absorbable substance
Grant 5,948,825 - Takahashi , et al. September 7, 1 | 1999-09-07 |
Adhesive tapes for die bonding
Grant 4,933,219 - Sakumoto , et al. June 12, 1 | 1990-06-12 |
Dibenzoxazepine derivative, and pharmaceutical composition comprising the same
Grant 4,435,391 - Sasahara , et al. March 6, 1 | 1984-03-06 |
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