loadpatents
name:-0.0083250999450684
name:-0.0065171718597412
name:-0.0014700889587402
Marinskiy; Dmitriy Patent Filings

Marinskiy; Dmitriy

Patent Applications and Registrations

Patent applications and USPTO patent grants for Marinskiy; Dmitriy.The latest application filed is for "charge metrology for integrated measurement".

Company Profile
1.7.8
  • Marinskiy; Dmitriy - Tampa FL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Non-contact method to monitor and quantify effective work function of metals
Grant 10,763,179 - Marinskiy , et al. Sep
2020-09-01
Charge Metrology for Integrated Measurement
App 20180315630 - Marinskiy; Dmitriy ;   et al.
2018-11-01
Non-contact Method To Monitor And Quantify Effective Work Function Of Metals
App 20160252565 - Marinskiy; Dmitriy ;   et al.
2016-09-01
Photovoltaic device
Grant 9,246,330 - Buller , et al. January 26, 2
2016-01-26
High speed spectrometer
Grant 8,798,961 - Johnson , et al. August 5, 2
2014-08-05
Mounting Clamp And Mounting Clamp Configuration For Photovoltaic Module Installation
App 20130200234 - Zhao; Zhibo ;   et al.
2013-08-08
Mitigating Photovoltaic Module Stress Damage Through Cell Isolation
App 20130186453 - Zhao; Zhibo ;   et al.
2013-07-25
Photovoltaic Device
App 20120280567 - Buller; Benyamin ;   et al.
2012-11-08
High Speed Spectrometer
App 20120053899 - Johnson; Brady A. ;   et al.
2012-03-01
Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration
Grant 7,405,580 - Marinskiy July 29, 2
2008-07-29
Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers
Grant 7,202,691 - Lagowski , et al. April 10, 2
2007-04-10
Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers
App 20060267622 - Lagowski; Jacek ;   et al.
2006-11-30
Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration
App 20060208256 - Marinskiy; Dmitriy
2006-09-21

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed