MARUYAMA; Shigenobu

Patent Applications and Registrations

Patent applications and USPTO patent grants for MARUYAMA; Shigenobu.The latest application filed is for "surface measurement method, component manufacturing method, component inspection method, and component measurement device".

Company Profile

1.25.24

MARUYAMA; Shigenobu - Kasumigaura-shi JP
Maruyama; Shigenobu - Oiso JP
Maruyama; Shigenobu - Yokohama JP
Maruyama; Shigenobu - Yokohama-shi JP
Maruyama; Shigenobu - Ebina JP
Maruyama, Shigenobu - Sagamihara JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Surface Measurement Method, Component Manufacturing Method, Component Inspection Method, And Component Measurement Device App 20210270603 - JONG; Jeremy ; et al.	2021-09-02
Defect inspecting method and defect inspecting apparatus Grant 10,254,235 - Nakao , et al.	2019-04-09
Defect Inspecting Method And Defect Inspecting Apparatus App 20180067060 - Nakao; Toshiyuki ; et al.	2018-03-08
Defect inspecting method and defect inspecting apparatus Grant 9,841,384 - Nakao , et al. December 12, 2	2017-12-12
Defect Inspecting Method And Defect Inspecting Apparatus App 20160116421 - Nakao; Toshiyuki ; et al.	2016-04-28
Defect inspecting method and defect inspecting apparatus Grant 9,228,960 - Nakao , et al. January 5, 2	2016-01-05
Defect inspection device and defect inspection method Grant 9,041,921 - Nakao , et al. May 26, 2	2015-05-26
Fault inspection device and fault inspection method Grant 8,804,110 - Urano , et al. August 12, 2	2014-08-12
Defect Inspecting Method and Defect Inspecting Apparatus App 20140125980 - Nakao; Toshiyuki ; et al.	2014-05-08
Inspecting method and inspecting apparatus for substrate surface Grant 8,654,350 - Hamamatsu , et al. February 18, 2	2014-02-18
Defect inspecting method and defect inspecting apparatus Grant 8,638,429 - Nakao , et al. January 28, 2	2014-01-28
Defect inspection device and inspection method Grant 8,599,369 - Urano , et al. December 3, 2	2013-12-03
Flaw inspecting method and device therefor Grant 8,514,388 - Maruyama , et al. August 20, 2	2013-08-20
Fault Inspection Device And Fault Inspection Method App 20130141715 - Urano; Yuta ; et al.	2013-06-06
Inspecting Method and Inspecting Apparatus For Substrate Surface App 20130107247 - Hamamatsu; Akira ; et al.	2013-05-02
Defect Inspection Device And Defect Inspection Method App 20130003052 - Nakao; Toshiyuki ; et al.	2013-01-03
Inspecting method and inspecting apparatus for substrate surface Grant 8,310,665 - Hamamatsu , et al. November 13, 2	2012-11-13
Flaw Inspecting Method And Device Therefor App 20120194807 - Maruyama; Shigenobu ; et al.	2012-08-02
Inspecting Method and Inspecting Apparatus for Substrate Surface App 20120162665 - Hamamatsu; Akira ; et al.	2012-06-28
Defect Inspection Device And Inspection Method App 20120133928 - Urano; Yuta ; et al.	2012-05-31
Defect Inspection Method and Defect Inspection Apparatus App 20120092656 - Nakao; Toshiyuki ; et al.	2012-04-19
Inspecting method and inspecting apparatus for substrate surface Grant 8,144,337 - Hamamatsu , et al. March 27, 2	2012-03-27
Defect Inspecting Method And Defect Inspecting Apparatus App 20120019835 - Nakao; Toshiyuki ; et al.	2012-01-26
Device for changing pitch between light beam axes, and substrate exposure apparatus Grant 8,089,614 - Oshida , et al. January 3, 2	2012-01-03
Adjustable Beam Size Illumination Optical Apparatus and Beam Size Adjusting Method App 20110228537 - YOSHIMIZU; Keiko ; et al.	2011-09-22
Inspecting Method and Inspecting Apparatus for Substrate Surface App 20090290168 - HAMAMATSU; Akira ; et al.	2009-11-26
Scanning probe microscope Grant 7,498,589 - Maruyama , et al. March 3, 2	2009-03-03
Laser Beam Machining Method for Printed Circuit Board App 20080237204 - Ohmae; Goichi ; et al.	2008-10-02
Laser Machining Apparatus App 20080223839 - Maruyama; Shigenobu ; et al.	2008-09-18
Device for Changing Pitch Between Light Beam Axes, and Substrate Exposure Apparatus App 20070279609 - OSHIDA; Yoshitada ; et al.	2007-12-06
Optical communication module Grant 7,215,886 - Maruyama , et al. May 8, 2	2007-05-08
Pattern exposure method and apparatus App 20060215139 - Oshida; Yoshitada ; et al.	2006-09-28
Apparatus and method for determining surface profiles using a scanning probe microscope App 20060097162 - Maruyama; Shigenobu ; et al.	2006-05-11
Illuminating method, exposing method, and device for therefor App 20050219493 - Oshida, Yoshitada ; et al.	2005-10-06
Optical communication module App 20040208211 - Maruyama, Shigenobu ; et al.	2004-10-21
Image display device and its repairing method and apparatus Grant 6,693,699 - Inoue , et al. February 17, 2	2004-02-17
Image display device and its repairing method and apparatus App 20030002008 - Inoue, Takashi ; et al.	2003-01-02
Method and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereof Grant 5,883,437 - Maruyama , et al. March 16, 1	1999-03-16
Method of modifying conductive lines of an electronic circuit board and its apparatus Grant 5,832,595 - Maruyama , et al. November 10, 1	1998-11-10
Laser machining apparatus and method of the same Grant 5,229,569 - Miyauchi , et al. July 20, 1	1993-07-20
Method of cutting interconnection pattern with laser and apparatus thereof Grant 5,208,437 - Miyauchi , et al. May 4, 1	1993-05-04

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