Masnaghetti; Doug K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Masnaghetti; Doug K..The latest application filed is for "method and system for charged particle microscopy with improved image beam stabilization and interrogation".

Company Profile

9.7.7

Masnaghetti; Doug K. - San Jose CA
- San Jose CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for charged particle microscopy with improved image beam stabilization and interrogation Grant 11,120,969 - Masnaghetti , et al. September 14, 2	2021-09-14
Method and system for focus adjustment of a multi-beam scanning electron microscopy system Grant 10,861,671 - Masnaghetti , et al. December 8, 2	2020-12-08
Method and System for Charged Particle Microscopy with Improved Image Beam Stabilization and Interrogation App 20200227232 - Masnaghetti; Doug K. ; et al.	2020-07-16
Method and system for charged particle microscopy with improved image beam stabilization and interrogation Grant 10,643,819 - Masnaghetti , et al.	2020-05-05
Backscattered electrons (BSE) imaging using multi-beam tools Grant 10,460,905 - McCord , et al. Oc	2019-10-29
Method and system for noise mitigation in a multi-beam scanning electron microscopy system Grant 10,366,862 - Masnaghetti , et al. July 30, 2	2019-07-30
Method and system for focus adjustment of a multi-beam scanning electron microscopy system Grant 10,325,753 - Masnaghetti , et al.	2019-06-18
Method and System for Focus Adjustment of a Multi-Beam Scanning Electron Microscopy System App 20190172675 - Masnaghetti; Doug K. ; et al.	2019-06-06
Multi-beam dark field imaging Grant 10,192,716 - Masnaghetti , et al. Ja	2019-01-29
Method and system for focus adjustment of a multi-beam scanning electron microscopy system Grant 10186396 -	2019-01-22
Method and System for Focus Adjustment of a Multi-Beam Scanning Electron Microscopy System App 20170084424 - Masnaghetti; Doug K. ; et al.	2017-03-23
Multi-Beam Dark Field Imaging App 20170084422 - Masnaghetti; Doug K. ; et al.	2017-03-23
Method and System for Noise Mitigation in a Multi-Beam Scanning Electron Microscopy System App 20170084423 - Masnaghetti; Doug K. ; et al.	2017-03-23
Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools App 20170084421 - McCord; Mark A. ; et al.	2017-03-23
Method and System for Charged Particle Microscopy with Improved Image Beam Stabilization and Interrogation App 20160372304 - Masnaghetti; Doug K. ; et al.	2016-12-22

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