loadpatents
name:-0.021130084991455
name:-0.024375200271606
name:-0.010496139526367
Maleev; Ivan Patent Filings

Maleev; Ivan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Maleev; Ivan.The latest application filed is for "optical sensor for inspecting pattern collapse defects".

Company Profile
5.18.19
  • Maleev; Ivan - Pleasanton CA
  • Maleev; Ivan - Fremont CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System, method and apparatus for polarization control
Grant 11,415,725 - Maleev , et al. August 16, 2
2022-08-16
Apparatus and method for monitoring and measuring properties of polymers in solutions
Grant 11,385,154 - Maleev , et al. July 12, 2
2022-07-12
Method and Apparatus for Inspecting Pattern Collapse Defects
App 20220138921 - LU; Shin-Yee ;   et al.
2022-05-05
Optical Sensor for Inspecting Pattern Collapse Defects
App 20220139743 - MALEEV; Ivan ;   et al.
2022-05-05
Apparatus And Method For Monitoring And Measuring Properties Of Polymers In Solutions
App 20220099545 - MALEEV; Ivan ;   et al.
2022-03-31
System, Method And Apparatus For Polarization Control
App 20210173122 - Maleev; Ivan ;   et al.
2021-06-10
System, method and apparatus for polarization control
Grant 10,921,488 - Maleev , et al. February 16, 2
2021-02-16
Optical sensor for phase determination
Grant 10,837,902 - Maleev , et al. November 17, 2
2020-11-17
Systems and methods for biomechanically-based eye signals for interacting with real and virtual objects
Grant 10,564,714 - Marggraff , et al. Feb
2020-02-18
Wafer inspection
Grant 10,488,348 - Romanovsky , et al. Nov
2019-11-26
Optical Sensor For Phase Determination
App 20190056320 - MALEEV; Ivan ;   et al.
2019-02-21
System, Method and Apparatus For Polarization Control
App 20180292574 - Maleev; Ivan ;   et al.
2018-10-11
Wafer Inspection
App 20180164228 - Romanovsky; Anatoly ;   et al.
2018-06-14
System, method and apparatus for polarization control
Grant 9,995,850 - Maleev , et al. June 12, 2
2018-06-12
Wafer inspection
Grant 9,915,622 - Romanovsky , et al. March 13, 2
2018-03-13
TDI sensor in a darkfield system
Grant 9,891,177 - Vazhaeparambil , et al. February 13, 2
2018-02-13
Systems And Methods For Biomechanically-based Eye Signals For Interacting With Real And Virtual Objects
App 20180011533 - Marggraff; Lewis James ;   et al.
2018-01-11
Systems And Methods For Biomechanically-based Eye Signals For Interacting With Real And Virtual Objects
App 20170123492 - Marggraff; Lewis James ;   et al.
2017-05-04
Multi-spot illumination for improved detection sensitivity
Grant 9,494,531 - Chuang , et al. November 15, 2
2016-11-15
Wafer edge detection and inspection
Grant 9,377,416 - Maleev , et al. June 28, 2
2016-06-28
TDI Sensor in a Darkfield System
App 20160097727 - Vazhaeparambil; Jijen ;   et al.
2016-04-07
Wafer inspection
Grant 9,279,774 - Romanovsky , et al. March 8, 2
2016-03-08
Wafer Inspection
App 20150369753 - Romanovsky; Anatoly ;   et al.
2015-12-24
Wafer Edge Detection and Inspection
App 20150330914 - Maleev; Ivan ;   et al.
2015-11-19
Optical surface scanning systems and methods
Grant 9,182,341 - Maleev November 10, 2
2015-11-10
Transmissive-reflective photocathode
Grant 9,076,639 - Maleev July 7, 2
2015-07-07
Multi-Spot Illumination For Improved Detection Sensitivity
App 20150041666 - Chuang; Yung-Ho Alex ;   et al.
2015-02-12
System, Method and Apparatus For Polarization Control
App 20140361152 - Maleev; Ivan ;   et al.
2014-12-11
Optical Surface Scanning Systems And Methods
App 20130335736 - Maleev; Ivan
2013-12-19
Angular resolved spectroscopic scatterometer
Grant 8,502,977 - Maleev August 6, 2
2013-08-06
Transmissive-reflective Photocathode
App 20130126705 - Maleev; Ivan
2013-05-23
Wafer Inspection
App 20130016346 - Romanovsky; Anatoly ;   et al.
2013-01-17

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