| Patent | Date |
|---|
Inspection device and inspection method thereof
Grant 11,346,791 - Makuuchi , et al. May 31, 2 | 2022-05-31 |
Medium sensor device and monitoring system
Grant 11,199,511 - Ikeda , et al. December 14, 2 | 2021-12-14 |
Defect inspection apparatus and defect inspection method
Grant 11,143,598 - Honda , et al. October 12, 2 | 2021-10-12 |
Defect inspection device
Grant 11,143,600 - Honda , et al. October 12, 2 | 2021-10-12 |
Medium Sensor Device And Monitoring System
App 20210109037 - IKEDA; Kazuki ; et al. | 2021-04-15 |
Defect Inspection Apparatus And Defect Inspection Method
App 20210025829 - HONDA; Toshifumi ; et al. | 2021-01-28 |
Inspection Device And Inspection Method Thereof
App 20200393388 - Makuuchi; Masami ; et al. | 2020-12-17 |
Defect Inspection Device
App 20200371047 - Honda; Toshifumi ; et al. | 2020-11-26 |
Defect inspection apparatus and defect inspection method
Grant 10,830,706 - Honda , et al. November 10, 2 | 2020-11-10 |
Defect Inspection Apparatus And Defect Inspection Method
App 20200256804 - HONDA; Toshifumi ; et al. | 2020-08-13 |
Inspection apparatus and inspection method
Grant 10,458,924 - Kanai , et al. Oc | 2019-10-29 |
Examination device
Grant 10,401,304 - Makuuchi , et al. Sep | 2019-09-03 |
Inspection Apparatus And Inspection Method
App 20190178813 - KANAI; Hisaaki ; et al. | 2019-06-13 |
Examination Device
App 20190033228 - MAKUUCHI; Masami ; et al. | 2019-01-31 |
Examination device
Grant 10,107,762 - Makuuchi , et al. October 23, 2 | 2018-10-23 |
Examination Device
App 20180017502 - MAKUUCHI; Masami ; et al. | 2018-01-18 |
Inspection device and measurement device
Grant 9,779,912 - Makuuchi , et al. October 3, 2 | 2017-10-03 |
Driver integrated circuit
Grant 9,698,783 - Li , et al. July 4, 2 | 2017-07-04 |
Weak signal detection system and electron microscope equipped with same
Grant 9,576,769 - Kanai , et al. February 21, 2 | 2017-02-21 |
Inspection Device and Measurement Device
App 20160322193 - MAKUUCHI; Masami ; et al. | 2016-11-03 |
Weak Signal Detection System and Electron Microscope Equipped with Same
App 20160211110 - KANAI; Hisaaki ; et al. | 2016-07-21 |
Inspection equipment and inspection method
Grant 9,261,475 - Makuuchi , et al. February 16, 2 | 2016-02-16 |
Inspection Device And Inspection Method
App 20150293034 - Makuuchi; Masami ; et al. | 2015-10-15 |
Minute Signal Detection Method and System
App 20150012249 - Li; Wen ; et al. | 2015-01-08 |
Defect inspection method and defect inspection device
Grant 8,908,171 - Makuuchi , et al. December 9, 2 | 2014-12-09 |
Driver Integrated Circuit
App 20140125398 - Li; Wen ; et al. | 2014-05-08 |
Defect Inspection Method And Defect Inspection Device
App 20130286387 - Makuuchi; Masami ; et al. | 2013-10-31 |
Mass spectroscope and its adjusting method
Grant 8,563,925 - Kanai , et al. October 22, 2 | 2013-10-22 |
Mass Spectroscope and its Adjusting Method
App 20130200256 - Kanai; Hisaaki ; et al. | 2013-08-08 |
Inspection Equipment and Inspection Method
App 20130187667 - Makuuchi; Masami ; et al. | 2013-07-25 |
Wideband low noise sensor amplifier circuit
Grant 8,451,063 - Takahashi , et al. May 28, 2 | 2013-05-28 |
Inspection Device And Inspection Method
App 20120313650 - Kawaguchi; Hiroshi ; et al. | 2012-12-13 |
Patterned Medium Inspection Method And Inspection Apparatus
App 20120194939 - NISHIMOTO; Takuma ; et al. | 2012-08-02 |
Wideband Low Noise Sensor Amplifier Circuit
App 20120075021 - Takahashi; Masayoshi ; et al. | 2012-03-29 |
Contamination-inspecting apparatus and detection circuit
Grant 8,035,071 - Makuuchi , et al. October 11, 2 | 2011-10-11 |
Detecting Circuit And Inspecting Apparatus
App 20110211277 - NISHIMOTO; Takuma ; et al. | 2011-09-01 |
Inspection apparatus and inspection method of magnetic disk or magnetic head
Grant 8,000,045 - Makuuchi , et al. August 16, 2 | 2011-08-16 |
Inspection apparatus and inspection method of magnetic disk or magnetic head
Grant 8,000,047 - Takahashi , et al. August 16, 2 | 2011-08-16 |
Detection circuit and foreign matter inspection apparatus for semiconductor wafer
Grant 7,990,529 - Makuuchi , et al. August 2, 2 | 2011-08-02 |
Inspection Apparatus and Inspection Method of Magnetic Disk or Magnetic Head
App 20100067135 - MAKUUCHI; Masami ; et al. | 2010-03-18 |
Semiconductor device, testing and manufacturing methods thereof
Grant 7,668,027 - Imagawa , et al. February 23, 2 | 2010-02-23 |
Inspection Apparatus and Inspection Method of Magnetic Disk or Magnetic Head
App 20100033862 - TAKAHASHI; Masayoshi ; et al. | 2010-02-11 |
Detection Circuit And Foreign Matter Inspection Apparatus For Semiconductor Wafer
App 20090122305 - MAKUUCHI; Masami ; et al. | 2009-05-14 |
Semiconductor device and testing method thereof
Grant 7,474,290 - Makuuchi , et al. January 6, 2 | 2009-01-06 |
Contamination-inspecting Apparatus And Detection Circuit
App 20080278717 - Makuuchi; Masami ; et al. | 2008-11-13 |
Semiconductor device and the method of testing the same
Grant 7,443,373 - Imagawa , et al. October 28, 2 | 2008-10-28 |
Semiconductor device and testing method of semiconductor device
Grant 7,358,953 - Makuuchi , et al. April 15, 2 | 2008-04-15 |
Magnetic characteristic inspecting apparatus and inspecting method using it
Grant 7,276,900 - Takahashi , et al. October 2, 2 | 2007-10-02 |
Semiconductor device, testing and manufacturing methods thereof
App 20070047345 - Imagawa; Kengo ; et al. | 2007-03-01 |
Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probe
Grant 7,132,997 - Uesaka , et al. November 7, 2 | 2006-11-07 |
Magnetic characteristic inspecting apparatus and inspecting method using it
App 20060132122 - Takahashi; Masayoshi ; et al. | 2006-06-22 |
Semiconductor device and the method of testing the same
App 20050122297 - Imagawa, Kengo ; et al. | 2005-06-09 |
Semiconductor device and testing method thereof
App 20050122300 - Makuuchi, Masami ; et al. | 2005-06-09 |
Testing Apparatus For Conducting A Test On A Magnetic Recording Medium Or A Magnetic Head, Through Recording Test Data On The Magnetic Recording Medium And Reproducing Recorded Test Data Therefrom By Means Of The Magnetic Head
Grant 6,894,489 - Makuuchi , et al. May 17, 2 | 2005-05-17 |
Semiconductor device and testing method of semiconductor device
App 20040189564 - Makuuchi, Masami ; et al. | 2004-09-30 |
Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probe
App 20040135734 - Uesaka, Kouichi ; et al. | 2004-07-15 |
Testing apparatus of magnetic recording medium or magnetic head
App 20040124832 - Makuuchi, Masami ; et al. | 2004-07-01 |
Testing apparatus of magnetic recording medium or magnetic head including a plurality of analog-to-digital converters which convert reproduced testing data into digital data
Grant 6,700,369 - Makuuchi , et al. March 2, 2 | 2004-03-02 |
Reader/writer having coil arrangements to restrain electromagnetic field intensity at a distance
Grant 6,176,433 - Uesaka , et al. January 23, 2 | 2001-01-23 |
Power transmission system, power transmission/communication system and reader and/or writer
Grant 6,164,532 - Suga , et al. December 26, 2 | 2000-12-26 |
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