MAEDA; Tatsuya

Patent Applications and Registrations

Patent applications and USPTO patent grants for MAEDA; Tatsuya.The latest application filed is for "electric work machine".

Company Profile

1.43.33

MAEDA; Tatsuya - Anjo-shi JP
Maeda; Tatsuya - Ibaraki JP
Maeda; Tatsuya - Hitachinaka JP
- Hitachinaka JP
MAEDA; Tatsuya - Hitachinaka-shi JP
Maeda; Tatsuya - Neyagawa JP
Maeda; Tatsuya - Kanagawa JP
MAEDA; Tatsuya - Neyagawa-shi JP
Maeda; Tatsuya - Shizuoka JP
Maeda; Tatsuya - Yokkaichi JP
Maeda, Tatsuya - Yokkaichi-City JP
Maeda; Tatsuya - Katsuta JP
Maeda; Tatsuya - Haibara-gun JP
Maeda; Tatsuya - Kyoto JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electric Work Machine App 20210296955 - YAMADA; Takaya ; et al.	2021-09-23
Dump truck radiator Grant 9,783,041 - Uranaka , et al. October 10, 2	2017-10-10
Dump Truck App 20170008386 - Uranaka; Kyouji ; et al.	2017-01-12
Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns Grant 9,000,366 - Yamaguchi , et al. April 7, 2	2015-04-07
Pattern measuring apparatus Grant 8,872,106 - Nishihama , et al. October 28, 2	2014-10-28
Scanning electron microscope Grant 8,666,165 - Yamaguchi , et al. March 4, 2	2014-03-04
Pattern Measuring Apparatus App 20140021350 - NISHIHAMA; Hiroshi ; et al.	2014-01-23
Pattern Measuring Apparatus App 20140021349 - Nishihama; Hiroshi ; et al.	2014-01-23
Pattern measuring apparatus Grant 08618517 -	2013-12-31
Method And Apparatus For Measuring Displacement Between Patterns And Scanning Electron Microscope Installing Unit For Measuring Displacement Between Patterns App 20130264479 - YAMAGUCHI; Atsuko ; et al.	2013-10-10
Tool-to-tool matching control method and its system for scanning electron microscope Grant 8,502,144 - Oosaki , et al. August 6, 2	2013-08-06
Method and apparatus for setting sample observation condition, and method and apparatus for sample observation Grant 8,384,030 - Ueda , et al. February 26, 2	2013-02-26
Charged particle beam apparatus and methods for capturing images using the same Grant 8,207,512 - Shishido , et al. June 26, 2	2012-06-26
Image processing apparatus for analysis of pattern matching failure Grant 8,200,006 - Ikeda , et al. June 12, 2	2012-06-12
Loudspeaker diaphragm and loudspeaker using the same Grant 8,199,962 - Maeda June 12, 2	2012-06-12
Scanning electron microscope alignment method and scanning electron microscope Grant 8,188,427 - Kakuta , et al. May 29, 2	2012-05-29
Scanning electron microscope Grant 8,124,934 - Maeda February 28, 2	2012-02-28
Tool-To-Tool Matching Control Method And Its System For Scanning Electron Microscope App 20110278453 - Oosaki; Mayuka ; et al.	2011-11-17
Tool-to-tool matching control method and its system for scanning electron microscope Grant 8,003,940 - Oosaki , et al. August 23, 2	2011-08-23
Charged Particel Beam Apparatus And Methods For Capturing Images Using The Same App 20110133080 - SHISHIDO; Chie ; et al.	2011-06-09
Charged particle beam apparatus and methods for capturing images using the same Grant 7,807,980 - Shishido , et al. October 5, 2	2010-10-05
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication Grant 7,684,937 - Yamaguchi , et al. March 23, 2	2010-03-23
Program creation apparatus, program creation method and program Grant 7,640,509 - Gunji , et al. December 29, 2	2009-12-29
Scanning Electron Microscope App 20090242765 - MAEDA; Tatsuya	2009-10-01
Image processing apparatus for analysis of pattern matching failure App 20090214122 - IKEDA; Mitsuji ; et al.	2009-08-27
Image processing apparatus for analysis of pattern matching failure Grant 7,545,977 - Ikeda , et al. June 9, 2	2009-06-09
Tool-To-Tool Matching Control Method And its System For Scanning Electron Microscope App 20090121134 - Oosaki; Mayuka ; et al.	2009-05-14
Loudspeaker Diaphragm And Loudspeaker Using The Same App 20090060251 - MAEDA; Tatsuya	2009-03-05
Scanning Electron Microscope App 20090041333 - YAMAGUCHI; Satoru ; et al.	2009-02-12
Scanning Electron Microscope Alignment Method and Scanning Electron Microscope App 20090032693 - Kakuta; Junichi ; et al.	2009-02-05
Tool-to-tool matching control method and its system for scanning electron microscope Grant 7,476,857 - Oosaki , et al. January 13, 2	2009-01-13
Scanning electron microscope Grant 7,446,313 - Maeda November 4, 2	2008-11-04
Scanning electron microscope Grant 7,439,505 - Yamaguchi , et al. October 21, 2	2008-10-21
Method for measuring line and space pattern using scanning electron microscope Grant 7,433,542 - Takane , et al. October 7, 2	2008-10-07
Method And Apparatus For Setting Sample Observation Condition, And Method And Apparatus For Sample Observation App 20080217532 - Ueda; Kazuhiro ; et al.	2008-09-11
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication App 20080215274 - Yamaguchi; Atsuko ; et al.	2008-09-04
Inspection method of electric part Grant 7,409,080 - Maeda , et al. August 5, 2	2008-08-05
Scanning electron microscope, method for measuring a dimension of a pattern using the same, and apparatus for correcting difference between scanning electron microscopes Grant 7,408,154 - Oosaki , et al. August 5, 2	2008-08-05
Charged particle system and a method for measuring image magnification Grant 7,372,047 - Sato , et al. May 13, 2	2008-05-13
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication Grant 7,366,620 - Yamaguchi , et al. April 29, 2	2008-04-29
Charged particle beam apparatus and methods for capturing images using the same App 20070164219 - Shishido; Chie ; et al.	2007-07-19
Tool-to-tool matching control method and its system for scanning electron microscope App 20070114405 - Oosaki; Mayuka ; et al.	2007-05-24
Image processing apparatus for analysis of pattern matching failure App 20070045538 - Ikeda; Mitsuji ; et al.	2007-03-01
Program creation apparatus, program creation method and program App 20060290716 - Gunji; Takahisa ; et al.	2006-12-28
Scanning electron microscope App 20060188216 - Maeda; Tatsuya	2006-08-24
Scanning electron microscope App 20060097158 - Yamaguchi; Satoru ; et al.	2006-05-11
Scanning electron microscope, method for measuring a dimension of a pattern using the same, and apparatus for correcting difference between scanning electron microscopes App 20060091309 - Oosaki; Mayuka ; et al.	2006-05-04
Inspection method of electrical part, inspection apparatus of electric junction box and inspection apparatus of terminal fittings Grant 7,006,681 - Maeda , et al. February 28, 2	2006-02-28
Scanning electron microscope Grant 7,002,151 - Yamaguchi , et al. February 21, 2	2006-02-21
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication App 20060036409 - Yamaguchi; Atsuko ; et al.	2006-02-16
Inspection method of electric part, inspection apparatus of electric junction box and inspection apparatus of terminal fittings App 20060013467 - Maeda; Tatsuya ; et al.	2006-01-19
Method for measuring line and space pattern using scanning electron microscope App 20050207673 - Takane, Atsushi ; et al.	2005-09-22
Charged particle system and a method for measuring image magnification App 20050189501 - Sato, Mitsugu ; et al.	2005-09-01
Scanning electron microscope App 20050109937 - Yamaguchi, Satoru ; et al.	2005-05-26
Scanning electron microscope Grant 6,803,573 - Yamaguchi , et al. October 12, 2	2004-10-12
Combined terminal fitting Grant 6,786,751 - Maeda , et al. September 7, 2	2004-09-07
Inspection method and inspection system of a terminal metal fitting Grant 6,738,134 - Maeda May 18, 2	2004-05-18
Combined terminal fitting App 20040023542 - Maeda, Tatsuya ; et al.	2004-02-05
Scanning electron microscope App 20040016882 - Yamaguchi, Satoru ; et al.	2004-01-29
Scanning electron microscope Grant 6,627,888 - Yamaguchi , et al. September 30, 2	2003-09-30
Unitable terminal fitting, a construction for uniting a plurality of terminal fittings and method for forming a unitable terminal fitting Grant 6,530,795 - Maeda , et al. March 11, 2	2003-03-11
Unitable terminal fitting a construction for uniting a plurality of terminal fittings and method for forming a unitable terminal fitting App 20020132507 - Maeda, Tatsuya ; et al.	2002-09-19
Inspection method of electrical part, inspection apparatus of electric junction box and inspection apparatus of terminal fittings App 20020036512 - Maeda, Tatsuya ; et al.	2002-03-28
Inspection method and inspection system of a terminal metal fitting App 20020036770 - Maeda, Tatsuya	2002-03-28
Scanning electron microscope App 20010019109 - Yamaguchi, Satoru ; et al.	2001-09-06
Control method of terminal crimping device Grant 5,921,125 - Inoue , et al. July 13, 1	1999-07-13
Terminal crimping device Grant 5,887,469 - Maeda , et al. March 30, 1	1999-03-30
Scanning electron microscope Grant 5,614,713 - Kobaru , et al. March 25, 1	1997-03-25
Electron beam apparatus Grant 5,598,002 - Todokoro , et al. January 28, 1	1997-01-28
Identification of connector terminals Grant 5,570,191 - Uesugi , et al. October 29, 1	1996-10-29
Auto focusing apparatus of scanning electron microscopes Grant 5,512,747 - Maeda April 30, 1	1996-04-30
Wire ends processing apparatus Grant 5,404,634 - Takeshita , et al. April 11, 1	1995-04-11
Pigmenting of cellulose textiles: treatment with cationic compound and immersion in aqueous pigment dispersion Grant 5,252,103 - Kamata , et al. October 12, 1	1993-10-12
Thermochromic dyeing method and cellulose product dyed thereby Grant 5,221,288 - Kamada , et al. June 22, 1	1993-06-22