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Patent applications and USPTO patent grants for Lynch; Graham Michael.The latest application filed is for "setting up a wafer inspection process using programmed defects".
Patent | Date |
---|---|
Detecting defects on a wafer Grant 9,355,208 - Shifrin , et al. May 31, 2 | 2016-05-31 |
Setting up a wafer inspection process using programmed defects Grant 9,347,862 - Lynch May 24, 2 | 2016-05-24 |
Setting Up a Wafer Inspection Process Using Programmed Defects App 20150042978 - Lynch; Graham Michael | 2015-02-12 |
Methods and Systems for Detecting Repeating Defects on Semiconductor Wafers Using Design Data App 20150012900 - Shifrin; Eugene ;   et al. | 2015-01-08 |
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