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Patent applications and USPTO patent grants for MATSUO; Yukikazu.The latest application filed is for "semiconductor test apparatus for controlling tester".
Patent | Date |
---|---|
Semiconductor Test Apparatus For Controlling Tester App 20180039571 - MATSUO; Yukikazu ;   et al. | 2018-02-08 |
Semiconductor test apparatus for controlling tester Grant 9,811,450 - Matsuo , et al. November 7, 2 | 2017-11-07 |
Testing device Grant 9,557,384 - Matsuo , et al. January 31, 2 | 2017-01-31 |
Semiconductor Test Apparatus For Controlling Tester App 20140325191 - MATSUO; Yukikazu ;   et al. | 2014-10-30 |
Testing Device App 20140145746 - MATSUO; Yukikazu ;   et al. | 2014-05-29 |
Program counter circuit Grant 6,930,931 - Matsuo August 16, 2 | 2005-08-16 |
Test pattern generation circuit and method for use with self-diagnostic circuit Grant 6,802,034 - Matsuo , et al. October 5, 2 | 2004-10-05 |
Program counter circuit App 20040085824 - Matsuo, Yukikazu | 2004-05-06 |
Testing device of semiconductor integrated circuit and test method therefor App 20030023913 - Matsuo, Yukikazu ;   et al. | 2003-01-30 |
Test pattern generation circuit and method for use with self-diagnostic circuit App 20030018938 - Matsuo, Yukikazu ;   et al. | 2003-01-23 |
Semiconductor integrated circuit having built-in self-test circuit Grant 6,335,645 - Matsuo , et al. January 1, 2 | 2002-01-01 |
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