loadpatents
name:-0.01441216468811
name:-0.014809131622314
name:-0.0090200901031494
Manger; Matthias Patent Filings

Manger; Matthias

Patent Applications and Registrations

Patent applications and USPTO patent grants for Manger; Matthias.The latest application filed is for "device and method for measuring the beam angle of a light beam guided by a beam guiding optical unit".

Company Profile
8.25.24
  • Manger; Matthias - Aalen DE
  • Manger; Matthias - Aalen-Unterkochen DE
  • Manger; Matthias - Furth DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for producing a reflecting optical element of a projection exposure apparatus and reflecting optical element for a projection exposure apparatus, projection lens and projection exposure apparatus
Grant 11,415,892 - Kaes , et al. August 16, 2
2022-08-16
Measuring assembly for the frequency-based determination of the position of a component
Grant 11,274,914 - Manger , et al. March 15, 2
2022-03-15
Beam propagation camera and method for light beam analysis
Grant 11,099,400 - Manger August 24, 2
2021-08-24
Device And Method For Measuring The Beam Angle Of A Light Beam Guided By A Beam Guiding Optical Unit
App 20210219409 - Baumer; Florian ;   et al.
2021-07-15
Method and device for beam analysis
Grant 11,054,305 - Manger , et al. July 6, 2
2021-07-06
Method for producing an illumination system for an EUV projection exposure system, and illumination system
Grant 11,048,172 - Baier , et al. June 29, 2
2021-06-29
Metrology System And Method For Measuring An Excitation Laser Beam In An Euv Plasma Source
App 20210190583 - Manger; Matthias ;   et al.
2021-06-24
Method For Producing A Reflecting Optical Element Of A Projection Exposure Apparatus And Reflecting Optical Element For A Projection Exposure Apparatus, Projection Lens And Projection Exposure Apparatus
App 20210157244 - KAES; Matthias ;   et al.
2021-05-27
Electrical junction box for motor diagnosis
Grant D914,612 - Andersson , et al. March 30, 2
2021-03-30
Measuring Assembly For The Frequency-based Determination Of The Position Of A Component
App 20210080244 - MANGER; Matthias ;   et al.
2021-03-18
Method For Producing An Illumination System For An Euv Projection Exposure System, And Illumination System
App 20200110340 - Baier; Juergen ;   et al.
2020-04-09
Method and device for beam analysis
Grant 10,605,654 - Manger , et al.
2020-03-31
Method And Device For Beam Analysis
App 20200088571 - Manger; Matthias ;   et al.
2020-03-19
Method for producing an illumination system for an EUV projection exposure system, and illumination system
Grant 10,514,608 - Baier , et al. Dec
2019-12-24
Electrical junction box for motor diagnosis
Grant D863,226 - Andersson , et al. Oc
2019-10-15
Method For Producing An Illumination System For An Euv Projection Exposure System, And Illumination System
App 20180373158 - Baier; Juergen ;   et al.
2018-12-27
Method And Device For Beam Analysis
App 20180202860 - Manger; Matthias ;   et al.
2018-07-19
Projection Exposure System For Microlithography And Method Of Monitoring A Lateral Imaging Stability
App 20180039184 - MANGER; Matthias ;   et al.
2018-02-08
System and method for analyzing a light beam guided by a beam guiding optical unit
Grant 9,823,119 - Manger , et al. November 21, 2
2017-11-21
Projection exposure system for microlithography and method of monitoring a lateral imaging stability
Grant 9,720,328 - Manger , et al. August 1, 2
2017-08-01
System And Method For Analyzing A Light Beam Guided By A Beam Guiding Optical Unit
App 20170122803 - MANGER; Matthias ;   et al.
2017-05-04
Measuring Arrangement For Use When Determining Trajectories Of Flying Objects
App 20160350935 - MANGER; Matthias
2016-12-01
Beam Propagation Camera And Method For Light Beam Analysis
App 20160341969 - MANGER; Matthias
2016-11-24
Projection Exposure System For Microlithography And Method Of Monitoring A Lateral Imaging Stability
App 20160266501 - MANGER; Matthias ;   et al.
2016-09-15
Projection exposure system for microlithography and method of monitoring a lateral imaging stability
Grant 9,235,142 - Manger , et al. January 12, 2
2016-01-12
Method for measuring an optical system
Grant 8,786,849 - Korb , et al. July 22, 2
2014-07-22
Method Of Measuring A Shape Of An Optical Surface Based On Computationally Combined Surface Region Measurements And Interferometric Measuring Device
App 20140078513 - FREIMANN; Rolf ;   et al.
2014-03-20
Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring device
Grant 8,593,642 - Freimann , et al. November 26, 2
2013-11-26
Method For Measuring An Optical System
App 20130271749 - KORB; Thomas ;   et al.
2013-10-17
Method for calibrating a specimen stage of a metrology system and metrology system comprising a specimen stage
Grant 8,473,237 - Huebel , et al. June 25, 2
2013-06-25
Optical system for microlithography
Grant 8,456,616 - Kraehmer , et al. June 4, 2
2013-06-04
Method for determination of residual errors
Grant 8,416,412 - Schellhorn , et al. April 9, 2
2013-04-09
Method Of Measuring A Shape Of An Optical Surface And Interferometric Measuring Device
App 20120229814 - FREIMANN; Rolf ;   et al.
2012-09-13
Projection Exposure System For Microlithography And Method Of Monitoring A Lateral Imaging Stability
App 20110157571 - Manger; Matthias ;   et al.
2011-06-30
Optical System For Microlithography
App 20110069295 - Kraehmer; Daniel ;   et al.
2011-03-24
Method For Calibrating A Specimen Stage Of A Metrology System And Metrology System Comprising A Specimen Stage
App 20100241384 - Huebel; Alexander ;   et al.
2010-09-23
Method and apparatus for determining at least one optical property of an imaging optical system
Grant 7,760,345 - Manger , et al. July 20, 2
2010-07-20
Device and method for range-resolved determination of scattered light, and an illumination mask
Grant 7,755,748 - Arnz , et al. July 13, 2
2010-07-13
Apparatus And Method For Measuring The Positions Of Marks On A Mask
App 20100153059 - Klose; Gerd ;   et al.
2010-06-17
Method For Determination Of Residual Errors
App 20100097608 - Schellhorn; Uwe ;   et al.
2010-04-22
Device And Method For Range-resolved Determination Of Scattered Light, And An Illumination Mask
App 20080285018 - Arnz; Michael ;   et al.
2008-11-20
Method And Apparatus For Determining At Least One Optical Property Of An Imaging Optical System
App 20080204729 - Manger; Matthias ;   et al.
2008-08-28
Device for the range-resolved determination of scattered light, operating method, illumination mask and image-field mask
Grant 7,408,631 - Arnz , et al. August 5, 2
2008-08-05
Device for the range-resolved determination of scattered light, operating method, illumination mask and image-field mask
App 20050264819 - Arnz, Michael ;   et al.
2005-12-01

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed