Lytle; Steven A.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lytle; Steven A..The latest application filed is for "test structures for e-beam testing of systematic and random defects in integrated circuits".
- Lytle; Steven A. - McKinney TX
- Lytle; Steven A. - Orlando FL
- Lytle; Steven A. - Bethlehem PA
| Patent | Date |
|---|---|
| Test Structures For E-beam Testing Of Systematic And Random Defects In Integrated Circuits App 20090102501 - Guldi; Richard L. ; et al. | 2009-04-23 |
| Metal insulator metal (MIM) capacitor fabrication with sidewall spacers and aluminum cap (ALCAP) top electrode Grant 7,250,334 - Crenshaw , et al. July 31, 2 | 2007-07-31 |
| Metal insulator metal (MIM) capacitor fabrication with sidewall spacers and aluminum cap (ALCAP) top electrode App 20060024899 - Crenshaw; Darius L. ; et al. | 2006-02-02 |
| Dual damascene process with no passing metal features Grant 6,989,602 - Lytle January 24, 2 | 2006-01-24 |
| Buried antifuse Grant 5,100,827 - Lytle March 31, 1 | 1992-03-31 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 