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name:-0.049124002456665
name:-0.087514162063599
name:-0.010697841644287
Matsumiya; Sadayuki Patent Filings

Matsumiya; Sadayuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Matsumiya; Sadayuki.The latest application filed is for "measuring x-ray ct apparatus and tomographic image generating method".

Company Profile
11.99.40
  • Matsumiya; Sadayuki - Kanagawa JP
  • Matsumiya; Sadayuki - Sagamihara JP
  • Matsumiya; Sadayuki - Kawasaki JP
  • Matsumiya; Sadayuki - Kawasaki-shi JP
  • MATSUMIYA; Sadayuki - Sagamihara-shi JP
  • Matsumiya, Sadayuki - Sagamihara-city JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Measuring X-ray CT apparatus and tomographic image generating method
Grant 11,234,670 - Matsumiya , et al. February 1, 2
2022-02-01
Measuring head
Grant 10,551,184 - Matsumiya , et al. Fe
2020-02-04
Measuring X-ray Ct Apparatus And Tomographic Image Generating Method
App 20190274654 - MATSUMIYA; Sadayuki ;   et al.
2019-09-12
Surface texture measuring apparatus
Grant 10,295,337 - Matsumiya , et al.
2019-05-21
Hardness tester
Grant D848,882 - Matsumiya , et al.
2019-05-21
Display device for hardness tester
Grant D848,867 - Matsumiya , et al.
2019-05-21
Hardness tester
Grant D848,883 - Matsumiya , et al.
2019-05-21
Hardness tester
Grant D847,674 - Matsumiya , et al.
2019-05-07
Hardness tester
Grant D847,676 - Matsumiya , et al.
2019-05-07
Hardness tester
Grant D847,675 - Matsumiya , et al.
2019-05-07
Chromatic confocal sensor
Grant 10,197,382 - Matsumiya , et al. Fe
2019-02-05
Method and device for controlling rotary table
Grant 10,190,996 - Matsumiya , et al. Ja
2019-01-29
Measuring probe and measuring probe system
Grant 10,161,743 - Hidaka , et al. Dec
2018-12-25
Probe head rotating mechanism
Grant 10,113,851 - Ooyama , et al. October 30, 2
2018-10-30
Measuring Head
App 20180274914 - MATSUMIYA; Sadayuki ;   et al.
2018-09-27
Variable focal length lens
Grant D829,261 - Matsumiya , et al. September 25, 2
2018-09-25
Probe for remote coordinate measuring machine
Grant D827,459 - Matsumiya , et al. September 4, 2
2018-09-04
Wireless communication device
Grant D825,557 - Matsumiya , et al. August 14, 2
2018-08-14
Wireless communication device
Grant D821,393 - Matsumiya , et al. June 26, 2
2018-06-26
Measuring probe and measuring probe system
Grant 10,001,358 - Hidaka , et al. June 19, 2
2018-06-19
Connection device for communication
Grant D819,631 - Matsumiya , et al. June 5, 2
2018-06-05
Chromatic Confocal Sensor
App 20180112966 - Matsumiya; Sadayuki ;   et al.
2018-04-26
Image measuring device
Grant D806,586 - Matsumiya , et al. January 2, 2
2018-01-02
Image measuring device
Grant D806,585 - Matsumiya , et al. January 2, 2
2018-01-02
Optical measurement head for coordinate measurement
Grant D805,409 - Matsumiya , et al. December 19, 2
2017-12-19
Measuring Probe And Measuring Probe System
App 20170284794 - HIDAKA; Kazuhiko ;   et al.
2017-10-05
Surface Texture Measuring Apparatus
App 20170248415 - MATSUMIYA; Sadayuki ;   et al.
2017-08-31
Digital measuring gauge
Grant D792,251 - Matsumiya , et al. July 18, 2
2017-07-18
Digital dial gauge
Grant D790,379 - Matsumiya , et al. June 27, 2
2017-06-27
Image measuring device
Grant D783,424 - Matsumiya , et al. April 11, 2
2017-04-11
Measuring Probe And Measuring Probe System
App 20170097221 - HIDAKA; Kazuhiko ;   et al.
2017-04-06
Probe Head Rotating Mechanism
App 20170059297 - OOYAMA; Yoshikazu ;   et al.
2017-03-02
Caliper
Grant D774,928 - Matsumiya , et al. December 27, 2
2016-12-27
Form measuring machine
Grant 9,518,811 - Yamamoto , et al. December 13, 2
2016-12-13
Method And Device For Controlling Rotary Table
App 20160305894 - MATSUMIYA; Sadayuki ;   et al.
2016-10-20
Measuring instrument with a graphical user interface
Grant D766,920 - Matsumiya , et al. September 20, 2
2016-09-20
Micrometer
Grant 9,372,059 - Asano , et al. June 21, 2
2016-06-21
Measuring instrument with a graphical user interface
Grant D759,669 - Matsumiya , et al. June 21, 2
2016-06-21
Form measuring instrument
Grant 9,285,201 - Matsumiya , et al. March 15, 2
2016-03-15
Surface roughness measuring unit and coordinate measuring apparatus
Grant 9,250,053 - Hirano , et al. February 2, 2
2016-02-02
Digital dial gauge
Grant D747,988 - Matsumiya , et al. January 26, 2
2016-01-26
Interface for height gauge
Grant D746,164 - Matsumiya , et al. December 29, 2
2015-12-29
Camera for remote coordinate measuring machine
Grant D744,573 - Matsumiya , et al. December 1, 2
2015-12-01
Form Measuring Machine
App 20150292851 - YAMAMOTO; Takeshi ;   et al.
2015-10-15
Micrometer
Grant D740,143 - Asano , et al. October 6, 2
2015-10-06
Method for cleaning skid of surface roughness tester
Grant 9,103,656 - Matsumiya , et al. August 11, 2
2015-08-11
Micrometer
Grant D729,659 - Asano , et al. May 19, 2
2015-05-19
Height gauge
Grant D727,760 - Matsumiya , et al. April 28, 2
2015-04-28
Micrometer
App 20150059196 - ASANO; Yoshiro ;   et al.
2015-03-05
Calipers
Grant D721,291 - Matsumiya , et al. January 20, 2
2015-01-20
Measuring head
Grant D712,761 - Matsumiya , et al. September 9, 2
2014-09-09
Form Measuring Instrument
App 20140237834 - Matsumiya; Sadayuki ;   et al.
2014-08-28
Optical measurement head for measuring coordinates
Grant D709,777 - Matsumiya , et al. July 29, 2
2014-07-29
Microscope
Grant D706,847 - Matsumiya , et al. June 10, 2
2014-06-10
Surface Roughness Measuring Unit And Coordinate Measuring Apparatus
App 20140109422 - HIRANO; Kotaro ;   et al.
2014-04-24
Surface texture measuring machine and a surface texture measuring method
Grant 8,650,939 - Matsumiya , et al. February 18, 2
2014-02-18
Coordinates measuring head unit and coordinates measuring machine
Grant 8,650,767 - Matsumiya , et al. February 18, 2
2014-02-18
Interference objective lens unit and light-interference measuring apparatus using thereof
Grant 8,553,232 - Matsumiya , et al. October 8, 2
2013-10-08
Digital display device for surface-roughness measuring instruments
Grant D686,096 - Matsumiya , et al. July 16, 2
2013-07-16
Digital display device for surface-roughness measuring instruments
Grant D686,095 - Matsumiya , et al. July 16, 2
2013-07-16
Surface-roughness measuring probe
Grant D678,787 - Matsumiya , et al. March 26, 2
2013-03-26
Stand for a micrometer
Grant D678,090 - Matsumiya , et al. March 19, 2
2013-03-19
Stand for a micrometer
Grant D678,033 - Matsumiya , et al. March 19, 2
2013-03-19
Coordinate measuring machine
Grant 8,316,553 - Matsumiya , et al. November 27, 2
2012-11-27
Remote probe for a coordinate measuring machine
Grant D666,513 - Matsumiya , et al. September 4, 2
2012-09-04
Autofocus device with contrast enhancement
Grant 8,258,448 - Nagahama , et al. September 4, 2
2012-09-04
Measuring head
Grant D659,572 - Matsumiya , et al. May 15, 2
2012-05-15
Measuring head
Grant D659,575 - Matsumiya , et al. May 15, 2
2012-05-15
Measuring head
Grant D659,574 - Matsumiya , et al. May 15, 2
2012-05-15
Interference Objective Lens Unit And Light-interference Measuring Apparatus Using Thereof
App 20120099115 - MATSUMIYA; Sadayuki ;   et al.
2012-04-26
Knob for a stand for measuring instruments
Grant D657,654 - Matsumiya , et al. April 17, 2
2012-04-17
Coordinates Measuring Head Unit And Coordinates Measuring Machine
App 20120073154 - Matsumiya; Sadayuki ;   et al.
2012-03-29
Method For Cleaning Skid Of Surface Roughness Tester
App 20120017940 - MATSUMIYA; Sadayuki ;   et al.
2012-01-26
Illumination light quantity setting method in image measuring instrument
Grant 8,008,610 - Asano , et al. August 30, 2
2011-08-30
Surface Texture Measuring Machine And A Surface Texture Measuring Method
App 20110083497 - MATSUMIYA; Sadayuki ;   et al.
2011-04-14
Image measuring system, image measuring method and image measuring program for measuring moving objects
Grant 7,869,622 - Matsumiya , et al. January 11, 2
2011-01-11
Coordinate Measuring Machine
App 20100269361 - Matsumiya; Sadayuki ;   et al.
2010-10-28
Autofocus Device
App 20100133417 - Nagahama; Tatsuya ;   et al.
2010-06-03
Measuring instrument
Grant 7,721,455 - Matsumiya , et al. May 25, 2
2010-05-25
Surface-roughness measurement instrument
Grant D614,053 - Matsumiya , et al. April 20, 2
2010-04-20
Illumination light quantity setting method in image measuring instrument
App 20090180708 - Asano; Hidemitsu ;   et al.
2009-07-16
Measuring instrument
App 20090113734 - Matsumiya; Sadayuki ;   et al.
2009-05-07
Optical measuring machine
Grant 7,528,968 - Matsumiya , et al. May 5, 2
2009-05-05
Screw measuring method, screw measuring probe, and screw measuring apparatus using the screw measuring probe
Grant 7,490,411 - Matsumiya , et al. February 17, 2
2009-02-17
Optical measuring machine
App 20080252904 - Matsumiya; Sadayuki ;   et al.
2008-10-16
Measuring method, measuring system and storage medium
Grant 7,420,588 - Asano , et al. September 2, 2
2008-09-02
Earthquake disaster prevention system
Grant 7,346,432 - Matsumiya , et al. March 18, 2
2008-03-18
Surface profile measuring instrument
Grant 7,318,285 - Matsumiya , et al. January 15, 2
2008-01-15
Screw measuring method, screw measuring probe, and screw measuring apparatus using the screw measuring probe
App 20070240318 - Matsumiya; Sadayuki ;   et al.
2007-10-18
Image measuring method, image measuring system and image measuring program
Grant 7,268,894 - Matsumiya , et al. September 11, 2
2007-09-11
Earthquake disaster prevention system
App 20070144242 - Matsumiya; Sadayuki ;   et al.
2007-06-28
Measuring instrument cover and measuring instrument
Grant 7,231,726 - Matsumiya , et al. June 19, 2
2007-06-19
Sensor Block
App 20070102810 - Matsumiya; Sadayuki ;   et al.
2007-05-10
Surface Profile Measuring Instrument
App 20070056176 - Matsumiya; Sadayuki ;   et al.
2007-03-15
Measurement data processor and measurement data processing method
Grant 7,152,020 - Michiwaki , et al. December 19, 2
2006-12-19
Image measuring method, image measuring system and image measuring program
App 20060274328 - Matsumiya; Sadayuki ;   et al.
2006-12-07
Image measuring system, image measuring method and image measuring program
App 20060274330 - Matsumiya; Sadayuki ;   et al.
2006-12-07
Measuring tool, encoder and producing method of encoder
Grant 7,045,088 - Matsumiya , et al. May 16, 2
2006-05-16
Width-measuring method and surface texture measuring instrument
Grant 7,036,238 - Kojima , et al. May 2, 2
2006-05-02
Measuring instrument cover and measuring instrument
App 20050166416 - Matsumiya, Sadayuki ;   et al.
2005-08-04
Width-measuring method and surface texture measuring instrument
App 20050132591 - Kojima, Tsukasa ;   et al.
2005-06-23
Measuring tool, encoder and producing method of encoder
App 20050081400 - Matsumiya, Sadayuki ;   et al.
2005-04-21
Measurement data processor and measurement data processing method
App 20050075843 - Michiwaki, Hirokazu ;   et al.
2005-04-07
Measuring tool, encoder and producing method of encoder
Grant 6,834,439 - Matsumiya , et al. December 28, 2
2004-12-28
Measurement data processor and measurement data processing method
Grant 6,829,567 - Michiwaki , et al. December 7, 2
2004-12-07
Measuring apparatus
Grant 6,812,850 - Matsumiya , et al. November 2, 2
2004-11-02
Image-reading apparatus and image reading method
App 20040136580 - Matsumiya, Sadayuki ;   et al.
2004-07-15
Illuminating apparatus for image processing type measuring machines
Grant 6,755,562 - Tachibana , et al. June 29, 2
2004-06-29
Measuring method, measuring system and storage medium
App 20040109205 - Asano, Hidemitsu ;   et al.
2004-06-10
Method and device for determining operation balance of machines
Grant 6,690,982 - Fujishima , et al. February 10, 2
2004-02-10
Method for NC- programming and system for NC- machining
Grant 6,671,571 - Matsumiya , et al. December 30, 2
2003-12-30
Measuring tool, encoder and producing method of encoder
App 20030217478 - Matsumiya, Sadayuki ;   et al.
2003-11-27
Illuminating apparatus for image processing type measuring machines
App 20030169601 - Tachibana, Shunsaku ;   et al.
2003-09-11
Method and apparatus for providing numerical control information
Grant 6,591,156 - Fukaya , et al. July 8, 2
2003-07-08
Method of creating tool wear data, estimating tool wear and judging use of tool
Grant 6,584,415 - Uneme , et al. June 24, 2
2003-06-24
Manufacturing system and method
Grant 6,571,145 - Matsumiya , et al. May 27, 2
2003-05-27
Automatic washing device for a workpiece to be measured and automatic production system provided with the same
Grant 6,568,407 - Matsumiya , et al. May 27, 2
2003-05-27
Measuring apparatus
App 20030043267 - Matsumiya, Sadayuki ;   et al.
2003-03-06
Method and apparatus for collecting operation event logs in NC machining
Grant 6,512,961 - Fukaya , et al. January 28, 2
2003-01-28
Measurement data processor and measurement data processing method
App 20030004691 - Michiwaki, Hirokazu ;   et al.
2003-01-02
Optimization method and device of NC program in NC machining
Grant 6,502,007 - Kanamoto , et al. December 31, 2
2002-12-31
Caliper and caliper grip
App 20020100183 - Matsumiya, Sadayuki ;   et al.
2002-08-01
Method and device for analyzing NC program for NC machining
Grant 6,401,004 - Yamazaki , et al. June 4, 2
2002-06-04
Generation of measurement program in NC machining and machining management based on the measurement program
Grant 6,400,998 - Yamazaki , et al. June 4, 2
2002-06-04
Work Form-measuring Method And Device, And Coordinate-measuring Machine
App 20020000047 - YODA, YUKIJI ;   et al.
2002-01-03
Form measuring sensor and form measuring instrument
App 20010034948 - Matsumiya, Sadayuki ;   et al.
2001-11-01
Error correction apparatus for NC machine tool
Grant 6,286,055 - Yamazaki , et al. September 4, 2
2001-09-04
Apparatus for generating a numerical control command according to cut resistance value and cut torque value of machining simulation
Grant 6,266,572 - Yamazaki , et al. July 24, 2
2001-07-24
Numeric control command generator and method
Grant 6,223,095 - Yamazaki , et al. April 24, 2
2001-04-24
Position calibrating method for optical measuring apparatus
Grant 6,067,165 - Matsumiya , et al. May 23, 2
2000-05-23

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