loadpatents
Patent applications and USPTO patent grants for MADOKORO; Yuichi.The latest application filed is for "particle beam apparatus and composite beam apparatus".
Patent | Date |
---|---|
Particle Beam Apparatus And Composite Beam Apparatus App 20210296079 - NAGAHARA; Koji ;   et al. | 2021-09-23 |
Specimen preparation device, and control method in specimen preparation device Grant 8,710,464 - Madokoro , et al. April 29, 2 | 2014-04-29 |
Charged particle beam device and method for correcting position with respect to charged particle beam Grant 8,629,394 - Madokoro , et al. January 14, 2 | 2014-01-14 |
Method and apparatus for specimen fabrication Grant 8,569,719 - Tomimatsu , et al. October 29, 2 | 2013-10-29 |
Focused ion beam device and focused ion beam processing method Grant 8,552,397 - Madokoro , et al. October 8, 2 | 2013-10-08 |
Method and apparatus for specimen fabrication Grant 8,405,053 - Tomimatsu , et al. March 26, 2 | 2013-03-26 |
Focused Ion Beam Device and Focused Ion Beam Processing Method App 20120235055 - Madokoro; Yuichi ;   et al. | 2012-09-20 |
Method And Apparatus For Specimen Fabrication App 20120085924 - Tomimatsu; Satoshi ;   et al. | 2012-04-12 |
Specimen Preparation Device, And Control Method In Specimen Preparation Device App 20110309245 - Madokoro; Yuichi ;   et al. | 2011-12-22 |
Charged Particle Beam Device And Method For Correcting Position With Respect To Charged Particle Beam App 20110297826 - Madokoro; Yuichi ;   et al. | 2011-12-08 |
Method and apparatus for specimen fabrication Grant 7,999,240 - Tomimatsu , et al. August 16, 2 | 2011-08-16 |
Method And Apparatus For Specimen Fabrication App 20110140006 - Tomimatsu; Satoshi ;   et al. | 2011-06-16 |
Liquid metal ion gun Grant 7,804,073 - Kaga , et al. September 28, 2 | 2010-09-28 |
Method and apparatus for specimen fabrication Grant 7,791,050 - Tomimatsu , et al. September 7, 2 | 2010-09-07 |
Focused ion beam apparatus for specimen fabrication Grant 7,525,108 - Tomimatsu , et al. April 28, 2 | 2009-04-28 |
Method And Apparatus For Specimen Fabrication App 20090008578 - Tomimatsu; Satoshi ;   et al. | 2009-01-08 |
Method And Apparatus For Specimen Fabrication App 20080296516 - TOMIMATSU; Satoshi ;   et al. | 2008-12-04 |
Method And Apparatus For Specimen Fabrication App 20080296497 - TOMIMATSU; Satoshi ;   et al. | 2008-12-04 |
Focused ion beam apparatus and liquid metal ion source Grant 7,435,972 - Madokoro , et al. October 14, 2 | 2008-10-14 |
Liquid metal ion gun App 20080210883 - Kaga; Hiroyasu ;   et al. | 2008-09-04 |
Liquid metal ion gun Grant 7,420,181 - Kaga , et al. September 2, 2 | 2008-09-02 |
Method and apparatus for specimen fabrication Grant 7,397,052 - Tomimatsu , et al. July 8, 2 | 2008-07-08 |
Method and apparatus for specimen fabrication Grant 7,397,050 - Tomimatsu , et al. July 8, 2 | 2008-07-08 |
Method and apparatus for specimen fabrication Grant 7,397,051 - Tomimatsu , et al. July 8, 2 | 2008-07-08 |
Liquid metal ion gun App 20070257200 - Kaga; Hiroyasu ;   et al. | 2007-11-08 |
Focused ion beam apparatus and aperture App 20070152174 - Madokoro; Yuichi ;   et al. | 2007-07-05 |
Method and apparatus for specimen fabrication App 20070145299 - Tomimatsu; Satoshi ;   et al. | 2007-06-28 |
Method and apparatus for specimen fabrication App 20070145300 - Tomimatsu; Satoshi ;   et al. | 2007-06-28 |
Method and apparatus for specimen fabrication App 20070145301 - Tomimatsu; Satoshi ;   et al. | 2007-06-28 |
Method and apparatus for specimen fabrication App 20070145302 - Tomimatsu; Satoshi ;   et al. | 2007-06-28 |
Focused ion beam apparatus Grant 7,235,798 - Ishitani , et al. June 26, 2 | 2007-06-26 |
Liquid metal ion gun Grant 7,211,805 - Kaga , et al. May 1, 2 | 2007-05-01 |
Focused ion beam apparatus and aperture Grant 7,189,982 - Madokoro , et al. March 13, 2 | 2007-03-13 |
Method and apparatus for specimen fabrication Grant 7,176,458 - Tomimatsu , et al. February 13, 2 | 2007-02-13 |
Method and apparatus for specimen fabrication Grant 7,138,628 - Tomimatsu , et al. November 21, 2 | 2006-11-21 |
Method and apparatus for specimen fabrication App 20060231776 - Tomimatsu; Satoshi ;   et al. | 2006-10-19 |
Method and apparatus for specimen fabrication App 20060192099 - Tomimatsu; Satoshi ;   et al. | 2006-08-31 |
Ion beam apparatus and sample processing method Grant 7,084,399 - Muto , et al. August 1, 2 | 2006-08-01 |
Method and apparatus for specimen fabrication Grant 7,071,475 - Tomimatsu , et al. July 4, 2 | 2006-07-04 |
Liquid metal ion gun App 20060097186 - Kaga; Hiroyasu ;   et al. | 2006-05-11 |
Focused ion beam apparatus and aperture App 20060054840 - Madokoro; Yuichi ;   et al. | 2006-03-16 |
Liquid metal ion gun Grant 7,005,651 - Kaga , et al. February 28, 2 | 2006-02-28 |
Focused ion beam apparatus App 20050279952 - Ishitani, Tohru ;   et al. | 2005-12-22 |
Liquid metal ion gun App 20050127304 - Kaga, Hiroyasu ;   et al. | 2005-06-16 |
Ion beam apparatus and sample processing method App 20050092922 - Muto, Hiroyuki ;   et al. | 2005-05-05 |
Method and apparatus for specimen fabrication App 20050054029 - Tomimatsu, Satoshi ;   et al. | 2005-03-10 |
Method and apparatus for specimen fabrication Grant 6,828,566 - Tomimatsu , et al. December 7, 2 | 2004-12-07 |
Ion beam apparatus and sample processing method Grant 6,822,245 - Muto , et al. November 23, 2 | 2004-11-23 |
Method and apparatus for specimen fabrication App 20030183776 - Tomimatsu, Satoshi ;   et al. | 2003-10-02 |
Ion beam apparatus and sample processing method App 20020008208 - Muto, Hiroyuki ;   et al. | 2002-01-24 |
Magnetic head having track width specified by grooves formed with projection ion beam Grant 5,910,871 - Kawanami , et al. June 8, 1 | 1999-06-08 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.