loadpatents
name:-0.034013986587524
name:-0.037507057189941
name:-0.0031530857086182
Matsuda; Hajime Patent Filings

Matsuda; Hajime

Patent Applications and Registrations

Patent applications and USPTO patent grants for Matsuda; Hajime.The latest application filed is for "process of forming high electron mobility transistor (hemt) and hemt formed by the same".

Company Profile
2.35.34
  • Matsuda; Hajime - Osaka JP
  • MATSUDA; Hajime - Yokohama-shi JP
  • Matsuda; Hajime - Yokohama JP
  • Matsuda; Hajime - Kanagawa JP
  • Matsuda; Hajime - Fujisawa JP
  • MATSUDA; Hajime - Fujisawa-shi JP
  • Matsuda; Hajime - Yamanashi JP
  • Matsuda; Hajime - Tokyo JP
  • Matsuda; Hajime - Yamanashi-ken JP
  • Matsuda, Hajime - Nakakoma JP
  • Matsuda; Hajime - Nakakoma-gun JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Image processing apparatus
Grant 11,209,712 - Matsuda December 28, 2
2021-12-28
Process Of Forming High Electron Mobility Transistor (hemt) And Hemt Formed By The Same
App 20210167188 - WATANABE; Tadashi ;   et al.
2021-06-03
Process of forming high electron mobility transistor (HEMT) and HEMT formed by the same
Grant 10,896,970 - Watanabe , et al. January 19, 2
2021-01-19
Process of forming epitaxial substrate and semiconductor device provided on the same
Grant 10,840,091 - Matsuda November 17, 2
2020-11-17
Process Of Forming High Electron Mobility Transistor (hemt) And Hemt Formed By The Same
App 20200312982 - WATANABE; Tadashi ;   et al.
2020-10-01
Image Processing Apparatus
App 20200264464 - MATSUDA; Hajime
2020-08-20
Semiconductor device
Grant 10,734,510 - Matsuda
2020-08-04
Process of forming high electron mobility transistor (HEMT) and HEMT formed by the same
Grant 10,686,053 - Watanabe , et al.
2020-06-16
Semiconductor Device
App 20200127129 - MATSUDA; Hajime
2020-04-23
Image processing apparatus
Grant 10,627,216 - Matsuda , et al.
2020-04-21
Process of forming semiconductor epitaxial substrate
Grant 10,546,746 - Matsuda Ja
2020-01-28
Semiconductor device
Grant 10,541,322 - Matsuda Ja
2020-01-21
Image Processing Apparatus
App 20190293409 - Matsuda; Hajime ;   et al.
2019-09-26
Inspection apparatus, inspection method, and program
Grant 10,241,056 - Matsuda
2019-03-26
Process Of Forming High Electron Mobility Transistor (hemt) And Hemt Formed By The Same
App 20190081154 - WATANABE; Tadashi ;   et al.
2019-03-14
Inspection Apparatus, Inspection Method, And Program
App 20190064078 - Matsuda; Hajime
2019-02-28
Inspection apparatus, inspection method, and program
Grant 10,156,525 - Matsuda Dec
2018-12-18
Process of producing epitaxial substrate
Grant 10,147,605 - Watanabe , et al. De
2018-12-04
Inspection Apparatus, Inspection Method, And Program
App 20180292327 - Matsuda; Hajime
2018-10-11
Process of forming nitride semiconductor layers
Grant 10,056,252 - Watanabe , et al. August 21, 2
2018-08-21
Inspection apparatus, inspection method, and program
Grant 10,036,713 - Matsuda July 31, 2
2018-07-31
Semiconductor Device
App 20180197978 - MATSUDA; Hajime
2018-07-12
Process Of Forming Epitaxial Substrate And Semiconductor Device Provided On The Same
App 20180174824 - MATSUDA; Hajime
2018-06-21
Process Of Producing Epitaxial Substrate
App 20180151349 - WATANABE; Tadashi ;   et al.
2018-05-31
Process Of Forming Nitride Semiconductor Layers
App 20180061632 - WATANABE; Tadashi ;   et al.
2018-03-01
Inspection Apparatus, Inspection Method, And Program
App 20170350827 - Matsuda; Hajime
2017-12-07
Inspection apparatus, inspection method, and program
Grant 9,778,203 - Matsuda October 3, 2
2017-10-03
Inspection Apparatus, Inspection Method, And Program
App 20170254758 - Matsuda; Hajime
2017-09-07
Inspection apparatus, inspection method, and program
Grant 9,689,806 - Matsuda June 27, 2
2017-06-27
Semiconductor device having via hole coated in side surfaces with heat treated nitride metal and method to form the same
Grant 9,673,094 - Watanabe , et al. June 6, 2
2017-06-06
Inspection Apparatus, Inspection Method, And Program
App 20170030839 - Matsuda; Hajime
2017-02-02
Method Of Growing An Epitaxial Substrate And Forming A Semiconductor Device On The Epitaxial Substrate
App 20160343842 - MATSUDA; Hajime
2016-11-24
Inspection apparatus, inspection method, and program
Grant 9,494,528 - Matsuda November 15, 2
2016-11-15
Semiconductor Device Having Via Hole Coated In Side Surfaces With Heat Treated Nitride Metal And Method To Form The Same
App 20160190299 - WATANABE; Tadashi ;   et al.
2016-06-30
A Surface Patterned Frozen Dessert and Manufacturing Method and Apparatus for Same
App 20160165921 - ANDO; Kaori ;   et al.
2016-06-16
Inspection Apparatus, Inspection Method, And Program
App 20150355104 - Matsuda; Hajime
2015-12-10
External illumination apparatus for optical information reading apparatus
Grant 9,033,244 - Matsuda , et al. May 19, 2
2015-05-19
Printing quality evaluation system, laser marking apparatus, printing condition setting device, printing quality evaluation apparatus, printing condition setting program, printing quality evaluation program, and computer-readable recording medium
Grant 8,890,917 - Matsuda , et al. November 18, 2
2014-11-18
External illumination apparatus for optical information reading apparatus
Grant 8,714,455 - Matsuda , et al. May 6, 2
2014-05-06
External Illumination Apparatus For Optical Information Reading Apparatus
App 20140048603 - Matsuda; Hajime ;   et al.
2014-02-20
Illumination setting support apparatus of optical information reading apparatus
Grant 8,479,991 - Nakamura , et al. July 9, 2
2013-07-09
Illumination Setting Support Apparatus Of Optical Information Reading Apparatus
App 20130082107 - Nakamura; Shigeo ;   et al.
2013-04-04
Illumination setting support apparatus of optical information reading apparatus
Grant 8,342,404 - Nakamura , et al. January 1, 2
2013-01-01
Printing Quality Evaluation System, Laser Marking Apparatus, Printing Condition Setting Device, Printing Quality Evaluation Apparatus, Printing Condition Setting Program, Printing Quality Evaluation Program, And Computer-Readable Recording Medium
App 20120182374 - Matsuda; Hajime ;   et al.
2012-07-19
Field effect transistor and method for fabricating the same
Grant 8,188,520 - Watanabe , et al. May 29, 2
2012-05-29
Code reading device
Grant 8,172,143 - Matsuda , et al. May 8, 2
2012-05-08
Code Quality Evaluating Apparatus
App 20120067952 - Matsuda; Hajime
2012-03-22
Illumination Setting Support Apparatus Of Optical Information Reading Apparatus
App 20120067957 - Nakamura; Shigeo ;   et al.
2012-03-22
External Illumination Apparatus For Optical Information Reading Apparatus
App 20120068629 - Matsuda; Hajime ;   et al.
2012-03-22
Code Reading Device
App 20110309148 - Matsuda; Hajime ;   et al.
2011-12-22
Field Effect Transistor And Method For Fabricating The Same
App 20110215383 - Watanabe; Tadashi ;   et al.
2011-09-08
Field effect transistor and method for fabricating the same
Grant 7,964,486 - Watanabe , et al. June 21, 2
2011-06-21
Switch circuit, semiconductor device, and method of manufacturing said semiconductor device
Grant 7,821,031 - Matsuda October 26, 2
2010-10-26
Container-packed, oil-in-water type emulsified food product and method for manufacture thereof
Grant 7,662,421 - Kobayashi , et al. February 16, 2
2010-02-16
Bar Code Reading Apparatus and Bar Code Reading Method
App 20090272809 - Matsuda; Hajime
2009-11-05
Field Effect Transistor And Method For Fabricating The Same
App 20080211052 - WATANABE; Tadashi ;   et al.
2008-09-04
Semiconductor Device
App 20080174357 - MATSUDA; Hajime
2008-07-24
Switch circuit, semiconductor device, and method of manufacturing said semiconductor device
App 20060219534 - Matsuda; Hajime
2006-10-05
Semiconductor device and manufacturing method of the same
Grant 7,087,957 - Matsuda August 8, 2
2006-08-08
Semiconductor device and manufacturing method of the same
App 20050189584 - Matsuda, Hajime
2005-09-01
Packaged oil-in-water type emulsion food and process for producing the same
App 20050123655 - Kobayashi, Hideaki ;   et al.
2005-06-09
Semiconductor device having a microstrip line
Grant 6,504,189 - Matsuda , et al. January 7, 2
2003-01-07
Semiconductor device and method for fabricating the same
Grant 6,316,297 - Matsuda November 13, 2
2001-11-13
Microwave monolithic integrated circuit and fabrication process thereof
App 20010012652 - Matsuda, Hajime
2001-08-09
High-speed compound semiconductor device having an improved gate structure
Grant 6,078,071 - Matsuda June 20, 2
2000-06-20
High-speed semiconductor device having a dual-layer gate structure and a fabrication process thereof
Grant 6,037,245 - Matsuda March 14, 2
2000-03-14
Cosmetic stick comprising water-in-oil emulsion
Grant 3,957,969 - Fujiyama , et al. May 18, 1
1976-05-18

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed