Madge; Robert

Patent Applications and Registrations

Patent applications and USPTO patent grants for Madge; Robert.The latest application filed is for "method to selectively identify at risk die based on location within the reticle".

Company Profile

0.13.8

Madge; Robert - Portland OR
Madge; Robert - Giles GB2
Madge; Robert - Chalfont St. Giles GB2

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method to selectively identify at risk die based on location within the reticle Grant 7,305,634 - Rehani , et al. December 4, 2	2007-12-04
Modified binary search for optimizing efficiency of data collection time Grant 7,079,963 - Gloor , et al. July 18, 2	2006-07-18
Adaptive defect based testing Grant 7,073,107 - Madge , et al. July 4, 2	2006-07-04
Method to selectively identify at risk die based on location within the reticle App 20060109462 - Rehani; Manu ; et al.	2006-05-25
Method of detecting spatially correlated variations in a parameter of an integrated circuit die Grant 6,943,042 - Madge , et al. September 13, 2	2005-09-13
Feature Targeted Inspection App 20050197728 - Madge, Robert	2005-09-08
Feature targeted inspection Grant 6,931,297 - Madge August 16, 2	2005-08-16
Method for adaptively testing integrated circuits based on parametric fabrication data App 20040236531 - Madge, Robert	2004-11-25
Adaptive off tester screening method based on intrinsic die parametric measurements Grant 6,807,655 - Rehani , et al. October 19, 2	2004-10-19
Modified binary search for optimizing efficiency of data collection time App 20040205052 - Gloor, Cary ; et al.	2004-10-14
Adaptive defect based testing App 20040181717 - Madge, Robert ; et al.	2004-09-16
Method of detecting spatially correlated variations in a parameter of an integrated circuit die Grant 6,787,379 - Madge , et al. September 7, 2	2004-09-07
Method of detecting spatially correlated variations in a parameter of an integrated circuit die App 20040033635 - Madge, Robert ; et al.	2004-02-19
Feed forward testing Grant 6,682,947 - Madge January 27, 2	2004-01-27
Feed forward testing App 20040010763 - Madge, Robert	2004-01-15
Latent defect classification system Grant 6,647,348 - Madge November 11, 2	2003-11-11
Die attach back grinding Grant 6,624,048 - Madge September 23, 2	2003-09-23
Parametric device signature Grant 6,601,008 - Madge July 29, 2	2003-07-29
Latent defect classification system App 20030069706 - Madge, Robert	2003-04-10
Token ring system hierarchy Grant 4,985,888 - Madge , et al. January 15, 1	1991-01-15
Token ring expander and/or hub Grant 4,905,230 - Madge , et al. February 27, 1	1990-02-27

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