Maeda; Takuho

Patent Applications and Registrations

Patent applications and USPTO patent grants for Maeda; Takuho.The latest application filed is for "image measuring method and image measuring device".

Company Profile

0.6.8

Maeda; Takuho - Kawasaki JP
MAEDA; Takuho - Kawasaki-shi JP
MAEDA; Takuho - Kanagawa JP
Maeda; Takuho - Nonoichi N/A JP
Maeda; Takuho - Nonoichi-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image measuring method and apparatus Grant 11,257,205 - Cho , et al. February 22, 2	2022-02-22
Hardness test apparatus and hardness testing method Grant 10,163,201 - Sawa , et al. Dec	2018-12-25
Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program Grant 10,102,631 - Yoshida , et al. October 16, 2	2018-10-16
Image measuring apparatus Grant 10,027,885 - Cho , et al. July 17, 2	2018-07-17
Image Measuring Method And Image Measuring Device App 20170178315 - CHO; Gyokubu ; et al.	2017-06-22
Hardness Test Apparatus And Hardness Testing Method App 20170076436 - SAWA; Takeshi ; et al.	2017-03-16
Edge Detection Bias Correction Value Calculation Method, Edge Detection Bias Correction Method, And Edge Detection Bias Correcting Program App 20160295207 - YOSHIDA; Hiroyuki ; et al.	2016-10-06
Non-contact Surface-shape Measurment Method And Apparatus Using White Light Interferometer Optical Head App 20160131474 - SAEKI; Takeshi ; et al.	2016-05-12
Image Measuring Apparatus App 20160019687 - CHO; Gyokubu ; et al.	2016-01-21
Image Measuring Apparatus App 20160021306 - CHO; Gyokubu ; et al.	2016-01-21
Liquid crystal display device Grant 8,553,181 - Yamakawa , et al. October 8, 2	2013-10-08
Liquid Crystal Display Device App 20130027645 - YAMAKAWA; Eishi ; et al.	2013-01-31

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