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name:-0.010257005691528
name:-0.0076651573181152
MATOBA; Kenichi Patent Filings

MATOBA; Kenichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for MATOBA; Kenichi.The latest application filed is for "semiconductor device and method for manufacturing the same".

Company Profile
7.9.15
  • MATOBA; Kenichi - Yokohama Kanagawa JP
  • Matoba; Kenichi - Otsu JP
  • MATOBA; Kenichi - Otsu-shi JP
  • Matoba; Kenichi - Kyoto N/A JP
  • Matoba; Kenichi - Kanagawa-ken JP
  • Matoba; Kenichi - Kyoto-shi JP
  • Matoba, Kenichi - Yokohama-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor Device And Method For Manufacturing The Same
App 20220285284 - MIZUTA; Yoichi ;   et al.
2022-09-08
Semiconductor Storage Device
App 20220077128 - CHIBA; Akihiko ;   et al.
2022-03-10
Optical measurement device and optical measurement method
Grant 11,194,047 - Kajii , et al. December 7, 2
2021-12-07
Inclination measuring device
Grant 10,830,587 - Sugiyama , et al. November 10, 2
2020-11-10
Optical measurement device
Grant 10,551,171 - Morino , et al. Fe
2020-02-04
Confocal measurement device
Grant 10,520,296 - Morino , et al. Dec
2019-12-31
Displacement measuring device, measuring system and displacement measuring method
Grant 10,495,448 - Kondo , et al. De
2019-12-03
Optical Measurement Device
App 20190346258 - Morino; Hisayasu ;   et al.
2019-11-14
Displacement measurement device, measurement system, and displacement measurement method
Grant 10,444,360 - Kondo , et al. Oc
2019-10-15
Optical Measurement Device And Optical Measurement Method
App 20190219695 - KAJII; Yosuke ;   et al.
2019-07-18
Confocal Measurement Device
App 20190101375 - MORINO; Hisayasu ;   et al.
2019-04-04
Displacement Measuring Device, Measuring System And Displacement Measuring Method
App 20190094013 - KONDO; Tomonori ;   et al.
2019-03-28
Displacement Measurement Device, Measurement System, And Displacement Measurement Method
App 20190094368 - KONDO; Tomonori ;   et al.
2019-03-28
Inclination Measuring Device
App 20180216933 - SUGIYAMA; Kosuke ;   et al.
2018-08-02
Optical measurement device
Grant 9,995,624 - Morino , et al. June 12, 2
2018-06-12
Optical Measurement Device
App 20170276475 - MORINO; Hisayasu ;   et al.
2017-09-28
Optical Measurement Device
App 20170160130 - MORINO; Hisayasu ;   et al.
2017-06-08
Optical device having polarizer and non-active retarders for spectroscopic polarimetry
Grant 9,645,011 - Okabe , et al. May 9, 2
2017-05-09
Semiconductor Device
App 20130075934 - Oto; Osamu ;   et al.
2013-03-28
Optical Device Having Polarizer And Retarders For Spectroscopic Polarimetry
App 20110080586 - OKABE; HIRSOHI ;   et al.
2011-04-07
Spectroscopic polarimetry
App 20060238759 - Okabe; Hiroshi ;   et al.
2006-10-26
Semiconductor memory device
App 20010028596 - Matoba, Kenichi ;   et al.
2001-10-11

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