Patent | Date |
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Techniques for determining local interconnect defects Grant 10,032,524 - Sabde , et al. July 24, 2 | 2018-07-24 |
Erase stress and delta erase loop count methods for various fail modes in non-volatile memory Grant 9,934,872 - Magia , et al. April 3, 2 | 2018-04-03 |
Stress patterns to detect shorts in three dimensional non-volatile memory Grant 9,830,998 - Pachamuthu , et al. November 28, 2 | 2017-11-28 |
Determination of word line to word line shorts between adjacent blocks Grant 9,653,175 - Sabde , et al. May 16, 2 | 2017-05-16 |
Current based detection and recording of memory hole-interconnect spacing defects Grant 9,564,219 - Magia , et al. February 7, 2 | 2017-02-07 |
Determination Of Word Line To Word Line Shorts Between Adjacent Blocks App 20170025182 - Sabde; Jagdish ;   et al. | 2017-01-26 |
Word line look ahead read for word line to word line short detection Grant 9,548,129 - Paudel , et al. January 17, 2 | 2017-01-17 |
Select gate defect detection Grant 9,530,514 - Sabde , et al. December 27, 2 | 2016-12-27 |
Determination of word line to word line shorts between adjacent blocks Grant 9,514,835 - Magia , et al. December 6, 2 | 2016-12-06 |
Stress Patterns To Detect Shorts In Three Dimensional Non-volatile Memory App 20160343454 - Pachamuthu; Jayavel ;   et al. | 2016-11-24 |
Adaptive multi-page programming methods and apparatus for non-volatile memory Grant 9,496,040 - Paudel , et al. November 15, 2 | 2016-11-15 |
Determination of word line to local source line shorts Grant 9,484,086 - Magia , et al. November 1, 2 | 2016-11-01 |
CURRENT BASED Detection and Recording of Memory Hole-Interconnect Spacing Defects App 20160300607 - Magia; Sagar ;   et al. | 2016-10-13 |
AC stress mode to screen out word line to word line shorts Grant 9,460,809 - Magia , et al. October 4, 2 | 2016-10-04 |
Block and zone erase algorithm for memory Grant 9,449,698 - Paudel , et al. September 20, 2 | 2016-09-20 |
Non-volatile memory with multi-word line select for defect detection operations Grant 9,449,694 - Paudel , et al. September 20, 2 | 2016-09-20 |
Determination of bit line to low voltage signal shorts Grant 9,443,612 - Sbade , et al. September 13, 2 | 2016-09-13 |
Word Line Look Ahead Read For Word Line To Word Line Short Detection App 20160260495 - Paudel; Rajan ;   et al. | 2016-09-08 |
Techniques for Determining Local Interconnect Defects App 20160232985 - Sabde; Jagdish ;   et al. | 2016-08-11 |
Adaptive Multi-page Programming Methods And Apparatus For Non-volatile Memory App 20160217857 - Paudel; Rajan ;   et al. | 2016-07-28 |
Block Level Local Column Redundancy Methods for Higher Yield App 20160124664 - Sabde; Jagdish ;   et al. | 2016-05-05 |
Erase Stress and Delta Erase Loop Count Methods for Various Fail Modes in Non-Volatile Memory App 20160125956 - Magia; Sagar ;   et al. | 2016-05-05 |
Non-Volatile Memory with Multi-Word Line Select for Defect Detection Operations App 20160071594 - Paudel; Rajan ;   et al. | 2016-03-10 |
Methods to improve programming of slow cells Grant 9,269,446 - Magia , et al. February 23, 2 | 2016-02-23 |
AC stress methods to screen out bit line defects Grant 9,240,249 - Sabde , et al. January 19, 2 | 2016-01-19 |
AC Stress Mode to Screen Out Word Line to Word Line Shorts App 20160012913 - Magia; Sagar ;   et al. | 2016-01-14 |
Determination of Bit Line to Low Voltage Signal Shorts App 20160012915 - Magia; Sagar ;   et al. | 2016-01-14 |
Determination of Word Line to Local Source Line Shorts App 20160012914 - Magia; Sagar ;   et al. | 2016-01-14 |
Determination of Word Line to Word Line Shorts Between Adjacent Blocks App 20160012904 - Sabde; Jagdish ;   et al. | 2016-01-14 |
Techniques for detection and treating memory hole to local interconnect marginality defects Grant 9,224,502 - Sabde , et al. December 29, 2 | 2015-12-29 |
Techniques for detecting broken word lines in non-volatile memories Grant 9,202,593 - Magia , et al. December 1, 2 | 2015-12-01 |
Voltage regulators with improved wake-up response Grant 8,710,914 - Guhados , et al. April 29, 2 | 2014-04-29 |