Patent | Date |
---|
Semiconductor device, memory test method for semiconductor device, and test pattern generation program Grant 10,777,293 - Sasaki , et al. Sept | 2020-09-15 |
Semiconductor device and diagnostic method therefor Grant 10,580,513 - Maeda , et al. | 2020-03-03 |
Semiconductor device and diagnosis method thereof Grant 10,504,609 - Maeda , et al. Dec | 2019-12-10 |
Semiconductor Device, Memory Test Method For Semiconductor Device, And Test Pattern Generation Program App 20190333598 - SASAKI; Tomonori ;   et al. | 2019-10-31 |
Semiconductor Device And Diagnostic Method Therefor App 20180277237 - MAEDA; Yoichi ;   et al. | 2018-09-27 |
Semiconductor Device And Diagnosis Method Thereof App 20180090225 - MAEDA; Yoichi ;   et al. | 2018-03-29 |
Semiconductor Integrated Circuit With Memory Repair Circuit App 20110161751 - MAENO; Hideshi ;   et al. | 2011-06-30 |
Semiconductor Integrated Circuit With Memory Repair Circuit App 20090158087 - Maeno; Hideshi ;   et al. | 2009-06-18 |
Semiconductor integrated circuit with test circuit Grant 7,441,169 - Maeno October 21, 2 | 2008-10-21 |
Semiconductor integrated circuit with test circuit App 20070168802 - Maeno; Hideshi | 2007-07-19 |
Semiconductor integrated circuit with test circuit Grant 7,149,942 - Maeno December 12, 2 | 2006-12-12 |
Semiconductor integrated circuit device having a test circuit of a random access memory Grant 6,964,000 - Maeno November 8, 2 | 2005-11-08 |
Semiconductor integrated circuit device with test circuit App 20040117704 - Maeno, Hideshi | 2004-06-17 |
Semiconductor integrated circuit with test circuit App 20040117706 - Maeno, Hideshi | 2004-06-17 |
Semiconductor integrated circuit device having a test circuit of a random access memory App 20040059976 - Maeno, Hideshi | 2004-03-25 |
Semiconductor integrated circuit with a scan path circuit Grant 6,678,846 - Maeno January 13, 2 | 2004-01-13 |
Testing method and test apparatus in semiconductor apparatus Grant 6,504,772 - Maeno January 7, 2 | 2003-01-07 |
Electronic system with self-test function and simulation circuit for electronic system Grant 6,401,226 - Maeno June 4, 2 | 2002-06-04 |
Semiconductor Integrated Circuit Device App 20020062458 - Maeno, Hideshi | 2002-05-23 |
Testing method and test apparatus in semiconductor apparatus App 20010009523 - Maeno, Hideshi | 2001-07-26 |
Semiconductor memory testing device Grant 5,946,247 - Osawa , et al. August 31, 1 | 1999-08-31 |
Method and device for testing content addressable memory circuit and content addressable memory circuit with redundancy function Grant 5,848,074 - Maeno December 8, 1 | 1998-12-08 |
Semiconductor memory Grant 5,841,690 - Shibutani , et al. November 24, 1 | 1998-11-24 |
Semiconductor integrated circuit device having multi-port RAM memory with random logic portion which can be tested without additional test circuitry Grant 5,829,015 - Maeno October 27, 1 | 1998-10-27 |
Flip-flop circuit, scan path and storage circuit Grant 5,784,384 - Maeno July 21, 1 | 1998-07-21 |
Pseudo-random number generating circuit and bidirectional shift register Grant 5,719,913 - Maeno February 17, 1 | 1998-02-17 |
Memory cell array semiconductor integrated circuit device Grant 5,654,914 - Nii , et al. August 5, 1 | 1997-08-05 |
Memory cell array semiconductor integrated circuit device Grant 5,471,420 - Nii , et al. November 28, 1 | 1995-11-28 |
Test auxiliary circuit for testing semiconductor device Grant 4,926,424 - Maeno May 15, 1 | 1990-05-15 |
Semiconductor integrated circuit and method of testing same Grant 4,914,379 - Maeno April 3, 1 | 1990-04-03 |
Semiconductor test device Grant 4,813,043 - Maeno , et al. March 14, 1 | 1989-03-14 |