Markwort; Lars
Patent Applications and Registrations
Patent applications and USPTO patent grants for Markwort; Lars.The latest application filed is for "ion sources, systems and methods".
- Markwort; Lars - Haimhausen N/A DE
- Markwort; Lars - Muehltal DE
- Markwort; Lars - Saratoga CA
| Patent | Date |
|---|---|
| Methods and systems for inspecting bonded wafers Grant 9,355,919 - Estermann , et al. May 31, 2 | 2016-05-31 |
| Ion sources, systems and methods Grant 9,236,225 - Ward , et al. January 12, 2 | 2016-01-12 |
| Semiconductor wafer inspection system and method Grant 9,182,357 - Markwort , et al. November 10, 2 | 2015-11-10 |
| Ion Sources, Systems And Methods App 20150213997 - Ward; Billy W. ; et al. | 2015-07-30 |
| Ion sources, systems and methods Grant 9,012,867 - Ward , et al. April 21, 2 | 2015-04-21 |
| Ion Sources, Systems And Methods App 20140306121 - Ward; Billy W. ; et al. | 2014-10-16 |
| Method of inspecting and processing semiconductor wafers Grant 8,778,702 - Markwort , et al. July 15, 2 | 2014-07-15 |
| Ion sources, systems and methods Grant 8,748,845 - Ward , et al. June 10, 2 | 2014-06-10 |
| Methods of inspecting and manufacturing semiconductor wafers Grant 8,501,503 - Markwort , et al. August 6, 2 | 2013-08-06 |
| Methods And Systems For Inspecting Bonded Wafers App 20130157391 - Estermann; Markus ; et al. | 2013-06-20 |
| Methods of processing and inspecting semiconductor substrates Grant 8,460,946 - Markwort , et al. June 11, 2 | 2013-06-11 |
| Optical inspection system and method Grant 8,368,881 - Markwort , et al. February 5, 2 | 2013-02-05 |
| Optical inspection system and method Grant 8,345,232 - Markwort , et al. January 1, 2 | 2013-01-01 |
| Methods Of Inspecting And Manufacturing Semiconductor Wafers App 20120276664 - Markwort; Lars ; et al. | 2012-11-01 |
| Semiconductor Wafer Inspection System And Method App 20120268585 - Markwort; Lars ; et al. | 2012-10-25 |
| Method Of Inspecting And Processing Semiconductor Wafers App 20120142122 - Markwort; Lars ; et al. | 2012-06-07 |
| Ion Sources, Systems And Methods App 20120141693 - Ward; Billy W. ; et al. | 2012-06-07 |
| Optical Inspection System And Method App 20120133760 - Markwort; Lars ; et al. | 2012-05-31 |
| Methods Of Processing And Inspecting Semiconductor Substrates App 20120094401 - Markwort; Lars ; et al. | 2012-04-19 |
| Ion sources, systems and methods Grant 8,110,814 - Ward , et al. February 7, 2 | 2012-02-07 |
| Optical inspection system and method Grant 8,102,521 - Markwort , et al. January 24, 2 | 2012-01-24 |
| Optical inspection system and method Grant 8,072,591 - Markwort , et al. December 6, 2 | 2011-12-06 |
| Optical Inpsection System And Method App 20110043796 - Markwort; Lars ; et al. | 2011-02-24 |
| Optical Inspection System And Method App 20110043798 - Markwort; Lars ; et al. | 2011-02-24 |
| Optical Inspection System And Method App 20100231902 - Markwort; Lars ; et al. | 2010-09-16 |
| Ion Sources, Systems And Methods App 20090179161 - WARD; BILLY W. ; et al. | 2009-07-16 |
| Ion sources, systems and methods Grant 7,557,360 - Ward , et al. July 7, 2 | 2009-07-07 |
| Ion sources, systems and methods Grant 7,488,952 - Ward , et al. February 10, 2 | 2009-02-10 |
| Ion sources, systems and methods Grant 7,485,873 - Ward , et al. February 3, 2 | 2009-02-03 |
| Ion sources, systems and methods App 20070210250 - Ward; Billy W. ; et al. | 2007-09-13 |
| Ion sources, systems and methods App 20070194226 - Ward; Billy W. ; et al. | 2007-08-23 |
| Ion sources, systems and methods App 20070194251 - Ward; Billy W. ; et al. | 2007-08-23 |
| Pulsed spectroscopy with spatially variable polarization modulation element Grant 7,064,828 - Rovira , et al. June 20, 2 | 2006-06-20 |
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