Patent | Date |
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Image processing apparatus Grant 11,209,712 - Matsuda December 28, 2 | 2021-12-28 |
Process Of Forming High Electron Mobility Transistor (hemt) And Hemt Formed By The Same App 20210167188 - WATANABE; Tadashi ;   et al. | 2021-06-03 |
Process of forming high electron mobility transistor (HEMT) and HEMT formed by the same Grant 10,896,970 - Watanabe , et al. January 19, 2 | 2021-01-19 |
Process of forming epitaxial substrate and semiconductor device provided on the same Grant 10,840,091 - Matsuda November 17, 2 | 2020-11-17 |
Process Of Forming High Electron Mobility Transistor (hemt) And Hemt Formed By The Same App 20200312982 - WATANABE; Tadashi ;   et al. | 2020-10-01 |
Image Processing Apparatus App 20200264464 - MATSUDA; Hajime | 2020-08-20 |
Semiconductor device Grant 10,734,510 - Matsuda | 2020-08-04 |
Process of forming high electron mobility transistor (HEMT) and HEMT formed by the same Grant 10,686,053 - Watanabe , et al. | 2020-06-16 |
Semiconductor Device App 20200127129 - MATSUDA; Hajime | 2020-04-23 |
Image processing apparatus Grant 10,627,216 - Matsuda , et al. | 2020-04-21 |
Process of forming semiconductor epitaxial substrate Grant 10,546,746 - Matsuda Ja | 2020-01-28 |
Semiconductor device Grant 10,541,322 - Matsuda Ja | 2020-01-21 |
Image Processing Apparatus App 20190293409 - Matsuda; Hajime ;   et al. | 2019-09-26 |
Inspection apparatus, inspection method, and program Grant 10,241,056 - Matsuda | 2019-03-26 |
Process Of Forming High Electron Mobility Transistor (hemt) And Hemt Formed By The Same App 20190081154 - WATANABE; Tadashi ;   et al. | 2019-03-14 |
Inspection Apparatus, Inspection Method, And Program App 20190064078 - Matsuda; Hajime | 2019-02-28 |
Inspection apparatus, inspection method, and program Grant 10,156,525 - Matsuda Dec | 2018-12-18 |
Process of producing epitaxial substrate Grant 10,147,605 - Watanabe , et al. De | 2018-12-04 |
Inspection Apparatus, Inspection Method, And Program App 20180292327 - Matsuda; Hajime | 2018-10-11 |
Process of forming nitride semiconductor layers Grant 10,056,252 - Watanabe , et al. August 21, 2 | 2018-08-21 |
Inspection apparatus, inspection method, and program Grant 10,036,713 - Matsuda July 31, 2 | 2018-07-31 |
Semiconductor Device App 20180197978 - MATSUDA; Hajime | 2018-07-12 |
Process Of Forming Epitaxial Substrate And Semiconductor Device Provided On The Same App 20180174824 - MATSUDA; Hajime | 2018-06-21 |
Process Of Producing Epitaxial Substrate App 20180151349 - WATANABE; Tadashi ;   et al. | 2018-05-31 |
Process Of Forming Nitride Semiconductor Layers App 20180061632 - WATANABE; Tadashi ;   et al. | 2018-03-01 |
Inspection Apparatus, Inspection Method, And Program App 20170350827 - Matsuda; Hajime | 2017-12-07 |
Inspection apparatus, inspection method, and program Grant 9,778,203 - Matsuda October 3, 2 | 2017-10-03 |
Inspection Apparatus, Inspection Method, And Program App 20170254758 - Matsuda; Hajime | 2017-09-07 |
Inspection apparatus, inspection method, and program Grant 9,689,806 - Matsuda June 27, 2 | 2017-06-27 |
Semiconductor device having via hole coated in side surfaces with heat treated nitride metal and method to form the same Grant 9,673,094 - Watanabe , et al. June 6, 2 | 2017-06-06 |
Inspection Apparatus, Inspection Method, And Program App 20170030839 - Matsuda; Hajime | 2017-02-02 |
Method Of Growing An Epitaxial Substrate And Forming A Semiconductor Device On The Epitaxial Substrate App 20160343842 - MATSUDA; Hajime | 2016-11-24 |
Inspection apparatus, inspection method, and program Grant 9,494,528 - Matsuda November 15, 2 | 2016-11-15 |
Semiconductor Device Having Via Hole Coated In Side Surfaces With Heat Treated Nitride Metal And Method To Form The Same App 20160190299 - WATANABE; Tadashi ;   et al. | 2016-06-30 |
A Surface Patterned Frozen Dessert and Manufacturing Method and Apparatus for Same App 20160165921 - ANDO; Kaori ;   et al. | 2016-06-16 |
Inspection Apparatus, Inspection Method, And Program App 20150355104 - Matsuda; Hajime | 2015-12-10 |
External illumination apparatus for optical information reading apparatus Grant 9,033,244 - Matsuda , et al. May 19, 2 | 2015-05-19 |
Printing quality evaluation system, laser marking apparatus, printing condition setting device, printing quality evaluation apparatus, printing condition setting program, printing quality evaluation program, and computer-readable recording medium Grant 8,890,917 - Matsuda , et al. November 18, 2 | 2014-11-18 |
External illumination apparatus for optical information reading apparatus Grant 8,714,455 - Matsuda , et al. May 6, 2 | 2014-05-06 |
External Illumination Apparatus For Optical Information Reading Apparatus App 20140048603 - Matsuda; Hajime ;   et al. | 2014-02-20 |
Illumination setting support apparatus of optical information reading apparatus Grant 8,479,991 - Nakamura , et al. July 9, 2 | 2013-07-09 |
Illumination Setting Support Apparatus Of Optical Information Reading Apparatus App 20130082107 - Nakamura; Shigeo ;   et al. | 2013-04-04 |
Illumination setting support apparatus of optical information reading apparatus Grant 8,342,404 - Nakamura , et al. January 1, 2 | 2013-01-01 |
Printing Quality Evaluation System, Laser Marking Apparatus, Printing Condition Setting Device, Printing Quality Evaluation Apparatus, Printing Condition Setting Program, Printing Quality Evaluation Program, And Computer-Readable Recording Medium App 20120182374 - Matsuda; Hajime ;   et al. | 2012-07-19 |
Field effect transistor and method for fabricating the same Grant 8,188,520 - Watanabe , et al. May 29, 2 | 2012-05-29 |
Code reading device Grant 8,172,143 - Matsuda , et al. May 8, 2 | 2012-05-08 |
Code Quality Evaluating Apparatus App 20120067952 - Matsuda; Hajime | 2012-03-22 |
Illumination Setting Support Apparatus Of Optical Information Reading Apparatus App 20120067957 - Nakamura; Shigeo ;   et al. | 2012-03-22 |
External Illumination Apparatus For Optical Information Reading Apparatus App 20120068629 - Matsuda; Hajime ;   et al. | 2012-03-22 |
Code Reading Device App 20110309148 - Matsuda; Hajime ;   et al. | 2011-12-22 |
Field Effect Transistor And Method For Fabricating The Same App 20110215383 - Watanabe; Tadashi ;   et al. | 2011-09-08 |
Field effect transistor and method for fabricating the same Grant 7,964,486 - Watanabe , et al. June 21, 2 | 2011-06-21 |
Switch circuit, semiconductor device, and method of manufacturing said semiconductor device Grant 7,821,031 - Matsuda October 26, 2 | 2010-10-26 |
Container-packed, oil-in-water type emulsified food product and method for manufacture thereof Grant 7,662,421 - Kobayashi , et al. February 16, 2 | 2010-02-16 |
Bar Code Reading Apparatus and Bar Code Reading Method App 20090272809 - Matsuda; Hajime | 2009-11-05 |
Field Effect Transistor And Method For Fabricating The Same App 20080211052 - WATANABE; Tadashi ;   et al. | 2008-09-04 |
Semiconductor Device App 20080174357 - MATSUDA; Hajime | 2008-07-24 |
Switch circuit, semiconductor device, and method of manufacturing said semiconductor device App 20060219534 - Matsuda; Hajime | 2006-10-05 |
Semiconductor device and manufacturing method of the same Grant 7,087,957 - Matsuda August 8, 2 | 2006-08-08 |
Semiconductor device and manufacturing method of the same App 20050189584 - Matsuda, Hajime | 2005-09-01 |
Packaged oil-in-water type emulsion food and process for producing the same App 20050123655 - Kobayashi, Hideaki ;   et al. | 2005-06-09 |
Semiconductor device having a microstrip line Grant 6,504,189 - Matsuda , et al. January 7, 2 | 2003-01-07 |
Semiconductor device and method for fabricating the same Grant 6,316,297 - Matsuda November 13, 2 | 2001-11-13 |
Microwave monolithic integrated circuit and fabrication process thereof App 20010012652 - Matsuda, Hajime | 2001-08-09 |
High-speed compound semiconductor device having an improved gate structure Grant 6,078,071 - Matsuda June 20, 2 | 2000-06-20 |
High-speed semiconductor device having a dual-layer gate structure and a fabrication process thereof Grant 6,037,245 - Matsuda March 14, 2 | 2000-03-14 |
Cosmetic stick comprising water-in-oil emulsion Grant 3,957,969 - Fujiyama , et al. May 18, 1 | 1976-05-18 |