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Patent applications and USPTO patent grants for Matney; Kevin Monroe.The latest application filed is for "image contrast in x-ray topography imaging for defect inspection".
Patent | Date |
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Image contrast in X-ray topography imaging for defect inspection Grant 10,816,487 - Matney , et al. October 27, 2 | 2020-10-27 |
Image contrast in X-Ray topography imaging for defect inspection App 20190317028 - Matney; Kevin Monroe ;   et al. | 2019-10-17 |
Fitting of X-ray scattering data using evolutionary algorithms Grant 6,192,103 - Wormington , et al. February 20, 2 | 2001-02-20 |
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