MACHAVARIANI; VLADIMIR
Patent Applications and Registrations
Patent applications and USPTO patent grants for MACHAVARIANI; VLADIMIR.The latest application filed is for "tem-based metrology method and system".
- MACHAVARIANI; VLADIMIR - RISHON-LEZION IL
| Patent | Date |
|---|---|
| Tem-based Metrology Method And System App 20220310356 - MACHAVARIANI; VLADIMIR ; et al. | 2022-09-29 |
| Metrology method and system Grant 11,450,541 - Machavariani , et al. September 20, 2 | 2022-09-20 |
| TEM-based metrology method and system Grant 11,309,162 - Machavariani , et al. April 19, 2 | 2022-04-19 |
| Raman spectroscopy based measurements in patterned structures Grant 11,275,027 - Barak , et al. March 15, 2 | 2022-03-15 |
| Tem-based Metrology Method And System App 20210217581 - MACHAVARIANI; VLADIMIR ; et al. | 2021-07-15 |
| TEM-based metrology method and system Grant 10,916,404 - Machavariani , et al. February 9, 2 | 2021-02-09 |
| Metrology Method And System App 20200294829 - MACHAVARIANI; VLADIMIR ; et al. | 2020-09-17 |
| Method and system for optical metrology in patterned structures Grant 10,761,036 - Levant , et al. Sep | 2020-09-01 |
| Raman Spectroscopy Based Measurements In Patterned Structures App 20200256799 - BARAK; GILAD ; et al. | 2020-08-13 |
| Raman spectroscopy based measurements in patterned structures Grant 10,564,106 - Barak , et al. Feb | 2020-02-18 |
| Tem-based Metrology Method And System App 20190393016 - MACHAVARIANI; VLADIMIR ; et al. | 2019-12-26 |
| Method And System For Optical Metrology In Patterned Structures App 20190317024 - Levant; Boris ; et al. | 2019-10-17 |
| Method and system for optical metrology in patterned structures Grant 10,274,435 - Levant , et al. | 2019-04-30 |
| Raman Spectroscopy Based Measurements In Patterned Structures App 20180372644 - BARAK; GILAD ; et al. | 2018-12-27 |
| Method And System For Optical Metrology In Patterned Structures App 20180052119 - LEVANT; Boris ; et al. | 2018-02-22 |
| Method and apparatus for measurements of patterned structures Grant 7,187,456 - Scheiner , et al. March 6, 2 | 2007-03-06 |
| Method and apparatus for measurements of patterned structures Grant 7,123,366 - Scheiner , et al. October 17, 2 | 2006-10-17 |
| Method and appratus for measurements of patterned structures App 20050146729 - Scheiner, David ; et al. | 2005-07-07 |
| Method and system for monitoring a process of material removal from the surface of a patterned structure Grant 6,885,446 - Machavariani , et al. April 26, 2 | 2005-04-26 |
| Method and apparatus for measurements of patterned structures App 20050062965 - Scheiner, David ; et al. | 2005-03-24 |
| Method and apparatus for measurements of patterned structures Grant 6,836,324 - Scheiner , et al. December 28, 2 | 2004-12-28 |
| Test structure for metal CMP process control Grant 6,654,108 - Ravid , et al. November 25, 2 | 2003-11-25 |
| Method and system for monitoring a process of material removal from the surface of a patterned structure App 20030155537 - Machavariani, Vladimir ; et al. | 2003-08-21 |
| Method and apparatus for measurements of patterned structures Grant 6,476,920 - Scheiner , et al. November 5, 2 | 2002-11-05 |
| Method and apparatus for measurements of patterned structures App 20020128784 - Scheiner, David ; et al. | 2002-09-12 |
| Test structure for metal CMP process control App 20010026364 - Ravid, Avi ; et al. | 2001-10-04 |
| Test structure for metal CMP process control App 20010015811 - Ravid, Avi ; et al. | 2001-08-23 |
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