loadpatents
name:-0.029193878173828
name:-0.028820037841797
name:-0.00052499771118164
MADOKORO; Yuichi Patent Filings

MADOKORO; Yuichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for MADOKORO; Yuichi.The latest application filed is for "particle beam apparatus and composite beam apparatus".

Company Profile
0.30.26
  • MADOKORO; Yuichi - Tokyo JP
  • Madokoro; Yuichi - Hitachinaka N/A JP
  • Madokoro; Yuichi - Kokubunji JP
  • Madokoro; Yuichi - Kokubunji-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Particle Beam Apparatus And Composite Beam Apparatus
App 20210296079 - NAGAHARA; Koji ;   et al.
2021-09-23
Specimen preparation device, and control method in specimen preparation device
Grant 8,710,464 - Madokoro , et al. April 29, 2
2014-04-29
Charged particle beam device and method for correcting position with respect to charged particle beam
Grant 8,629,394 - Madokoro , et al. January 14, 2
2014-01-14
Method and apparatus for specimen fabrication
Grant 8,569,719 - Tomimatsu , et al. October 29, 2
2013-10-29
Focused ion beam device and focused ion beam processing method
Grant 8,552,397 - Madokoro , et al. October 8, 2
2013-10-08
Method and apparatus for specimen fabrication
Grant 8,405,053 - Tomimatsu , et al. March 26, 2
2013-03-26
Focused Ion Beam Device and Focused Ion Beam Processing Method
App 20120235055 - Madokoro; Yuichi ;   et al.
2012-09-20
Method And Apparatus For Specimen Fabrication
App 20120085924 - Tomimatsu; Satoshi ;   et al.
2012-04-12
Specimen Preparation Device, And Control Method In Specimen Preparation Device
App 20110309245 - Madokoro; Yuichi ;   et al.
2011-12-22
Charged Particle Beam Device And Method For Correcting Position With Respect To Charged Particle Beam
App 20110297826 - Madokoro; Yuichi ;   et al.
2011-12-08
Method and apparatus for specimen fabrication
Grant 7,999,240 - Tomimatsu , et al. August 16, 2
2011-08-16
Method And Apparatus For Specimen Fabrication
App 20110140006 - Tomimatsu; Satoshi ;   et al.
2011-06-16
Liquid metal ion gun
Grant 7,804,073 - Kaga , et al. September 28, 2
2010-09-28
Method and apparatus for specimen fabrication
Grant 7,791,050 - Tomimatsu , et al. September 7, 2
2010-09-07
Focused ion beam apparatus for specimen fabrication
Grant 7,525,108 - Tomimatsu , et al. April 28, 2
2009-04-28
Method And Apparatus For Specimen Fabrication
App 20090008578 - Tomimatsu; Satoshi ;   et al.
2009-01-08
Method And Apparatus For Specimen Fabrication
App 20080296516 - TOMIMATSU; Satoshi ;   et al.
2008-12-04
Method And Apparatus For Specimen Fabrication
App 20080296497 - TOMIMATSU; Satoshi ;   et al.
2008-12-04
Focused ion beam apparatus and liquid metal ion source
Grant 7,435,972 - Madokoro , et al. October 14, 2
2008-10-14
Liquid metal ion gun
App 20080210883 - Kaga; Hiroyasu ;   et al.
2008-09-04
Liquid metal ion gun
Grant 7,420,181 - Kaga , et al. September 2, 2
2008-09-02
Method and apparatus for specimen fabrication
Grant 7,397,052 - Tomimatsu , et al. July 8, 2
2008-07-08
Method and apparatus for specimen fabrication
Grant 7,397,050 - Tomimatsu , et al. July 8, 2
2008-07-08
Method and apparatus for specimen fabrication
Grant 7,397,051 - Tomimatsu , et al. July 8, 2
2008-07-08
Liquid metal ion gun
App 20070257200 - Kaga; Hiroyasu ;   et al.
2007-11-08
Focused ion beam apparatus and aperture
App 20070152174 - Madokoro; Yuichi ;   et al.
2007-07-05
Method and apparatus for specimen fabrication
App 20070145299 - Tomimatsu; Satoshi ;   et al.
2007-06-28
Method and apparatus for specimen fabrication
App 20070145300 - Tomimatsu; Satoshi ;   et al.
2007-06-28
Method and apparatus for specimen fabrication
App 20070145301 - Tomimatsu; Satoshi ;   et al.
2007-06-28
Method and apparatus for specimen fabrication
App 20070145302 - Tomimatsu; Satoshi ;   et al.
2007-06-28
Focused ion beam apparatus
Grant 7,235,798 - Ishitani , et al. June 26, 2
2007-06-26
Liquid metal ion gun
Grant 7,211,805 - Kaga , et al. May 1, 2
2007-05-01
Focused ion beam apparatus and aperture
Grant 7,189,982 - Madokoro , et al. March 13, 2
2007-03-13
Method and apparatus for specimen fabrication
Grant 7,176,458 - Tomimatsu , et al. February 13, 2
2007-02-13
Method and apparatus for specimen fabrication
Grant 7,138,628 - Tomimatsu , et al. November 21, 2
2006-11-21
Method and apparatus for specimen fabrication
App 20060231776 - Tomimatsu; Satoshi ;   et al.
2006-10-19
Method and apparatus for specimen fabrication
App 20060192099 - Tomimatsu; Satoshi ;   et al.
2006-08-31
Ion beam apparatus and sample processing method
Grant 7,084,399 - Muto , et al. August 1, 2
2006-08-01
Method and apparatus for specimen fabrication
Grant 7,071,475 - Tomimatsu , et al. July 4, 2
2006-07-04
Liquid metal ion gun
App 20060097186 - Kaga; Hiroyasu ;   et al.
2006-05-11
Focused ion beam apparatus and aperture
App 20060054840 - Madokoro; Yuichi ;   et al.
2006-03-16
Liquid metal ion gun
Grant 7,005,651 - Kaga , et al. February 28, 2
2006-02-28
Focused ion beam apparatus
App 20050279952 - Ishitani, Tohru ;   et al.
2005-12-22
Liquid metal ion gun
App 20050127304 - Kaga, Hiroyasu ;   et al.
2005-06-16
Ion beam apparatus and sample processing method
App 20050092922 - Muto, Hiroyuki ;   et al.
2005-05-05
Method and apparatus for specimen fabrication
App 20050054029 - Tomimatsu, Satoshi ;   et al.
2005-03-10
Method and apparatus for specimen fabrication
Grant 6,828,566 - Tomimatsu , et al. December 7, 2
2004-12-07
Ion beam apparatus and sample processing method
Grant 6,822,245 - Muto , et al. November 23, 2
2004-11-23
Method and apparatus for specimen fabrication
App 20030183776 - Tomimatsu, Satoshi ;   et al.
2003-10-02
Ion beam apparatus and sample processing method
App 20020008208 - Muto, Hiroyuki ;   et al.
2002-01-24
Magnetic head having track width specified by grooves formed with projection ion beam
Grant 5,910,871 - Kawanami , et al. June 8, 1
1999-06-08

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