| Patent | Date |
|---|
Semiconductor inspection and metrology systems for distributing job among the CPUs or GPUs based on logical image processing boundaries
Grant 11,237,872 - Gupta , et al. February 1, 2 | 2022-02-01 |
Scalable, Flexible And Robust Template-based Data Extraction Pipeline
App 20210343030 - Sagonas; Christos ; et al. | 2021-11-04 |
Packaging items using customized 3D-printed dunnage
Grant 11,123,944 - Hoffman , et al. September 21, 2 | 2021-09-21 |
Machine Learning Inference System
App 20210125104 - Christiansen; Lewis Carl ; et al. | 2021-04-29 |
Inflatable packaging materials, automated packaging systems, and related methods
Grant 10,967,995 - Hoffman , et al. April 6, 2 | 2021-04-06 |
Generating high resolution images from low resolution images for semiconductor applications
Grant 10,769,761 - Sharma , et al. Sep | 2020-09-08 |
Learning based approach for aligning images acquired with different modalities
Grant 10,733,744 - Ha , et al. | 2020-08-04 |
Right-sized thermoformed cavities for packaging items
Grant 10,669,054 - Hoffman , et al. | 2020-06-02 |
Systems and methods for detecting defects on a wafer
Grant 10,605,744 - Chen , et al. | 2020-03-31 |
Unified neural network for defect detection and classification
Grant 10,607,119 - He , et al. | 2020-03-31 |
Apparatus and methods for combined brightfield, darkfield, and photothermal inspection
Grant 10,533,954 - Nicolaides , et al. Ja | 2020-01-14 |
Contour based defect detection
Grant 10,395,362 - Gupta , et al. A | 2019-08-27 |
Accelerating semiconductor-related computations using learning based models
Grant 10,360,477 - Bhaskar , et al. | 2019-07-23 |
Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput
Grant 10,290,088 - Vajaria , et al. | 2019-05-14 |
Unified Neural Network For Defect Detection And Classification
App 20190073568 - He; Li ; et al. | 2019-03-07 |
Generating High Resolution Images From Low Resolution Images For Semiconductor Applications
App 20190005629 - Sharma; Saurabh ; et al. | 2019-01-03 |
Scalable and Flexible Job Distribution Architecture for a Hybrid Processor System to Serve High Bandwidth Real Time Computational Systems Used in Semiconductor Inspection and Metrology Systems
App 20180341525 - Gupta; Ajay ; et al. | 2018-11-29 |
Learning Based Approach For Aligning Images Acquired With Different Modalities
App 20180330511 - Ha; Thanh Huy ; et al. | 2018-11-15 |
Contour Based Defect Detection
App 20180293721 - Gupta; Ajay ; et al. | 2018-10-11 |
Systems And Methods For Detecting Defects On A Wafer
App 20180202943 - Chen; Lu ; et al. | 2018-07-19 |
Systems and methods for detecting defects on a wafer
Grant 9,880,107 - Chen , et al. January 30, 2 | 2018-01-30 |
Apparatus And Methods For Combined Brightfield, Darkfield, And Photothermal Inspection
App 20180003648 - Nicolaides; Lena ; et al. | 2018-01-04 |
Apparatus and methods for combined brightfield, darkfield, and photothermal inspection
Grant 9,772,297 - Nicolaides , et al. September 26, 2 | 2017-09-26 |
Automated inline inspection and metrology using shadow-gram images
Grant 9,734,568 - Vajaria , et al. August 15, 2 | 2017-08-15 |
Accelerating Semiconductor-related Computations Using Learning Based Models
App 20170200260 - Bhaskar; Kris ; et al. | 2017-07-13 |
Accelerated Training Of A Machine Learning Based Model For Semiconductor Applications
App 20170193400 - Bhaskar; Kris ; et al. | 2017-07-06 |
In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
Grant 9,645,097 - Nicolaides , et al. May 9, 2 | 2017-05-09 |
Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopy
Grant 9,640,449 - Goodwin , et al. May 2, 2 | 2017-05-02 |
Automated image-based process monitoring and control
Grant 9,569,834 - Vajaria , et al. February 14, 2 | 2017-02-14 |
Automated Image-based Process Monitoring And Control
App 20160371826 - VAJARIA; Himanshu ; et al. | 2016-12-22 |
Data perturbation for wafer inspection or metrology setup using a model of a difference
Grant 9,360,863 - Thattaisundaram , et al. June 7, 2 | 2016-06-07 |
Automated Inline Inspection of Wafer Edge Strain Profiles Using Rapid Photoreflectance Spectroscopy
App 20150371910 - Goodwin; Timothy ; et al. | 2015-12-24 |
In-line Wafer Edge Inspection, Wafer Pre-alignment, And Wafer Cleaning
App 20150370175 - Nicolaides; Lena ; et al. | 2015-12-24 |
Automated Inline Inspection And Metrology Using Shadow-gram Images
App 20150243018 - VAJARIA; Himanshu ; et al. | 2015-08-27 |
Wafer and Lot Based Hierarchical Method Combining Customized Metrics with a Global Classification Methodology to Monitor Process Tool Condition at Extremely High Throughput
App 20150234379 - Vajaria; Himanshu ; et al. | 2015-08-20 |
Apparatus And Methods For Combined Brightfield, Darkfield, Andphotothermal Inspection
App 20150226676 - Nicolaides; Lena ; et al. | 2015-08-13 |
Automated inspection scenario generation
Grant 9,053,390 - Mahadevan , et al. June 9, 2 | 2015-06-09 |
Automated Inspection Scenario Generation
App 20140050389 - Mahadevan; Mohan ; et al. | 2014-02-20 |
Systems and Methods for Detecting Defects on a Wafer
App 20130250287 - Chen; Lu ; et al. | 2013-09-26 |
Systems and methods for detecting defects on a wafer
Grant 8,467,047 - Chen , et al. June 18, 2 | 2013-06-18 |
Systems and Methods for Detecting Defects on a Wafer
App 20120268735 - Chen; Lu ; et al. | 2012-10-25 |
Systems and methods for detecting defects on a wafer
Grant 8,223,327 - Chen , et al. July 17, 2 | 2012-07-17 |
Data Perturbation for Wafer Inspection or Metrology Setup
App 20120116733 - Thattaisundaram; Govind ; et al. | 2012-05-10 |
Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions
Grant 8,126,255 - Bhaskar , et al. February 28, 2 | 2012-02-28 |
Systems And Methods For Detecting Defects On A Wafer
App 20100188657 - Chen; Lu ; et al. | 2010-07-29 |
Systems And Methods For Creating Persistent Data For A Wafer And For Using Persistent Data For Inspection-related Functions
App 20090080759 - Bhaskar; Kris ; et al. | 2009-03-26 |
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