Mani; Antonio
Patent Applications and Registrations
Patent applications and USPTO patent grants for Mani; Antonio.The latest application filed is for "measurement of overlay error using device inspection system".
- Mani; Antonio - Leuven BE
| Patent | Date |
|---|---|
| Measurement of Overlay Error Using Device Inspection System App 20210159128 - Hoo; Choon Hoong ; et al. | 2021-05-27 |
| Measurement of overlay error using device inspection system Grant 10,943,838 - Hoo , et al. March 9, 2 | 2021-03-09 |
| Identifying nuisances and defects of interest in defects detected on a wafer Grant 10,699,926 - Plihal , et al. | 2020-06-30 |
| Metrology guided inspection sample shaping of optical inspection results Grant 10,598,617 - Sah , et al. | 2020-03-24 |
| Measurement of Overlay Error Using Device Inspection System App 20190252270 - Hoo; Choon Hoong ; et al. | 2019-08-15 |
| Identifying Nuisances and Defects of Interest in Defects Detected on a Wafer App 20190067060 - Plihal; Martin ; et al. | 2019-02-28 |
| Metrology Guided Inspection Sample Shaping of Optical Inspection Results App 20180321168 - Sah; Kaushik ; et al. | 2018-11-08 |
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