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Patent applications and USPTO patent grants for Massa; John Stephen.The latest application filed is for "film thickness measurement".
Patent | Date |
---|---|
Film Thickness Measurement App 20120088026 - Massa; John Stephen | 2012-04-12 |
Semiconductor device Grant 7,449,723 - Massa , et al. November 11, 2 | 2008-11-11 |
Semiconductor device App 20050062032 - Massa, John Stephen ;   et al. | 2005-03-24 |
Semiconductor substrates and structures Grant 6,818,925 - Massa , et al. November 16, 2 | 2004-11-16 |
Semiconductor substrates and structures App 20030205716 - Massa, John Stephen ;   et al. | 2003-11-06 |
Semiconductor device with current confinement structure App 20030062517 - Ryder, Paul David ;   et al. | 2003-04-03 |
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