Maeda; Shunzi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Maeda; Shunzi.The latest application filed is for "apparatus and method for inspecting pattern".
- Maeda; Shunzi - Yokohama JP
| Patent | Date |
|---|---|
| Apparatus and method for inspecting pattern Grant 8,451,439 - Uto , et al. May 28, 2 | 2013-05-28 |
| Apparatus And Method For Inspecting Pattern App 20120176602 - UTO; Sachio ; et al. | 2012-07-12 |
| Apparatus and method for inspecting pattern Grant 8,149,395 - Uto , et al. April 3, 2 | 2012-04-03 |
| Apparatus And Method For Inspecting Pattern App 20110170092 - UTO; Sachio ; et al. | 2011-07-14 |
| Apparatus and method for inspecting pattern Grant 7,911,601 - Uto , et al. March 22, 2 | 2011-03-22 |
| Apparatus And Method For Inspecting Pattern App 20090066943 - UTO; Sachio ; et al. | 2009-03-12 |
| Apparatus and method for inspecting pattern Grant 7,446,866 - Uto , et al. November 4, 2 | 2008-11-04 |
| Apparatus and method for inspecting pattern App 20060256328 - Uto; Sachio ; et al. | 2006-11-16 |
| Apparatus and method for inspecting pattern Grant 7,081,953 - Uto , et al. July 25, 2 | 2006-07-25 |
| Apparatus and method for inspecting pattern App 20050062961 - Uto, Sachio ; et al. | 2005-03-24 |
| Apparatus and method for inspecting pattern Grant 6,831,737 - Uto , et al. December 14, 2 | 2004-12-14 |
| Apparatus and method for inspecting pattern App 20030020904 - Uto, Sachio ; et al. | 2003-01-30 |
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