Martin-de-Nicolas; Pedro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Martin-de-Nicolas; Pedro.The latest application filed is for "two pass test case generation using self-modifying instruction replacement".

Company Profile

0.6.7

Martin-de-Nicolas; Pedro - Austin TX US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Two pass test case generation using self-modifying instruction replacement Grant 8,516,229 - Adir , et al. August 20, 2	2013-08-20
Two Pass Test Case Generation Using Self-modifying Instruction Replacement App 20110197049 - Adir; Allon ; et al.	2011-08-11
Method and apparatus for reducing test case generation time in processor testing Grant 7,836,343 - Feng , et al. November 16, 2	2010-11-16
Method and Apparatus for Reducing Test Case Generation Time in Processor Testing App 20090222647 - Feng; Guo H. ; et al.	2009-09-03
System and Method of Multi-Frequency Integrated Circuit Testing App 20080282123 - Meissner; Charles L. ; et al.	2008-11-13
Method and apparatus for determining the failing operation of a device-under-test Grant 7,085,980 - Martin-de-Nicolas , et al. August 1, 2	2006-08-01
Method and apparatus for testing electronic components Grant 6,973,607 - Baier , et al. December 6, 2	2005-12-06
Method and apparatus for test case evaluation using a cyclic redundancy checker Grant 6,941,504 - Berry, Jr. , et al. September 6, 2	2005-09-06
Memory error generating method, apparatus and computer program product App 20040187051 - Berry, Robert Walter JR. ; et al.	2004-09-23
Method and apparatus for determining the failing operation of a device-under-test App 20030208710 - Martin-de-Nicolas, Pedro ; et al.	2003-11-06
Method and apparatus for testing electronic components App 20030101394 - Baier, Heinz ; et al.	2003-05-29
Method and apparatus for test case evaluation using a cyclic redundancy checker App 20030093743 - Berry, Robert Walter JR. ; et al.	2003-05-15

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