Maher; Chris

Patent Applications and Registrations

Patent applications and USPTO patent grants for Maher; Chris.The latest application filed is for "defect candidate generation for inspection".

Company Profile

5.10.11

Maher; Chris - San Jose CA
Maher; Chris - Hillsboro OR
Maher; Chris - Tracy CA
Maher; Chris - Anna TX
Maher; Chris - Melissa TX
Maher; Chris - Campbell CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks

Patent Activity

Patent	Date
Defect candidate generation for inspection Grant 11,114,324 - Plihal , et al. September 7, 2	2021-09-07
And noise based care areas Grant 10,832,396 - Duffy , et al. November 10, 2	2020-11-10
Defect Candidate Generation for Inspection App 20200328104 - Plihal; Martin ; et al.	2020-10-15
Design And Noise Based Care Areas App 20200126212 - Duffy; Brian ; et al.	2020-04-23
Emancipative waste activated sludge stripping to remove internal phosphorus ("eWASSTRIP") Grant 10,604,433 - Maher , et al.	2020-03-31
EMANCIPATIVE WASTE ACTIVATED SLUDGE STRIPPING TO REMOVE INTERNAL PHOSPHORUS ("eWASSTRIP") App 20190119138 - Maher; Chris ; et al.	2019-04-25
Decision tree construction for automatic classification of defects on semiconductor wafers Grant 9,489,599 - Chen , et al. November 8, 2	2016-11-08
Decision Tree Construction for Automatic Classification of Defects on Semiconductor Wafers App 20150125064 - Chen; Chien-Huei (Adam) ; et al.	2015-05-07
Personal Misting Device App 20140361101 - Maher; Chris	2014-12-11
Dual Layer Cooling Fabric App 20140223634 - Maher; Chris	2014-08-14
Monitoring of time-varying defect classification performance Grant 8,537,349 - Huet , et al. September 17, 2	2013-09-17
Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe Grant 8,135,204 - Chen , et al. March 13, 2	2012-03-13
Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions Grant 8,126,255 - Bhaskar , et al. February 28, 2	2012-02-28
System And Method For Improving Mobile Device Safety By Selectively Disabling Device Features During Unsafe Operational Conditions App 20120028624 - Jedlicka; Maya P. ; et al.	2012-02-02
Computer-implemented methods, computer-readable media, and systems for identifying one or more optical modes of an inspection system as candidates for use in inspection of a layer of a wafer Grant 8,073,240 - Fischer , et al. December 6, 2	2011-12-06
Monitoring Of Time-varying Defect Classification Performance App 20110224932 - Huet; Patrick ; et al.	2011-09-15
Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm Grant 8,000,922 - Chen , et al. August 16, 2	2011-08-16
Methods And Systems For Generating Information To Be Used For Selecting Values For One Or More Parameters Of A Detection Algorithm App 20090299681 - Chen; Hong ; et al.	2009-12-03
Systems And Methods For Creating Persistent Data For A Wafer And For Using Persistent Data For Inspection-related Functions App 20090080759 - Bhaskar; Kris ; et al.	2009-03-26
Computer-implemented Methods, Computer-readable Media, And Systems For Identifying One Or More Optical Modes Of An Inspection System As Candidates For Use In Inspection Of A Layer Of A Wafer App 20080279444 - Fischer; Verlyn ; et al.	2008-11-13

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