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name:-0.012858152389526
name:-0.0072500705718994
name:-0.00036382675170898
Matsunawa; Tetsuaki Patent Filings

Matsunawa; Tetsuaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Matsunawa; Tetsuaki.The latest application filed is for "pattern generation device, pattern generation method, and method of manufacturing semiconductor device".

Company Profile
0.9.11
  • Matsunawa; Tetsuaki - Fujisawa JP
  • Matsunawa; Tetsuaki - Kanagawa JP
  • Matsunawa; Tetsuaki - Tsukuba JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Pattern generation device, pattern generation method, and method of manufacturing semiconductor device
Grant 11,373,899 - Kimura , et al. June 28, 2
2022-06-28
Pattern Generation Device, Pattern Generation Method, And Method Of Manufacturing Semiconductor Device
App 20200388528 - KIMURA; Taiki ;   et al.
2020-12-10
Non-transitory computer readable storage medium, mask evaluation method and inspection apparatus
Grant 10,282,509 - Watanabe , et al.
2019-05-07
Non-transitory Computer Readable Storage Medium, Mask Evaluation Method And Inspection Apparatus
App 20180121592 - WATANABE; Yuki ;   et al.
2018-05-03
Pattern data generation method, pattern verification method, and optical image calculation method
Grant 9,576,100 - Miyoshi , et al. February 21, 2
2017-02-21
Pattern Data Generation Method, Pattern Verification Method, And Optical Image Calculation Method
App 20150113485 - MIYOSHI; Seiro ;   et al.
2015-04-23
Pattern data generation method, pattern verification method, and optical image calculation method
Grant 8,984,454 - Miyoshi , et al. March 17, 2
2015-03-17
Pattern shape determining method, pattern shape verifying method, and pattern correcting method
Grant 8,885,949 - Nojima , et al. November 11, 2
2014-11-11
Pattern Data Generation Method, Pattern Verification Method, And Optical Image Calculation Method
App 20140059502 - MIYOSHI; Seiro ;   et al.
2014-02-27
Simulation model creating method, computer program product, and method of manufacturing a semiconductor device
Grant 8,381,138 - Matsunawa , et al. February 19, 2
2013-02-19
Simulation Model Creating Method, Computer Program Product, And Method Of Manufacturing A Semiconductor Device
App 20120324407 - MATSUNAWA; Tetsuaki ;   et al.
2012-12-20
Dimension assurance of mask using plurality of types of pattern ambient environment
Grant 8,336,004 - Nojima , et al. December 18, 2
2012-12-18
Resin Removal Method, Resin Removal Apparatus, And Method Of Manufacturing Semiconductor Device
App 20120244717 - ZHANG; Yingkang ;   et al.
2012-09-27
Pattern Shape Determining Method, Pattern Shape Verifying Method, And Pattern Correcting Method
App 20120076424 - NOJIMA; Shigeki ;   et al.
2012-03-29
Light Source Shape Calculation Method
App 20120054697 - TAKAHATA; Kazuhiro ;   et al.
2012-03-01
Mask Verifying Method, Manufacturing Method Of Semiconductor Device, And Computer Program Product
App 20110201138 - Nojima; Shigeki ;   et al.
2011-08-18
Pattern Correcting Apparatus, Mask-pattern Forming Method, And Method Of Manufacturing Semiconductor Device
App 20100233598 - MATSUNAWA; Tetsuaki ;   et al.
2010-09-16
Method for designing mask pattern and method for manufacturing semiconductor device
App 20070074146 - Tanaka; Toshihiko ;   et al.
2007-03-29

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