loadpatents
name:-0.010653018951416
name:-0.016150951385498
name:-0.0012099742889404
Maekawa; Masashi Patent Filings

Maekawa; Masashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Maekawa; Masashi.The latest application filed is for "semiconductor device and method for manufacturing same".

Company Profile
1.17.5
  • Maekawa; Masashi - Osaka N/A JP
  • Maekawa; Masashi - Nara JP
  • Maekawa, Masashi - Nara-shi JP
  • Maekawa, Masashi - Ichinomoto-cho JP
  • Maekawa; Masashi - Vancouver WA
  • Maekawa; Masashi - Sagamihara JP
  • Maekawa; Masashi - Atsugi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Selective recrystallization of semiconductor
Grant 8,466,048 - Itoh , et al. June 18, 2
2013-06-18
Semiconductor Device And Method For Manufacturing Same
App 20110315995 - Itoh; Yoshiyuki ;   et al.
2011-12-29
Crystalline semiconductor film and production method thereof, and semiconductor device and production method thereof
Grant 7,153,359 - Maekawa , et al. December 26, 2
2006-12-26
Single crystal TFT from continuous transition metal delivery method
Grant 6,784,455 - Maekawa , et al. August 31, 2
2004-08-31
Single crystal TFT from continuous transition metal delivery method
Grant 6,620,661 - Maekawa , et al. September 16, 2
2003-09-16
Crystalline semiconductor film and production method thereof, and semiconductor device and production method thereof
App 20030061984 - Maekawa, Masashi ;   et al.
2003-04-03
Single crystal TFT from continuous transition metal delivery method
App 20020090801 - Maekawa, Masashi ;   et al.
2002-07-11
Single crystal TFT from continuous transition metal delivery method
App 20020086471 - Maekawa, Masashi ;   et al.
2002-07-04
Single crystal TFT from continuous transition metal delivery method
Grant 6,346,437 - Maekawa , et al. February 12, 2
2002-02-12
Selective silicide thin-film transistor having polysilicon active layers with crystallizing metal agent introduced only in the source/drain regions
Grant 6,242,779 - Maekawa June 5, 2
2001-06-05
Thin film transistor in metal-induced crystallized region formed around a transition metal nucleus site
App 20010002324 - Maekawa, Masashi ;   et al.
2001-05-31
Selected site, metal-induced, continuous crystallization method
Grant 6,228,693 - Maekawa , et al. May 8, 2
2001-05-08
Method of forming polycrystalline film by steps including introduction of nickel and rapid thermal anneal
Grant 6,225,197 - Maekawa May 1, 2
2001-05-01
Method for fabricating thin film transistors
Grant 6,162,667 - Funai , et al. December 19, 2
2000-12-19
Thin-film transistor polycrystalline film formation by nickel induced, rapid thermal annealing method
Grant 6,066,547 - Maekawa May 23, 2
2000-05-23
Selective silicide thin-film transistor and method for same
Grant 5,940,693 - Maekawa August 17, 1
1999-08-17
Semiconductor device and method for fabricating the same
Grant 5,814,835 - Makita , et al. September 29, 1
1998-09-29
Glass-ceramic for information recording disk
Grant 5,561,089 - Ishizaki , et al. October 1, 1
1996-10-01
Method of manufacturing monocrystalline thin-film
Grant 4,801,351 - Awane , et al. January 31, 1
1989-01-31
Forming single crystal silicon on insulator by irradiating a laser beam having dual peak energy distribution onto polysilicon on a dielectric substrate having steps
Grant 4,719,183 - Maekawa January 12, 1
1988-01-12
Vehicle headlamp
Grant 4,506,315 - Maekawa , et al. March 19, 1
1985-03-19

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed