Mardi; Mohsen Hossein

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mardi; Mohsen Hossein.The latest application filed is for "semiconductor component having test pads and method and apparatus for testing same".

Company Profile

0.16.3

Mardi; Mohsen Hossein - Saratoga CA US
Mardi; Mohsen Hossein - Fremont CA
Mardi; Mohsen Hossein - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and apparatus for testing of integrated circuits Grant 8,542,029 - Mardi September 24, 2	2013-09-24
Methods and apparatus for testing of integrated circuits Grant 8,269,519 - Mardi September 18, 2	2012-09-18
Socket for an integrated circuit and a method of providing a connection in a socket Grant 7,837,481 - Mahoney , et al. November 23, 2	2010-11-23
Semiconductor component having test pads and method and apparatus for testing same Grant 7,737,439 - Mardi , et al. June 15, 2	2010-06-15
Probe card head protection device for wafer sort set up Grant 7,598,727 - Dang , et al. October 6, 2	2009-10-06
Probe card configured for interchangeable heads Grant 7,535,239 - Dang , et al. May 19, 2	2009-05-19
Octal/quad site docking compatibility for package test handler Grant 7,352,197 - Mardi , et al. April 1, 2	2008-04-01
Methods for standardizing a test head assembly Grant 7,285,973 - Mardi , et al. October 23, 2	2007-10-23
Semiconductor component having test pads and method and apparatus for testing same App 20070221920 - Mardi; Mohsen Hossein ; et al.	2007-09-27
Semiconductor component having test pads and method and apparatus for testing same App 20070218573 - Mardi; Mohsen Hossein ; et al.	2007-09-20
Semiconductor component having test pads and method and apparatus for testing same Grant 7,235,412 - Mardi , et al. June 26, 2	2007-06-26
Multi-pitch test probe assembly for testing semiconductor dies having contact pads Grant 7,180,318 - Mahoney , et al. February 20, 2	2007-02-20
Seals used for testing on an integrated circuit tester Grant 7,138,811 - Mahoney , et al. November 21, 2	2006-11-21
Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins Grant 7,083,428 - Mahoney , et al. August 1, 2	2006-08-01
Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins Grant 6,958,616 - Mahoney , et al. October 25, 2	2005-10-25
Multi-socket board for open/short tester Grant 6,891,384 - Mardi , et al. May 10, 2	2005-05-10
Testing of conducting paths using a high speed I/O test package Grant 6,809,524 - Sadler , et al. October 26, 2	2004-10-26
Multi-socket Board For Open/short Tester App 20040017216 - Mardi, Mohsen Hossein ; et al.	2004-01-29

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