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Patent applications and USPTO patent grants for Maeda; Sumihiro.The latest application filed is for "method for measuring optimum seeking time and inspection apparatus using the same".
Patent | Date |
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Method for measuring optimum seeking time and inspection apparatus using the same Grant 8,031,421 - Shitara , et al. October 4, 2 | 2011-10-04 |
Method of detecting scratch defect in circumferential direction and magnetic disk certifier Grant 7,903,361 - Maeda , et al. March 8, 2 | 2011-03-08 |
Method For Measuring Optimum Seeking Time And Inspection Apparatus Using The Same App 20100302665 - SHITARA; Kenichi ;   et al. | 2010-12-02 |
Method Of Detecting Scratch Defect In Circumferential Direction And Magnetic Disk Certifier App 20070271487 - Maeda; Sumihiro ;   et al. | 2007-11-22 |
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