Matsunami; Tsuyoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Matsunami; Tsuyoshi.The latest application filed is for "x-ray inspection method and x-ray inspection apparatus".

Company Profile

1.5.5

Matsunami; Tsuyoshi - Kyotanabe N/A JP
Matsunami; Tsuyoshi - Kyoto JP
Matsunami; Tsuyoshi - Kyotanabe-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
X-ray inspecting apparatus and X-ray inspecting method Grant 8,391,581 - Masuda , et al. March 5, 2	2013-03-05
X-ray inspection apparatus and X-ray inspection method Grant 8,254,519 - Sugita , et al. August 28, 2	2012-08-28
X-ray Inspection Method And X-ray Inspection Apparatus App 20110255660 - Masuda; Masayuki ; et al.	2011-10-20
X-ray Inspection Apparatus And X-ray Inspection Method App 20110243299 - Sugita; Shinji ; et al.	2011-10-06
X-ray Inspecting Apparatus And X-ray Inspecting Method App 20100329532 - Masuda; Masayuki ; et al.	2010-12-30
X-ray examination method and X-ray examination apparatus Grant 7,680,242 - Masuda , et al. March 16, 2	2010-03-16
X-ray examination apparatus and x-ray examination method using the same Grant 7,522,709 - Masuda , et al. April 21, 2	2009-04-21
X-ray Examination Method And X-ray Examination Apparatus App 20080226023 - MASUDA; Masayuki ; et al.	2008-09-18
X-ray Examination Apparatus And X-ray Examination Method Using The Same App 20080226035 - Masuda; Masayuki ; et al.	2008-09-18

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