Matsuo; Ryuji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Matsuo; Ryuji.The latest application filed is for "electronic component-use package and piezoelectric device".

Company Profile

0.18.12

Matsuo; Ryuji - Kakogawa JP
MATSUO; Ryuji - Kakogawa-shi Hyogo
Matsuo; Ryuji - Kunitachi N/A JP
Matsuo; Ryuji - Hino JP
MATSUO; Ryuji - Tokyo JP
Matsuo; Ryuji - Hino-shi JP
Matsuo; Ryuji - Saitama JP
Matsuo; Ryuji - Kunitachi-shi JP
Matsuo; Ryuji - Ome JP
Matsuo; Ryuji - Akishima JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electronic component-use package and piezoelectric device Grant 9,907,177 - Nakanishi , et al. February 27, 2	2018-02-27
Electronic Component-use Package And Piezoelectric Device App 20170034914 - NAKANISHI; Kentaro ; et al.	2017-02-02
X-ray apparatus, method of using the same and X-ray irradiation method Grant 9,336,917 - Ozawa , et al. May 10, 2	2016-05-10
X-ray topography apparatus Grant 9,335,282 - Omote , et al. May 10, 2	2016-05-10
X-ray diffraction apparatus and X-ray diffraction measurement method Grant 9,074,992 - Ozawa , et al. July 7, 2	2015-07-07
Oscillator Grant 8,884,712 - Kojo , et al. November 11, 2	2014-11-11
Sealing member for piezoelectric resonator device, and piezoelectric resonator device Grant 8,710,718 - Kojo , et al. April 29, 2	2014-04-29
X-ray Topography Apparatus App 20130259200 - OMOTE; Kazuhiko ; et al.	2013-10-03
Oscillator App 20120280759 - Kojo; Takuya ; et al.	2012-11-08
Sealing Member For Piezoelectric Resonator Device, And Piezoelectric Resonator Device App 20120262030 - Kojo; Takuya ; et al.	2012-10-18
X-ray Diffraction Apparatus And X-ray Diffraction Measurement Method App 20120140890 - Ozawa; Tetsuya ; et al.	2012-06-07
X-ray Apparatus, Method Of Using The Same And X-ray Irradiation Method App 20110268252 - Ozawa; Tetsuya ; et al.	2011-11-03
Inputting device and mobile terminal Grant 8,022,944 - Suzuki , et al. September 20, 2	2011-09-20
X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same Grant 7,860,217 - Ozawa , et al. December 28, 2	2010-12-28
X-ray beam conditioning device and X-ray analysis apparatus Grant 7,684,543 - Matsuo , et al. March 23, 2	2010-03-23
X-ray optical system Grant 7,542,548 - Matsuo , et al. June 2, 2	2009-06-02
X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical System Therein, and an X-ray Diffraction Measuring Method for the Same App 20090086910 - Ozawa; Tetsuya ; et al.	2009-04-02
X-ray optical system App 20080084967 - Matsuo; Ryuji ; et al.	2008-04-10
X-ray beam conditioning device and X-ray analysis apparatus App 20070003013 - Matsuo; Ryuji ; et al.	2007-01-04
Method of setting measuring range of reciprocal-space mapping Grant 6,999,557 - Yamaguchi , et al. February 14, 2	2006-02-14
Pole measuring method Grant 6,937,694 - Yokoyama , et al. August 30, 2	2005-08-30
Method of setting measuring range of reciprocal-space mapping App 20040240611 - Yamaguchi, Susumu ; et al.	2004-12-02
Inputting device and mobile terminal App 20040119687 - Suzuki, Daisuke ; et al.	2004-06-24
Wireless communication apparatus having rechargeable battery Grant 6,526,293 - Matsuo February 25, 2	2003-02-25
Pole measuring method App 20030012335 - Yokoyama, Ryouichi ; et al.	2003-01-16
Arrangement of automatically restoring normal operation of latch-in relay Grant 5,196,730 - Matsuo March 23, 1	1993-03-23

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