Mangnus; Albertus Victor Gerardus

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mangnus; Albertus Victor Gerardus.The latest application filed is for "method and apparatus for forming a patterned layer of material".

Company Profile

2.2.10

Mangnus; Albertus Victor Gerardus - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection tool, inspection method and computer program product Grant 11,442,368 - Quintanilha , et al. September 13, 2	2022-09-13
Method And Apparatus For Forming A Patterned Layer Of Material App 20220213593 - DRUZHININA; Tamara ; et al.	2022-07-07
Systems And Methods For Image Enhancement For A Multi-beam Charged-particle Inspection System App 20220199358 - GOOSEN; Maikel Robert ; et al.	2022-06-23
Charged Particle Optical Device, Objective Lens Assembly, Detector, Detector Array, And Methods App 20220196581 - WIELAND; Marco Jan-Jaco ; et al.	2022-06-23
Apparatus For And Method Of Local Control Of A Charged Particle Beam App 20220199355 - MANGNUS; Albertus Victor Gerardus ; et al.	2022-06-23
Apparatus For And Method Of Controlling An Energy Spread Of A Charged-particle Beam App 20220148842 - HASAN; Shakeeb Bin ; et al.	2022-05-12
Inspection tool, lithographic apparatus, electron beam source and an inspection method Grant 11,243,179 - Smakman , et al. February 8, 2	2022-02-08
Electron Beam Apparatus, Inspection Tool And Inspection Method App 20210249224 - SMAKMAN; Erwin Paul ; et al.	2021-08-12
Inspection Tool, Inspection Method And Computer Program Product App 20210232052 - QUINTANILHA; Richard ; et al.	2021-07-29
Inspection System, Lithographic Apparatus, And Inspection Method App 20210055660 - POLYAKOV; Alexey Olegovich ; et al.	2021-02-25
Aperture Array With Integrated Current Measurement App 20200312619 - MANGNUS; Albertus Victor Gerardus ; et al.	2020-10-01
Inspection Tool, Lithographic Apparatus, Electron Beam Source And An Inspection Method App 20200249181 - Kind Code	2020-08-06

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