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name:-0.017277002334595
name:-0.032074928283691
name:-0.0035369396209717
MATSUOKA; Kazuhiko Patent Filings

MATSUOKA; Kazuhiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for MATSUOKA; Kazuhiko.The latest application filed is for "quality control method, quality control system, management apparatus, analyzer, and quality control abnormality determination method".

Company Profile
1.26.10
  • MATSUOKA; Kazuhiko - Kobe-shi JP
  • Matsuoka; Kazuhiko - Kobe JP
  • Matsuoka; Kazuhiko - Hamamatsu JP
  • Matsuoka; Kazuhiko - Hamamatsu-City JP
  • Matsuoka; Kazuhiko - Gunma-ken JP
  • Matsuoka; Kazuhiko - Tano-gun JP
  • Matsuoka; Kazuhiko - Takasaki JP
  • Matsuoka; Kazuhiko - Yokohama JP
  • Matsuoka; Kazuhiko - Osaka JP
  • Matsuoka, Kazuhiko - Takasaki-shi JP
  • Matsuoka; Kazuhiko - Shizuoka JP
  • MATSUOKA, KAZUHIKO - YOKOHAMA-SHI JP
  • Matsuoka; Kazuhiko - Gunma JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Quality Control Method, Quality Control System, Management Apparatus, Analyzer, And Quality Control Abnormality Determination Method
App 20220276273 - FUJIMOTO; Keiji ;   et al.
2022-09-01
Quality control method, quality control system, management apparatus, analyzer, and quality control abnormality determination method
Grant 11,340,242 - Fujimoto , et al. May 24, 2
2022-05-24
Quality Control Method, Quality Control System, Management Apparatus, Analyzer, And Quality Control Abnormality Determination Me
App 20190346466 - FUJIMOTO; Keiji ;   et al.
2019-11-14
Plug detachment prevention structure
Grant 7,963,792 - Sawada , et al. June 21, 2
2011-06-21
Plug Detachment Prevention Structure
App 20110053402 - Sawada; Shigeru ;   et al.
2011-03-03
Electronic instrument and reproduction system
Grant 7,375,275 - Matsuoka , et al. May 20, 2
2008-05-20
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
Grant 7,177,020 - Morioka , et al. February 13, 2
2007-02-13
Electronic instrument and reproduction system
App 20060273936 - Matsuoka; Kazuhiko ;   et al.
2006-12-07
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
App 20050206887 - Morioka, Hiroshi ;   et al.
2005-09-22
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
Grant 6,894,773 - Morioka , et al. May 17, 2
2005-05-17
Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system
Grant 6,650,409 - Noguchi , et al. November 18, 2
2003-11-18
Inspection data analyzing system
Grant 6,628,817 - Ishikawa , et al. September 30, 2
2003-09-30
Image read method for performing image signal processes complying with the color of a reference portion of a recording medium, and image read apparatus adopting the method
Grant 6,525,764 - Kondo , et al. February 25, 2
2003-02-25
Imaging optical system and original reading apparatus
Grant 6,462,866 - Sugiyama , et al. October 8, 2
2002-10-08
Electronic score tracking musical instrument
Grant 6,376,758 - Yamada , et al. April 23, 2
2002-04-23
Inspection data analyzing system
App 20020034326 - Ishikawa, Seiji ;   et al.
2002-03-21
Electronic score tracking musical instrument
Grant 6,333,455 - Yanase , et al. December 25, 2
2001-12-25
Inspection data analyzing system
App 20010038708 - Ishikawa, Seiji ;   et al.
2001-11-08
Image Read Method For Performing Image Signal Processes Complying With The Color Of A Reference Portion Of A Recording Medium, And Image Read Apparatus Adopting The Method
App 20010030687 - KONDO, KAZUYUKI ;   et al.
2001-10-18
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
App 20010021015 - Morioka, Hiroshi ;   et al.
2001-09-13
Inspection data analyzing system
App 20010001015 - Ishikawa, Seiji ;   et al.
2001-05-10
Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device
Grant 6,185,322 - Ishikawa , et al. February 6, 2
2001-02-06
Magneto-optical information reproducing apparatus that splits a light beam into at least three light beams advancing in the same direction
Grant 5,517,480 - Matsuoka , et al. May 14, 1
1996-05-14
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
Grant 5,463,459 - Morioka , et al. October 31, 1
1995-10-31
Optical system for optical information recording/reproducing apparatus having a galvano mirror
Grant 5,420,848 - Date , et al. May 30, 1
1995-05-30
Optical information recording-reproducing apparatus
Grant 5,010,534 - Enari , et al. April 23, 1
1991-04-23
Biaspherical single lens for an optical information recording-reproducing apparatus
Grant 4,979,807 - Matsuoka December 25, 1
1990-12-25
Optical pickup device including a beam splitter having an inclined plane
Grant 4,973,836 - Matsuoka November 27, 1
1990-11-27
Apparatus and method for preventing recording errors due to a reduction in the relative speed between an information carrying light beam and a recording medium
Grant 4,912,697 - Enari , et al. March 27, 1
1990-03-27
Varifocal optical element
Grant 4,872,743 - Baba , et al. October 10, 1
1989-10-10
Light modulation element and light modulation apparatus
Grant 4,842,396 - Minoura , et al. June 27, 1
1989-06-27
Optical information recording medium and apparatus for recording/reproducing information using the same
Grant 4,787,075 - Matsuoka , et al. November 22, 1
1988-11-22
Scanning optical system subjected to a moisture proof treatment
Grant 4,523,801 - Baba , et al. June 18, 1
1985-06-18
Colored image reading apparatus
Grant 4,517,589 - Baba , et al. May 14, 1
1985-05-14
Scanning optical system having a tilting correcting function
Grant 4,447,112 - Matsuoka , et al. May 8, 1
1984-05-08
Scanning optical system having a fall-down correcting function
Grant 4,379,612 - Matsuoka , et al. April 12, 1
1983-04-12

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