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MATSUO; Yukikazu Patent Filings

MATSUO; Yukikazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for MATSUO; Yukikazu.The latest application filed is for "semiconductor test apparatus for controlling tester".

Company Profile
0.5.6
  • MATSUO; Yukikazu - Hyogo JP
  • Matsuo; Yukikazu - Itami JP
  • MATSUO; Yukikazu - Itami-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor Test Apparatus For Controlling Tester
App 20180039571 - MATSUO; Yukikazu ;   et al.
2018-02-08
Semiconductor test apparatus for controlling tester
Grant 9,811,450 - Matsuo , et al. November 7, 2
2017-11-07
Testing device
Grant 9,557,384 - Matsuo , et al. January 31, 2
2017-01-31
Semiconductor Test Apparatus For Controlling Tester
App 20140325191 - MATSUO; Yukikazu ;   et al.
2014-10-30
Testing Device
App 20140145746 - MATSUO; Yukikazu ;   et al.
2014-05-29
Program counter circuit
Grant 6,930,931 - Matsuo August 16, 2
2005-08-16
Test pattern generation circuit and method for use with self-diagnostic circuit
Grant 6,802,034 - Matsuo , et al. October 5, 2
2004-10-05
Program counter circuit
App 20040085824 - Matsuo, Yukikazu
2004-05-06
Testing device of semiconductor integrated circuit and test method therefor
App 20030023913 - Matsuo, Yukikazu ;   et al.
2003-01-30
Test pattern generation circuit and method for use with self-diagnostic circuit
App 20030018938 - Matsuo, Yukikazu ;   et al.
2003-01-23
Semiconductor integrated circuit having built-in self-test circuit
Grant 6,335,645 - Matsuo , et al. January 1, 2
2002-01-01

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