Matsunaga; Ryouji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Matsunaga; Ryouji.The latest application filed is for "apparatus and method for testing defects".
- Matsunaga; Ryouji - Chigasaka JP
- Matsunaga; Ryouji - Chigasaki-shi JP
- Matsunaga; Ryouji - Chigasaki JP
| Patent | Date |
|---|---|
| Method of detecting defects on an object Grant 7,940,383 - Noguchi , et al. May 10, 2 | 2011-05-10 |
| Apparatus And Method For Testing Defects App 20100088042 - NOGUCHI; Minori ; et al. | 2010-04-08 |
| Apparatus and method for testing defects Grant 7,692,779 - Noguchi , et al. April 6, 2 | 2010-04-06 |
| Apparatus and method for testing defects Grant 7,639,350 - Noguchi , et al. December 29, 2 | 2009-12-29 |
| Apparatus and method for testing defects Grant 7,443,496 - Noguchi , et al. October 28, 2 | 2008-10-28 |
| Apparatus And Method For Testing Defects App 20070146696 - Noguchi; Minori ; et al. | 2007-06-28 |
| Apparatus And Method For Testing Defects App 20070146697 - Noguchi; Minori ; et al. | 2007-06-28 |
| Apparatus and method for testing defects Grant 7,098,055 - Noguchi , et al. August 29, 2 | 2006-08-29 |
| Apparatus and method for testing defects Grant 7,037,735 - Noguchi , et al. May 2, 2 | 2006-05-02 |
| Apparatus and method for testing defects App 20060030060 - Noguchi; Minori ; et al. | 2006-02-09 |
| Apparatus and method for testing defects App 20060030059 - Noguchi; Minori ; et al. | 2006-02-09 |
| Optical apparatus for defect and particle size inspection Grant 6,411,377 - Noguchi , et al. June 25, 2 | 2002-06-25 |
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