Makosch; Gunter

Patent Applications and Registrations

Patent applications and USPTO patent grants for Makosch; Gunter.The latest application filed is for "interferometric measuring methods for surfaces".

Company Profile

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Makosch; Gunter - Sindelfingen DE
MaKosch; Gunter - Sindelfingen-Maichingen DE
Makosch; Gunter - 7034 Maichingen DT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Interferometric measuring methods for surfaces Grant 4,764,014 - Makosch , et al. August 16, 1	1988-08-16
Method and arrangement for optically determining surface profiles Grant 4,714,348 - MaKosch December 22, 1	1987-12-22
Interferometric thickness analyzer and measuring method Grant 4,653,922 - Jarisch , et al. March 31, 1	1987-03-31
Method and arrangement for optical distance measurement Grant 4,577,968 - Makosch March 25, 1	1986-03-25
Apparatus for phase symmetrizing optical wave fronts Grant 4,541,720 - Hausler , et al. September 17, 1	1985-09-17
Method and means for interferometric surface topography Grant 4,498,771 - Makosch , et al. February 12, 1	1985-02-12
Interferometric measurement apparatus and method having increased measuring range Grant 4,358,201 - Makosch November 9, 1	1982-11-09
Apparatus for machining material Grant 4,275,288 - Makosch , et al. June 23, 1	1981-06-23
Optical System For Focusing Spaced Object Planes In A Common Image Plane Grant 3,709,579 - Makosch January 9, 1	1973-01-09

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