Marr; Kenneth W.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Marr; Kenneth W..The latest application filed is for "active protection circuits for semiconductor devices".

Company Profile

3.51.53

Marr; Kenneth W. - Boise ID

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Active Protection Circuits For Semiconductor Devices App 20220165688 - Smith; Michael A. ; et al.	2022-05-26
Semiconductor Device Protection Circuits, And Associated Methods, Devices, And Systems App 20220013160 - Marr; Kenneth W. ; et al.	2022-01-13
Methods Of Forming Circuit-protection Devices App 20210407989 - Smith; Michael A. ; et al.	2021-12-30
Semiconductor device protection circuits for protecting a semiconductor device during processing thereof, and associated methods, devices, and systems Grant 11,158,367 - Marr , et al. October 26, 2	2021-10-26
Semiconductor Device Protection Circuits For Protecting A Semiconductor Device During Processing Therof, And Associated Methods, Devices, And Systems App 20210319827 - Marr; Kenneth W. ; et al.	2021-10-14
Circuit-protection devices Grant 11,139,289 - Smith , et al. October 5, 2	2021-10-05
Memory devices configured to perform leak checks Grant 10,665,307 - Kessenich , et al.	2020-05-26
Methods of forming circuit-protection devices Grant 10,580,766 - Smith , et al.	2020-03-03
Circuit-protection Devices App 20190371790 - Smith; Michael A. ; et al.	2019-12-05
Methods Of Forming Circuit-protection Devices App 20190371789 - Smith; Michael A. ; et al.	2019-12-05
Methods of forming circuit-protection devices Grant 10,431,577 - Smith , et al. O	2019-10-01
Memory Devices Configured To Perform Leak Checks App 20190287634 - Kessenich; Jeffrey A. ; et al.	2019-09-19
Memory devices configured to perform leak checks Grant 10,366,767 - Kessenich , et al. July 30, 2	2019-07-30
Circuit-protection Devices App 20190206856 - Smith; Michael A. ; et al.	2019-07-04
Memory Devices Configured To Perform Leak Checks App 20170352431 - Kessenich; Jeffrey A. ; et al.	2017-12-07
Program operations with embedded leak checks Grant 9,761,322 - Kessenich , et al. September 12, 2	2017-09-12
Apparatuses and methods for die seal crack detection Grant 9,557,376 - Dennison , et al. January 31, 2	2017-01-31
Apparatuses And Methods For Die Seal Crack Detection App 20160195581 - Dennison; Charles H. ; et al.	2016-07-07
Program Operations With Embedded Leak Checks App 20160155513 - Kessenich; Jeffery A. ; et al.	2016-06-02
Apparatuses and methods for die seal crack detection Grant 9,287,184 - Dennison , et al. March 15, 2	2016-03-15
Program operations with embedded leak checks Grant 9,281,078 - Kessenich , et al. March 8, 2	2016-03-08
Program Operations With Embedded Leak Checks App 20150364213 - Kessenich; Jeffrey A. ; et al.	2015-12-17
Apparatuses And Methods For Die Seal Crack Detection App 20150170979 - Dennison; Charles H. ; et al.	2015-06-18
Circuits and methods for repairing defects in memory devices Grant 7,873,882 - Marr January 18, 2	2011-01-18
Circuits and methods for repairing defects in memory devices Grant 7,836,362 - Marr November 16, 2	2010-11-16
Circuits and methods for repairing defects in memory devices Grant 7,437,632 - Marr October 14, 2	2008-10-14
Semiconductor fuses and semiconductor devices containing the same Grant 7,425,472 - Marr September 16, 2	2008-09-16
Gate dielectric antifuse circuit to protect a high-voltage transistor Grant 7,405,463 - Marr , et al. July 29, 2	2008-07-29
Methods, circuits, and applications using a resistor and a Schottky diode Grant 7,369,379 - Marr May 6, 2	2008-05-06
Methods for wafer level burn-in Grant 7,279,918 - Marr October 9, 2	2007-10-09
Semiconductor fuses and methods for fabricating and programming the same App 20070190751 - Marr; Kenneth W.	2007-08-16
Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same App 20070182603 - Marr; Kenneth W.	2007-08-09
Circuits and methods for repairing defects in memory devices App 20070168772 - Marr; Kenneth W.	2007-07-19
Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same App 20070164778 - Marr; Kenneth W.	2007-07-19
Circuits and methods for repairing defects in memory devices App 20070168771 - Marr; Kenneth W.	2007-07-19
Apparatus for determining burn-in reliability from wafer level burn-in Grant 7,215,134 - Marr May 8, 2	2007-05-08
Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same Grant 7,183,792 - Marr February 27, 2	2007-02-27
Methods for wafer level burn-in App 20070018677 - Marr; Kenneth W.	2007-01-25
Test circuitry and testing methods App 20070019480 - Conner; Dustin L. ; et al.	2007-01-25
Circuits and methods to protect a gate dielectric antifuse Grant 7,126,871 - Marr , et al. October 24, 2	2006-10-24
Gate Dielectric Antifuse Circuit To Protect A High-voltage Transistor App 20060231922 - Marr; Kenneth W. ; et al.	2006-10-19
Methods, apparatus and systems for wafer-level burn-in stressing of semiconductor devices Grant 7,123,042 - Marr October 17, 2	2006-10-17
Methods for wafer level burn-in Grant 7,119,568 - Marr October 10, 2	2006-10-10
Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same App 20060208758 - Marr; Kenneth W.	2006-09-21
Methods, circuits, and applications using a resistor and a Schottky diode App 20060198070 - Marr; Kenneth W.	2006-09-07
Gate dielectric antifuse circuit to protect a high-voltage transistor Grant 7,101,738 - Marr , et al. September 5, 2	2006-09-05
Methods, circuits, and applications using a resistor and a Schottky diode Grant 7,075,763 - Marr July 11, 2	2006-07-11
Antifuse structure and method of use Grant 7,071,534 - Marr , et al. July 4, 2	2006-07-04
Gate dielectric antifuse circuits and methods for operating same App 20060097345 - Marr; Kenneth W.	2006-05-11
Method and apparatus for determining burn-in reliability from wafer level burn-in Grant 7,038,481 - Marr May 2, 2	2006-05-02
Gate dielectric antifuse circuits and methods for operating same Grant 7,030,458 - Marr April 18, 2	2006-04-18
Methods for fabricating fuses for use in semiconductor devices and semiconductor devices including such fuses Grant 6,979,601 - Marr , et al. December 27, 2	2005-12-27
Apparatus for determining burn-in reliability from wafer level burn-in App 20050218918 - Marr, Kenneth W.	2005-10-06
Method, circuit and system for determining burn-in reliability from wafer level burn-in Grant 6,943,575 - Marr September 13, 2	2005-09-13
Gate dielectric antifuse circuit to protect a high-voltage transistor Grant 6,936,909 - Marr , et al. August 30, 2	2005-08-30
Method, circuit and system for determining burn-in reliability from wafer level burn-in App 20050174138 - Marr, Kenneth W.	2005-08-11
Methods, apparatus and systems for wafer-level burn-in stressing of semiconductor devices App 20050156618 - Marr, Kenneth W.	2005-07-21
Semiconductor fuses and semiconductor devices containing the same App 20050158919 - Marr, Kenneth W.	2005-07-21
Electrostatic discharge protection device Grant 6,914,306 - Marr July 5, 2	2005-07-05
Apparatus for determining burn-in reliability from wafer level burn-in Grant 6,894,526 - Marr May 17, 2	2005-05-17
Fuse for use in a semiconductor device, and semiconductor devices including the fuse Grant 6,879,018 - Marr , et al. April 12, 2	2005-04-12
Method for wafer-level burn-in stressing of semiconductor devices and semiconductor device substrates configured to effect the method Grant 6,867,612 - Marr March 15, 2	2005-03-15
Gate dielectric antifuse circuit to protect a high-voltage transistor App 20050029598 - Marr, Kenneth W. ; et al.	2005-02-10
Antifuse structure and method of use App 20050029622 - Marr, Kenneth W. ; et al.	2005-02-10
Apparatus for determining burn-in reliability from wafer level burn-in App 20050018499 - Marr, Kenneth W.	2005-01-27
Circuits and methods for repairing defects in memory devices App 20050015654 - Marr, Kenneth W.	2005-01-20
Antifuse structure and method of use Grant 6,836,000 - Marr , et al. December 28, 2	2004-12-28
SRAM array with temperature-compensated threshold voltage Grant 6,809,968 - Marr , et al. October 26, 2	2004-10-26
Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same App 20040199841 - Marr, Kenneth W.	2004-10-07
Method and apparatus for determining burn-in reliability from wafer level burn-in App 20040180455 - Marr, Kenneth W.	2004-09-16
Circuits and methods to protect a gate dielectric antifuse App 20040155315 - Marr, Kenneth W. ; et al.	2004-08-12
Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clamp Grant 6,768,617 - Marr July 27, 2	2004-07-27
Circuits and method to protect a gate dielectric antifuse Grant 6,751,150 - Marr , et al. June 15, 2	2004-06-15
Methods, circuits, and applications using a resistor and a schottky diode App 20040085093 - Marr, Kenneth W.	2004-05-06
Gate dielectric antifuse circuits and methods for operating same App 20040065941 - Marr, Kenneth W.	2004-04-08
Gate dielectric antifuse circuit to protect a high-voltage transistor App 20040041167 - Marr, Kenneth W. ; et al.	2004-03-04
Circuits And Methods To Protect A Gate Dielectric Antifuse App 20040042317 - Marr, Kenneth W. ; et al.	2004-03-04
Semiconductor fuses, semiconductor devices containing the same, and methods of making and using the same App 20040038458 - Marr, Kenneth W.	2004-02-26
Method for wafer-level burn-in stressing of semiconductor devices and semiconductor device substrates configured to effect the method App 20040032277 - Marr, Kenneth W.	2004-02-19
Method, circuit and system for determining burn-in reliability from wafer level burn-in App 20040019838 - Marr, Kenneth W.	2004-01-29
Fuse for use in a semiconductor device, and semiconductor devices including the fuse App 20030211661 - Marr, Kenneth W. ; et al.	2003-11-13
Gate dielectric antifuse circuits and methods for operating same Grant 6,630,724 - Marr October 7, 2	2003-10-07
SRAM array with temperature-compensated threshold voltage App 20030151956 - Marr, Kenneth W. ; et al.	2003-08-14
Memory circuit regulation system and method Grant 6,584,030 - Marr June 24, 2	2003-06-24
Fuse for use in a semiconductor device, and semiconductor devices including the fuse App 20030102520 - Marr, Kenneth W. ; et al.	2003-06-05
Fuse for use in a semiconductor device, and semiconductor devices including the fuse Grant 6,551,864 - Marr , et al. April 22, 2	2003-04-22
Sram Array With Temperature-compensated Threshold Voltage App 20030043640 - Marr, Kenneth W. ; et al.	2003-03-06
Memory Circuit Regulation System And Method App 20030043677 - Marr, Kenneth W.	2003-03-06
SRAM array with temperature-compensated threshold voltage Grant 6,529,421 - Marr , et al. March 4, 2	2003-03-04
Method of anti-fuse repair Grant 6,515,931 - Marr , et al. February 4, 2	2003-02-04
Electrostatic discharge protection device App 20020195664 - Marr, Kenneth W.	2002-12-26
Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clamp App 20020109950 - Marr, Kenneth W.	2002-08-15
Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clamp Grant 6,430,016 - Marr August 6, 2	2002-08-06
Fuse for use in a semiconductor device, and semiconductor devices including the fuse App 20020102755 - Marr, Kenneth W. ; et al.	2002-08-01
Fuse for use in a semiconductor device, and semiconductor devices including the fuse App 20020005564 - Marr, Kenneth W. ; et al.	2002-01-17
Fuse for use in a semiconductor device Grant 6,323,534 - Marr , et al. November 27, 2	2001-11-27
Method of anti-fuse repair App 20010026494 - Marr, Kenneth W. ; et al.	2001-10-04
Fuse for use in a semiconductor device, and semiconductor devices including the fuse App 20010002322 - Marr, Kenneth W. ; et al.	2001-05-31
Circuit for SRAM test mode isolated bitline modulation Grant 6,081,464 - Marr June 27, 2	2000-06-27
Method and apparatus for embedded read only memory in static random access memory Grant 6,041,008 - Marr March 21, 2	2000-03-21
Method of anti-fuse repair Grant 5,978,248 - Marr , et al. November 2, 1	1999-11-02
Circuit for SRAM test mode isolated bitline modulation Grant 5,745,415 - Marr April 28, 1	1998-04-28
Method of anti-fuse repair Grant 5,742,555 - Marr , et al. April 21, 1	1998-04-21
Circuit for SRAM test mode isolated bitline modulation Grant 5,568,435 - Marr October 22, 1	1996-10-22

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