Marquart; Todd
Patent Applications and Registrations
Patent applications and USPTO patent grants for Marquart; Todd.The latest application filed is for "performing asynchronous scan operations across memory subsystems".
- Marquart; Todd - Boise ID
| Patent | Date |
|---|---|
| Performing Asynchronous Scan Operations Across Memory Subsystems App 20210216235 - Brandt; Kevin R. ; et al. | 2021-07-15 |
| Determining system lifetime characteristics Grant 9,269,452 - Marquart February 23, 2 | 2016-02-23 |
| Resting blocks of memory cells in response to the blocks being deemed to fail Grant 9,183,070 - Marquart , et al. November 10, 2 | 2015-11-10 |
| Resting Blocks Of Memory Cells In Response To The Blocks Being Deemed To Fail App 20150033087 - Marquart; Todd ; et al. | 2015-01-29 |
| Determining System Lifetime Characteristics App 20140362647 - Marquart; Todd | 2014-12-11 |
| Determining system lifetime characteristics Grant 8,804,428 - Marquart August 12, 2 | 2014-08-12 |
| Lifetime Markers For Memory Devices App 20130083606 - Marquart; Todd | 2013-04-04 |
| Determining System Lifetime Characteristics App 20130044546 - Marquart; Todd | 2013-02-21 |
| Lifetime markers for memory devices Grant 8,320,185 - Marquart November 27, 2 | 2012-11-27 |
| Dynamic soft program trims Grant 8,199,585 - Marquart June 12, 2 | 2012-06-12 |
| Lifetime Markers For Memory Devices App 20110242901 - Marquart; Todd | 2011-10-06 |
| Reducing effects of program disturb in a memory device Grant 8,023,329 - Aritome , et al. September 20, 2 | 2011-09-20 |
| Dynamic Soft Program Trims App 20110182122 - Marquart; Todd | 2011-07-28 |
| Program-verify method Grant 7,952,936 - Mihnea , et al. May 31, 2 | 2011-05-31 |
| Dynamic soft program trims Grant 7,920,427 - Marquart April 5, 2 | 2011-04-05 |
| Dynamic Soft Program Trims App 20100208523 - Marquart; Todd | 2010-08-19 |
| Reducing Effects Of Program Disturb In A Memory Device App 20100202210 - Aritome; Seiichi ; et al. | 2010-08-12 |
| Reducing effects of program disturb in a memory device Grant 7,715,234 - Aritome , et al. May 11, 2 | 2010-05-11 |
| Program-verify Method App 20100046303 - Mihnea; Andrei ; et al. | 2010-02-25 |
| Program-verify method with different read and verify pass-through voltages Grant 7,619,931 - Mihnea , et al. November 17, 2 | 2009-11-17 |
| Programming method for NAND EEPROM Grant 7,499,330 - Goda , et al. March 3, 2 | 2009-03-03 |
| Program-verify method App 20090003078 - Mihnea; Andrei ; et al. | 2009-01-01 |
| Reducing Effects Of Program Disturb In A Memory Device App 20080291730 - Aritome; Seiichi ; et al. | 2008-11-27 |
| Minimizing effects of program disturb in a memory device Grant 7,408,810 - Aritome , et al. August 5, 2 | 2008-08-05 |
| Programming method for NAND EEPROM App 20080008006 - Goda; Akira ; et al. | 2008-01-10 |
| Programming method for NAND EEPROM Grant 7,292,476 - Goda , et al. November 6, 2 | 2007-11-06 |
| Minimizing effects of program disturb in a memory device App 20070195603 - Aritome; Seiichi ; et al. | 2007-08-23 |
| Programming method for NAND EEPROM App 20070047314 - Goda; Akira ; et al. | 2007-03-01 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 