Lyon; Alan Francis

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lyon; Alan Francis.The latest application filed is for "x-ray interferometric imaging system".

Company Profile

5.16.16

Lyon; Alan Francis - Berkeley CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
X-ray imaging system Grant 10,653,376 - Yun , et al.	2020-05-19
Method of performing X-ray spectroscopy and X-ray absorption spectrometer system Grant 10,416,099 - Yun , et al. Sept	2019-09-17
X-ray Interferometric Imaging System App 20190254616 - Yun; Wenbing ; et al.	2019-08-22
X-ray interferometric imaging system Grant 10,349,908 - Yun , et al. July 16, 2	2019-07-16
Method and apparatus for x-ray microscopy Grant 10,352,880 - Yun , et al. July 16, 2	2019-07-16
X-ray illumination system with multiple target microstructures Grant 10,297,359 - Yun , et al.	2019-05-21
Diverging X-ray sources using linear accumulation Grant 10,269,528 - Yun , et al.	2019-04-23
X-ray Illumination System With Multiple Target Microstructures App 20190088438 - Yun; Wenbing ; et al.	2019-03-21
Method Of Performing X-ray Spectroscopy And X-ray Absorption Spectrometer System App 20190011379 - Yun; Wenbing ; et al.	2019-01-10
X-ray Illumination System With Multiple Target Microstructures App 20180144901 - Yun; Wenbing ; et al.	2018-05-24
Method And Apparatus For X-ray Microscopy App 20170261442 - Yun; Wenbing ; et al.	2017-09-14
Stacked zone plates for pitch frequency multiplication Grant 9,640,291 - Feser , et al. May 2, 2	2017-05-02
X-ray sources using linear accumulation Grant 9,543,109 - Yun , et al. January 10, 2	2017-01-10
Diverging X-ray Sources Using Linear Accumulation App 20160351370 - Yun; Wenbing ; et al.	2016-12-01
X-ray sources using linear accumulation App 20160268094 - Yun; Wenbing ; et al.	2016-09-15
X-ray sources using linear accumulation Grant 9,390,881 - Yun , et al. July 12, 2	2016-07-12
Back junction back contact solar cell module and method of manufacturing the same Grant 9,293,635 - Sewell , et al. March 22, 2	2016-03-22
X-ray Interferometric Imaging System App 20160066870 - Yun; Wenbing ; et al.	2016-03-10
X-ray Interferometric Imaging System App 20150117599 - Yun; Wenbing ; et al.	2015-04-30
X-ray Sources Using Linear Accumulation App 20150110252 - Yun; Wenbing ; et al.	2015-04-23
Method for metallization or metallization and interconnection of back contact solar cells Grant 8,766,090 - Sewell , et al. July 1, 2	2014-07-01
Compound x-ray lens having multiple aligned zone plates Grant 8,737,565 - Lyon , et al. May 27, 2	2014-05-27
Stacked Zone Plates for Pitch Frequency Multiplication App 20140126703 - Feser; Michael ; et al.	2014-05-08
Back Junction Back Contact Solar Cell Module And Method Of Manufacturing The Same App 20130240022 - SEWELL; Richard Hamilton ; et al.	2013-09-19
Method For Metallization Or Metallization And Interconnection Of Back Contact Solar Cells App 20130240023 - SEWELL; Richard Hamilton ; et al.	2013-09-19
Compound X-ray lens having multiple aligned zone plates Grant 8,526,575 - Lyon , et al. September 3, 2	2013-09-03
Metrology and registration system and method for laminography and tomography Grant 7,974,379 - Case , et al. July 5, 2	2011-07-05
High aspect-ratio X-ray diffractive structure stabilization methods and systems Grant 7,864,426 - Yun , et al. January 4, 2	2011-01-04
High Aspect-Ratio X-Ray Diffractive Structure Stabilization Methods and Systems App 20080192347 - Yun; Wenbing ; et al.	2008-08-14

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.