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Patent applications and USPTO patent grants for MANABE; Takahiro.The latest application filed is for "inspection terminal device, inspection device, inspection system, and inspection program".
Patent | Date |
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Inspection Terminal Device, Inspection Device, Inspection System, And Inspection Program App 20210279854 - SHIOMI; Yasutomo ;   et al. | 2021-09-09 |
Plaque region extracting method and apparatus therefor Grant 8,649,582 - Manabe , et al. February 11, 2 | 2014-02-11 |
Medical image processor and medical image processing method Grant 8,437,520 - Manabe , et al. May 7, 2 | 2013-05-07 |
Plaque Region Extracting Method And Apparatus Therefor App 20120243760 - Manabe; Takahiro ;   et al. | 2012-09-27 |
Method for scaling scattered ray intensity distribution in multi bulbs X-ray CT and multi bulbs X-ray CT apparatus Grant 7,957,502 - Manabe , et al. June 7, 2 | 2011-06-07 |
Sensor provided with adjusting function Grant RE41,847 - Nakagaki , et al. October 19, 2 | 2010-10-19 |
Medical Image Processor And Medical Image Processing Method App 20100092053 - Manabe; Takahiro ;   et al. | 2010-04-15 |
Method For Scaling Scattered Ray Intensity Distribution In Multi Bulbs X-ray Ct And Multi Bulbs X-ray Ct Apparatus App 20090092221 - MANABE; Takahiro ;   et al. | 2009-04-09 |
Angular rate detecting device Grant 5,239,868 - Takenaka , et al. * August 31, 1 | 1993-08-31 |
Angular rate detecting device Grant 5,038,613 - Takenaka , et al. August 13, 1 | 1991-08-13 |
Angular rate sensor Grant 5,014,554 - Terada , et al. May 14, 1 | 1991-05-14 |
Electronic circuit apparatus Grant 4,858,071 - Manabe , et al. August 15, 1 | 1989-08-15 |
Electronic circuit module Grant 4,843,520 - Nakatani , et al. June 27, 1 | 1989-06-27 |
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