loadpatents
Patent applications and USPTO patent grants for Ma; Ching-Tien.The latest application filed is for "method for eliminating loading effect using a via plug".
Patent | Date |
---|---|
Method for eliminating loading effect using a via plug Grant 8,089,153 - Hui , et al. January 3, 2 | 2012-01-03 |
Contact etch stop film Grant 7,939,915 - Ho , et al. May 10, 2 | 2011-05-10 |
Method For Eliminating Loading Effect Using A Via Plug App 20100133702 - XiangHui; Wu ;   et al. | 2010-06-03 |
Novel Contact Etch Stop Film App 20100029090 - Ho; Hok Min ;   et al. | 2010-02-04 |
Method for eliminating loading effect using a via plug Grant 7,655,554 - XiangHui , et al. February 2, 2 | 2010-02-02 |
Contact etch stop film Grant 7,629,673 - Ho , et al. December 8, 2 | 2009-12-08 |
Method for eliminating duo loading effect using a via plug App 20080308944 - XiangHui; Wu ;   et al. | 2008-12-18 |
Novel Contact Etch Stop Film App 20080128869 - Ho; Hok Min ;   et al. | 2008-06-05 |
Method for forming via and contact holes with deep UV photoresist Grant 6,830,877 - Ma , et al. December 14, 2 | 2004-12-14 |
Method for dual-damascene formation using a via plug Grant 6,764,810 - Ma , et al. July 20, 2 | 2004-07-20 |
Wet dip method for photoresist and polymer stripping without buffer treatment step Grant 6,652,666 - Ma , et al. November 25, 2 | 2003-11-25 |
Method for dual-damascene formation using a via plug App 20030203321 - Ma, Ching-Tien ;   et al. | 2003-10-30 |
Method for forming via and contact holes with deep UV photoresist App 20030124464 - Ma, Ching-Tien ;   et al. | 2003-07-03 |
IMD film composition for dual damascene process Grant 6,570,257 - Chen , et al. May 27, 2 | 2003-05-27 |
Wet dip method for photoresist and polymer stripping without buffer treatment step App 20020162578 - Ma, Ching-Tien ;   et al. | 2002-11-07 |
Novel IMD film composition for dual damascene process App 20020013024 - Chen, Dian-Hau ;   et al. | 2002-01-31 |
Inter-metal dielectric film composition for dual damascene process Grant 6,316,351 - Chen , et al. November 13, 2 | 2001-11-13 |
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