Madhavan; Sriram

Patent Applications and Registrations

Patent applications and USPTO patent grants for Madhavan; Sriram.The latest application filed is for "systems and methods for idle fuel economy mode".

Company Profile

3.17.16

Madhavan; Sriram - Columbus IN
Madhavan; Sriram - Santa Clara CA
Madhavan; Sriram - Milpitas CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems and methods for idle fuel economy mode Grant 10,968,803 - Zhao , et al. April 6, 2	2021-04-06
Systems And Methods For Idle Fuel Economy Mode App 20190376428 - Zhao; Minming ; et al.	2019-12-12
Systems and methods for idle fuel economy mode Grant 10,392,990 - Zhao , et al. A	2019-08-27
IC layout post-decomposition mask allocation optimization Grant 10,372,871 - Wang , et al.	2019-08-06
Ic Layout Post-decomposition Mask Allocation Optimization App 20190034577 - Wang; Lynn Tao-Ning ; et al.	2019-01-31
Feed-forward for silicon inspections (DFM2CFM : design to silicon) and feed-back for weakpoint predictor decks (CFM2DFM : silicon to design) guided by marker classification, sampling, and higher dimensional analysis Grant 10,095,826 - Somani , et al. October 9, 2	2018-10-09
Method, system and program product for identifying anomalies in integrated circuit design layouts Grant 10,055,535 - Pathak , et al. August 21, 2	2018-08-21
Systems And Methods For Idle Fuel Economy Mode App 20180106179 - Zhao; Minming ; et al.	2018-04-19
Method, System And Program Product For Identifying Anomalies In Integrated Circuit Design Layouts App 20180089357 - PATHAK; Piyush ; et al.	2018-03-29
Feed-forward For Silicon Inspections (dfm2cfm : Design To Silicon) & Feed-back For Weakpoint Predictor Decks (cfm2dfm : Silicon To Design) Guided By Marker Classification, Sampling, And Higher Dimensional Analysis App 20170364626 - SOMANI; Shikha ; et al.	2017-12-21
Pattern Matching For Predicting Defect Limited Yield App 20150286763 - WANG; Lynn ; et al.	2015-10-08
Stitch insertion for reducing color density differences in double patterning technology (DPT) Grant 8,918,745 - Wang , et al. December 23, 2	2014-12-23
Stitch Insertion For Reducing Color Density Differences In Double Patterning Technology (dpt) App 20140282301 - WANG; Lynn ; et al.	2014-09-18
Method and apparatus for applying post graphic data system stream enhancements Grant 8,745,553 - Muddu , et al. June 3, 2	2014-06-03
Method And Apparatus For Applying Post Graphic Data System Stream Enhancements App 20140059506 - MUDDU; Swamy ; et al.	2014-02-27
Pattern based method for identifying design for manufacturing improvement in a semiconductor device Grant 8,656,336 - Pathak , et al. February 18, 2	2014-02-18
Pattern Based Method For Identifying Design For Manufacturing Improvement In A Semiconductor Device App 20130227498 - Pathak; Piyush ; et al.	2013-08-29
Methods for quantitatively evaluating the quality of double patterning technology-compliant layouts Grant 8,516,407 - Wang , et al. August 20, 2	2013-08-20
Methods For Quantitatively Evaluating The Quality Of Double Patterning Technology-compliant Layouts App 20130198696 - Wang; Lynn T. ; et al.	2013-08-01
Body tie test structure for accurate body effect measurement Grant 8,293,606 - Madhavan , et al. October 23, 2	2012-10-23
Body Tie Test Structure For Accurate Body Effect Measurement App 20110086484 - MADHAVAN; Sriram ; et al.	2011-04-14
Body tie test structure for accurate body effect measurement Grant 7,880,229 - Madhavan , et al. February 1, 2	2011-02-01
Test device for determining charge damage to a transistor Grant 7,804,317 - Parameshwaran , et al. September 28, 2	2010-09-28
Body Tie Test Structure For Accurate Body Effect Measurement App 20090101976 - MADHAVAN; Sriram ; et al.	2009-04-23
Method for forming an integrated circuit device Grant 6,534,378 - Ramkumar , et al. March 18, 2	2003-03-18

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