Madan; Anita

Patent Applications and Registrations

Patent applications and USPTO patent grants for Madan; Anita.The latest application filed is for "capacitance monitoring using x-ray diffraction".

Company Profile

0.22.27

Madan; Anita - Danbury CT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Capacitance monitoring using x-ray diffraction Grant 10,008,421 - Kang , et al. June 26, 2	2018-06-26
Capacitance Monitoring Using X-ray Diffraction App 20180096904 - Kang; Donghun ; et al.	2018-04-05
Capacitance monitoring using X-ray diffraction Grant 9,870,960 - Kang , et al. January 16, 2	2018-01-16
Capacitance Monitoring Using X-ray Diffraction App 20160178679 - Kang; Donghun ; et al.	2016-06-23
Evaluating semiconductor wafers for pitch walking and/or epitaxial merge Grant 9,201,027 - Kohli , et al. December 1, 2	2015-12-01
Evaluating Semiconductor Wafers For Pitch Walking And/or Epitaxial Merge App 20150233844 - Kohli; Kriteshwar K. ; et al.	2015-08-20
Dislocation engineering using a scanned laser Grant 8,865,571 - Lai , et al. October 21, 2	2014-10-21
Dislocation engineering using a scanned laser Grant 8,865,572 - Lai , et al. October 21, 2	2014-10-21
Measurement Of Cmos Device Channel Strain By X-ray Diffraction App 20140159161 - Adam; Thomas N. ; et al.	2014-06-12
Dislocation Engineering Using A Scanned Laser App 20140154873 - Lai; Chung Woh ; et al.	2014-06-05
Dislocation Engineering Using A Scanned Laser App 20140154872 - Lai; Chung Woh ; et al.	2014-06-05
Measurement of CMOS device channel strain by X-ray diffraction Grant 8,716,037 - Adam , et al. May 6, 2	2014-05-06
Dislocation Engineering Using a Scanned Laser App 20120294322 - Lai; Chung Woh ; et al.	2012-11-22
Measurement Of Cmos Device Channel Strain By X-ray Diffraction App 20120146050 - ADAM; THOMAS N. ; et al.	2012-06-14
Dislocation Engineering Using a Scanned Laser App 20120138823 - Lai; Chung Woh ; et al.	2012-06-07
Dislocation engineering using a scanned laser Grant 8,138,066 - Lai , et al. March 20, 2	2012-03-20
Integrated circuit system with carbon and non-carbon silicon Grant 8,105,955 - Liu , et al. January 31, 2	2012-01-31
Method of repairing process induced dielectric damage by the use of GCIB surface treatment using gas clusters of organic molecular species Grant 7,838,428 - Chen , et al. November 23, 2	2010-11-23
Method of forming nitride films with high compressive stress for improved PFET device performance Grant 7,804,136 - Conti , et al. September 28, 2	2010-09-28
Measuring Strain Of Epitaxial Films Using Micro X-ray Diffraction For In-line Metrology App 20100208869 - Adam; Thomas N. ; et al.	2010-08-19
Measuring strain of epitaxial films using micro x-ray diffraction for in-line metrology Grant 7,769,134 - Adam , et al. August 3, 2	2010-08-03
Dislocation Engineering Using A Scanned Laser App 20100081259 - Lai; Chung Woh ; et al.	2010-04-01
Method for improved formation of nickel silicide contacts in semiconductor devices Grant 7,622,386 - Madan , et al. November 24, 2	2009-11-24
Integrated Circuit System Employing Diffused Source/drain Extensions App 20090146181 - Lai; Chung Woh ; et al.	2009-06-11
Method of forming nitride films with high compressive stress for improved PFET device performance Grant 7,491,660 - Conti , et al. February 17, 2	2009-02-17
Method for improved formation of cobalt silicide contacts in semiconductor devices Grant 7,485,572 - Madan , et al. February 3, 2	2009-02-03
N-channel MOSFETs comprising dual stressors, and methods for forming the same Grant 7,473,608 - Li , et al. January 6, 2	2009-01-06
Method of forming nitride films with high compressive stress for improved PFET device performance Grant 7,462,527 - Conti , et al. December 9, 2	2008-12-09
Low resistance contact structure and fabrication thereof Grant 7,407,875 - Wong , et al. August 5, 2	2008-08-05
Method For Improved Formation Of Nickel Silicide Contacts In Semiconductor Devices App 20080138985 - Madan; Anita ; et al.	2008-06-12
Integrated Circuit System With Carbon And Non-carbon Silicon App 20080121926 - Liu; Jin Ping ; et al.	2008-05-29
Method For Improved Formation Of Cobalt Silicide Contacts In Semiconductor Devices App 20080124925 - Madan; Anita ; et al.	2008-05-29
Low Resistance Contact Structure And Fabrication Thereof App 20080054326 - Wong; Keith Kwong Hon ; et al.	2008-03-06
Method Of Forming Nitride Films With High Compressive Stress For Improved Pfet Device Performance App 20080045039 - Conti; Richard A. ; et al.	2008-02-21
Method Of Forming Nitride Films With High Compressive Stress For Improved Pfet Device Performance App 20080036007 - Conti; Richard A. ; et al.	2008-02-14
N-channel Mosfets Comprising Dual Stressors, And Methods For Forming The Same App 20070281413 - Li; Jinghong H. ; et al.	2007-12-06
Epitaxy of Silicon-Carbon Substitutional Solid Solutions by Ultra-Fast Annealing of Amorphous Material App 20070238267 - Liu; Yaocheng ; et al.	2007-10-11
N-channel MOSFETs comprising dual stressors, and methods for forming the same Grant 7,279,758 - Li , et al. October 9, 2	2007-10-09
Method Of Repairing Process Induced Dielectric Damage By The Use Of Gcib Surface Treatment Using Gas Clusters Of Organic Molecular Species App 20070224824 - Chen; Shyng-Tsong ; et al.	2007-09-27
Polycrystalline silicon layer with nano-grain structure and method of manufacture Grant 7,232,774 - Chakravarti , et al. June 19, 2	2007-06-19
Semiconductor devices and methods of manufacture thereof App 20070134861 - Han; Jin-Ping ; et al.	2007-06-14
Thin film resistors of different materials Grant 7,193,500 - Chinthakindi , et al. March 20, 2	2007-03-20
Method Of Forming Nitride Films With High Compressive Stress For Improved Pfet Device Performance App 20070007548 - Conti; Richard A. ; et al.	2007-01-11
Doped Nitride Film, Doped Oxide Film And Other Doped Films And Deposition Rate Improvement For Rtcvd Processes App 20060237846 - Chakravarti; Ashima B. ; et al.	2006-10-26
Deposition of carbon and nitrogen doped poly silicon films, and retarded boron diffusion and improved poly depletion Grant 7,119,016 - Chakravarti , et al. October 10, 2	2006-10-10
Thin Film Resistors of Different Materials App 20060087400 - Chinthakindi; Anil K. ; et al.	2006-04-27
Polycrystalline Silicon Layer With Nano-grain Structure and Method of Manufacture App 20050158924 - Chakravarti, Ashima B. ; et al.	2005-07-21
Deposition of carbon and nitrogen doped poly silicon films, and retarded boron diffusion and improved poly depletion App 20050085054 - Chakravarti, Ashima B. ; et al.	2005-04-21

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