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Patent applications and USPTO patent grants for Ma; Xianyun.The latest application filed is for "method and apparatus for nondestructive evaluation of semiconductor wafers".
Patent | Date |
---|---|
Method and apparatus for nondestructively evaluating light-emitting materials Grant 7,679,381 - Ma March 16, 2 | 2010-03-16 |
Method and Apparatus for Nondestructively Evaluating Light-Emitting Materials App 20070170933 - Ma; Xianyun | 2007-07-26 |
Method and Apparatus for Nondestructive Evaluation of Semiconductor Wafers App 20070170934 - Ma; Xianyun | 2007-07-26 |
System and method for detecting defects in semiconductor wafers Grant 7,220,978 - Ma , et al. May 22, 2 | 2007-05-22 |
System and method for detecting defects in semiconductor wafers App 20040206891 - Ma, Xianyun ;   et al. | 2004-10-21 |
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