loadpatents
name:-0.01235294342041
name:-0.0080389976501465
name:-0.00040102005004883
Mason; Christopher J. Patent Filings

Mason; Christopher J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mason; Christopher J..The latest application filed is for "reticle cleaning by means of sticky surface".

Company Profile
0.6.10
  • Mason; Christopher J. - Newtown CT
  • Mason; Christopher J. - Newton CT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Reticle Cleaning by Means of Sticky Surface
App 20150241797 - Onvlee; Johannes ;   et al.
2015-08-27
Reticle Heater to Keep Reticle Heating Uniform
App 20150212432 - Onvlee; Johannes ;   et al.
2015-07-30
Heating and Cooling Systems in a Lithographic Apparatus
App 20150192856 - Onvlee; Johannes ;   et al.
2015-07-09
Folded Optical Encoder and Applications for Same
App 20100290017 - Mason; Christopher J.
2010-11-18
Method and system for improving focus accuracy in a lithography system
Grant 7,248,336 - Nelson , et al. July 24, 2
2007-07-24
System and method to block unwanted light reflecting from a pattern generating portion from reaching an object
Grant 7,180,573 - Lipson , et al. February 20, 2
2007-02-20
System and method for verifying and controlling the performance of a maskless lithography tool
Grant 7,153,616 - Mason December 26, 2
2006-12-26
System and method to compensate for static and dynamic misalignments and deformations in a maskless lithography tool
Grant 7,102,733 - Latypov , et al. September 5, 2
2006-09-05
Method and system for improving focus accuracy in a lithography system
App 20060187436 - Nelson; Michael L. ;   et al.
2006-08-24
Method and systems for improving focus accuracy in a lithography system
Grant 7,053,984 - Nelson , et al. May 30, 2
2006-05-30
System and method to block unwanted light reflecting from a pattern generating portion from reaching an object
App 20060082745 - Lipson; Matthew ;   et al.
2006-04-20
System and method to compensate for static and dynamic misalignments and deformations in a maskless lithography tool
App 20060033902 - Latypov; Azat M. ;   et al.
2006-02-16
System and method for verifying and controlling the performance of a maskless lithography tool
App 20050219532 - Mason, Christopher J.
2005-10-06
Method and systems for improving focus accuracy in a lithography system
App 20050128456 - Nelson, Michael L. ;   et al.
2005-06-16
Method and system for improving focus accuracy in a lithography system
Grant 6,859,260 - Nelson , et al. February 22, 2
2005-02-22
Method and system for improving focus accuracy in a lithography system
App 20020158185 - Nelson, Michael L. ;   et al.
2002-10-31

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