loadpatents
Patent applications and USPTO patent grants for Matsushima; Jun.The latest application filed is for "coating device, liquid discharge apparatus, and printer".
Patent | Date |
---|---|
Coating Device, Liquid Discharge Apparatus, And Printer App 20220274434 - Matsushima; Jun ;   et al. | 2022-09-01 |
Semiconductor device and method of controlling self-diagnosis Grant 11,255,907 - Nishida , et al. February 22, 2 | 2022-02-22 |
Reservoir tank Grant 10,744,988 - Sekine , et al. A | 2020-08-18 |
Semiconductor Device And Method Of Controlling Self-diagnosis App 20200072903 - NISHIDA; Yoshinori ;   et al. | 2020-03-05 |
Semiconductor device and diagnostic method therefor Grant 10,580,513 - Maeda , et al. | 2020-03-03 |
Semiconductor device and diagnosis method thereof Grant 10,504,609 - Maeda , et al. Dec | 2019-12-10 |
Semiconductor device and scan test method including writing and reading test data Grant 10,295,597 - Maeda , et al. | 2019-05-21 |
Semiconductor device, electronic control system and method for evaluating electronic control system Grant 10,288,683 - Maeda , et al. | 2019-05-14 |
Semiconductor device and diagnostic test method for both single-point and latent faults using first and second scan tests Grant 10,281,525 - Maeda , et al. | 2019-05-07 |
Reservoir Tank App 20190084541 - Sekine; Yusuke ;   et al. | 2019-03-21 |
Semiconductor Device And Diagnostic Method Therefor App 20180277237 - MAEDA; Yoichi ;   et al. | 2018-09-27 |
Test point circuit, scan flip-flop for sequential test, semiconductor device and design device Grant 10,078,114 - Iwata , et al. September 18, 2 | 2018-09-18 |
Semiconductor Device And Diagnostic Test Method App 20180180672 - MAEDA; Yoichi ;   et al. | 2018-06-28 |
Semiconductor Device And Diagnosis Method Thereof App 20180090225 - MAEDA; Yoichi ;   et al. | 2018-03-29 |
Semiconductor Device And Scan Test Method App 20180059183 - MAEDA; Yoichi ;   et al. | 2018-03-01 |
Semiconductor Device, Electronic Control System And Method For Evaluating Electronic Control System App 20170343607 - MAEDA; Yoichi ;   et al. | 2017-11-30 |
Test Point Circuit, Scan Flip-flop For Sequential Test, Semiconductor Device And Design Device App 20170089979 - IWATA; Hiroyuki ;   et al. | 2017-03-30 |
Apparatus and method for designing semiconductor device, and semiconductor device Grant 8,887,015 - Iwata , et al. November 11, 2 | 2014-11-11 |
Laser-marking film Grant 8,597,774 - Fukue , et al. December 3, 2 | 2013-12-03 |
Laser-marking Film App 20130095259 - Fukue; Keiji ;   et al. | 2013-04-18 |
Apparatus And Method For Designing Semiconductor Device, And Semiconductor Device App 20130019134 - IWATA; Hiroyuki ;   et al. | 2013-01-17 |
Semiconductor device Grant 8,037,384 - Hasegawa , et al. October 11, 2 | 2011-10-11 |
Test access control for plural processors of an integrated circuit Grant 7,743,278 - Ikeda , et al. June 22, 2 | 2010-06-22 |
Semiconductor Device App 20090172488 - Hasegawa; Takumi ;   et al. | 2009-07-02 |
Semiconductor integrated circuit device App 20070226558 - Ikeda; Yuri ;   et al. | 2007-09-27 |
Image Blur Compensation Device With Reduced Noise Effect Mechanism App 20030012565 - OTANI, TADASHI ;   et al. | 2003-01-16 |
Converting unit and USB-adapted peripheral apparatus App 20010003197 - Matsushima, Jun ;   et al. | 2001-06-07 |
Rotating indicator pointer type display apparatus Grant 5,794,086 - Wakabayashi , et al. August 11, 1 | 1998-08-11 |
Image vibration reduction device Grant 5,696,999 - Matsushima , et al. December 9, 1 | 1997-12-09 |
Vertical vibration control device Grant 5,433,045 - Yano , et al. July 18, 1 | 1995-07-18 |
Torque sensor Grant 4,984,474 - Matsushima , et al. January 15, 1 | 1991-01-15 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.